GB201215546D0 - Multiple probe detection and actuation - Google Patents

Multiple probe detection and actuation

Info

Publication number
GB201215546D0
GB201215546D0 GBGB1215546.1A GB201215546A GB201215546D0 GB 201215546 D0 GB201215546 D0 GB 201215546D0 GB 201215546 A GB201215546 A GB 201215546A GB 201215546 D0 GB201215546 D0 GB 201215546D0
Authority
GB
United Kingdom
Prior art keywords
actuation
probe detection
multiple probe
detection
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
GBGB1215546.1A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Infinitesima Ltd
Original Assignee
Infinitesima Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Infinitesima Ltd filed Critical Infinitesima Ltd
Priority to GBGB1215546.1A priority Critical patent/GB201215546D0/en
Publication of GB201215546D0 publication Critical patent/GB201215546D0/en
Priority to PCT/GB2013/052033 priority patent/WO2014033430A1/en
Priority to US14/424,597 priority patent/US9410982B2/en
Priority to EP13759283.8A priority patent/EP2891117B1/en
Priority to US14/424,642 priority patent/US9739798B2/en
Priority to PCT/GB2013/052256 priority patent/WO2014033451A1/en
Priority to JP2015529119A priority patent/JP2015526739A/ja
Priority to JP2020159976A priority patent/JP2021001905A/ja
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q20/00—Monitoring the movement or position of the probe
    • G01Q20/02—Monitoring the movement or position of the probe by optical means
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G01Q10/04—Fine scanning or positioning
    • G01Q10/045—Self-actuating probes, i.e. wherein the actuating means for driving are part of the probe itself, e.g. piezoelectric means on a cantilever probe
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/06—Probe tip arrays
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B11/00—Recording on or reproducing from the same record carrier wherein for these two operations the methods are covered by different main groups of groups G11B3/00 - G11B7/00 or by different subgroups of group G11B9/00; Record carriers therefor
    • G11B11/002—Recording on or reproducing from the same record carrier wherein for these two operations the methods are covered by different main groups of groups G11B3/00 - G11B7/00 or by different subgroups of group G11B9/00; Record carriers therefor using recording by perturbation of the physical or electrical structure
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/025—Change of phase or condition
    • G01N2291/0256—Adsorption, desorption, surface mass change, e.g. on biosensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/10—Number of transducers
    • G01N2291/106—Number of transducers one or more transducer arrays
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
    • G03F1/82—Auxiliary processes, e.g. cleaning or inspecting
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20—Exposure; Apparatus therefor
    • G03F7/2049—Exposure; Apparatus therefor using a cantilever
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • G11B9/1418—Disposition or mounting of heads or record carriers
    • G11B9/1427—Disposition or mounting of heads or record carriers with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement
    • G11B9/1436—Disposition or mounting of heads or record carriers with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement with provision for moving the heads or record carriers relatively to each other
    • G11B9/1445—Disposition or mounting of heads or record carriers with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement with provision for moving the heads or record carriers relatively to each other switching at least one head in operating function; Controlling the relative spacing to keep the head operative, e.g. for allowing a tunnel current flow

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
GBGB1215546.1A 2012-08-31 2012-08-31 Multiple probe detection and actuation Ceased GB201215546D0 (en)

Priority Applications (8)

Application Number Priority Date Filing Date Title
GBGB1215546.1A GB201215546D0 (en) 2012-08-31 2012-08-31 Multiple probe detection and actuation
PCT/GB2013/052033 WO2014033430A1 (en) 2012-08-31 2013-07-30 Photothermal actuation of a probe for scanning probe microscopy
US14/424,597 US9410982B2 (en) 2012-08-31 2013-07-30 Photothermal actuation of a probe for scanning probe microscopy
EP13759283.8A EP2891117B1 (en) 2012-08-31 2013-08-28 Multiple probe detection and actuation
US14/424,642 US9739798B2 (en) 2012-08-31 2013-08-28 Multiple probe detection and actuation
PCT/GB2013/052256 WO2014033451A1 (en) 2012-08-31 2013-08-28 Multiple probe detection and actuation
JP2015529119A JP2015526739A (ja) 2012-08-31 2013-08-28 複数プローブの検出及び作動
JP2020159976A JP2021001905A (ja) 2012-08-31 2020-09-24 複数プローブの検出及び作動

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB1215546.1A GB201215546D0 (en) 2012-08-31 2012-08-31 Multiple probe detection and actuation

Publications (1)

Publication Number Publication Date
GB201215546D0 true GB201215546D0 (en) 2012-10-17

Family

ID=47075065

Family Applications (1)

Application Number Title Priority Date Filing Date
GBGB1215546.1A Ceased GB201215546D0 (en) 2012-08-31 2012-08-31 Multiple probe detection and actuation

Country Status (5)

Country Link
US (1) US9739798B2 (enExample)
EP (1) EP2891117B1 (enExample)
JP (2) JP2015526739A (enExample)
GB (1) GB201215546D0 (enExample)
WO (1) WO2014033451A1 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2906928A4 (en) 2012-10-15 2016-11-09 Nanocellect Biomedical Inc SYSTEMS, DEVICES AND METHOD FOR SORTING PARTICLES
JP6081520B2 (ja) * 2014-05-28 2017-02-15 インディアン インスティテュート オブ テクノロジー デリー 非干渉位相計測
GB201610128D0 (en) 2016-06-10 2016-07-27 Infinitesima Ltd Scanning probe system with multiple probes
DE102017205528B4 (de) * 2017-03-31 2021-06-10 Carl Zeiss Smt Gmbh Vorrichtung und Verfahren für ein Rastersondenmikroskop
GB201710294D0 (en) 2017-06-28 2017-08-09 Infinitesima Ltd Scanning probe microscope
US10564181B2 (en) * 2017-08-31 2020-02-18 Nanosurf Ag Atomic force microscope with optical guiding mechanism
US11415597B2 (en) * 2018-01-22 2022-08-16 Lehigh University System and method for a non-tapping mode scattering-type scanning near-field optical microscopy
US11257657B2 (en) * 2020-02-18 2022-02-22 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Charged particle beam device with interferometer for height measurement
US11519935B2 (en) 2020-08-18 2022-12-06 Oxford Instruments Asylum Research, Inc. Atomic force microscope
GB202109549D0 (en) * 2021-07-01 2021-08-18 Infinitesima Ltd Lighting system for multi-probe microscope

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63222208A (ja) * 1987-03-11 1988-09-16 Japan Spectroscopic Co 凹部深さ測定装置
US5260824A (en) * 1989-04-24 1993-11-09 Olympus Optical Co., Ltd. Atomic force microscope
GB8910566D0 (en) * 1989-05-08 1989-06-21 Amersham Int Plc Imaging apparatus and method
JP2661314B2 (ja) 1990-03-07 1997-10-08 松下電器産業株式会社 形状測定装置及び形状測定方法
US8087288B1 (en) * 1993-08-17 2012-01-03 Bruker Nano, Inc. Scanning stylus atomic force microscope with cantilever tracking and optical access
US5485231A (en) * 1994-01-31 1996-01-16 Nidek Co., Ltd. Apparatus for visual acuity test having an adjustable mirror
US5883387A (en) * 1994-11-15 1999-03-16 Olympus Optical Co., Ltd. SPM cantilever and a method for manufacturing the same
US5760755A (en) * 1995-08-16 1998-06-02 Engle; Craig D. Electrostatic light valve system configurations
US6330824B1 (en) * 1999-02-19 2001-12-18 The University Of North Carolina At Chapel Hill Photothermal modulation for oscillating mode atomic force microscopy in solution
JP2000266658A (ja) * 1999-03-16 2000-09-29 Seiko Instruments Inc マルチプローブ及び走査型プローブ顕微鏡
GB2369451B (en) 2000-07-27 2002-07-17 Michael John Downs Jamin-type interferometers
JP2003091873A (ja) * 2001-07-12 2003-03-28 Matsushita Electric Ind Co Ltd 光学的情報記録媒体およびそれを用いた記録方法
US6779387B2 (en) * 2001-08-21 2004-08-24 Georgia Tech Research Corporation Method and apparatus for the ultrasonic actuation of the cantilever of a probe-based instrument
EP1428058A4 (en) 2001-08-23 2009-01-07 Asylum Research Corp OPTICAL DETECTOR WITH DIFFRACTION POSITION
WO2004006302A2 (en) 2002-07-08 2004-01-15 Multiprobe, Inc. Software synchronization of multiple scanning probes
US6936981B2 (en) * 2002-11-08 2005-08-30 Applied Materials, Inc. Retarding electron beams in multiple electron beam pattern generation
KR100793122B1 (ko) * 2003-08-11 2008-01-10 도쿠리쓰교세이호징 가가쿠 기주쓰 신코 기코 투명 기판을 이용한 프로브 현미경용의 프로브, 그 제조방법 및 프로브 현미경 장치
US7230719B2 (en) * 2003-12-02 2007-06-12 National University Of Singapore High sensitivity scanning probe system
JP2005331509A (ja) * 2004-04-19 2005-12-02 Japan Science & Technology Agency 固有振動可変型のカンチレバーによる測定対象物の計測方法および装置
US7280078B2 (en) 2004-11-20 2007-10-09 Scenterra, Inc. Sensor for detecting high frequency signals
JP5164147B2 (ja) * 2005-05-31 2013-03-13 国立大学法人金沢大学 走査型プローブ顕微鏡およびカンチレバー駆動装置
JP5122775B2 (ja) 2006-08-23 2013-01-16 株式会社ミツトヨ 測定装置
GB0621560D0 (en) * 2006-10-31 2006-12-06 Infinitesima Ltd Probe assembly for a scanning probe microscope
TWI364540B (en) * 2007-12-28 2012-05-21 Ind Tech Res Inst Cantilever sensor system and profilers and biosensors using the same
EP2297546B1 (en) * 2008-06-06 2018-09-19 Infinitesima Limited Probe detection system
SG171994A1 (en) 2008-12-11 2011-07-28 Infinitesima Ltd Dynamic probe detection system
GB0900705D0 (en) * 2009-01-16 2009-03-04 Univ Huddersfield Surface measurement system
JP2012093325A (ja) * 2010-10-29 2012-05-17 Murata Mfg Co Ltd 原子間力顕微鏡用のカンチレバー、原子間力顕微鏡、および、原子間力の測定方法
WO2012059828A2 (en) 2010-11-01 2012-05-10 Koc Universitesi Miniaturized integrated micro electo-mechanical systems (mems) optical sensor array
SG192224A1 (en) * 2011-01-31 2013-09-30 Infinitesima Ltd Adaptive mode scanning probe microscope
GB201215547D0 (en) * 2012-08-31 2012-10-17 Infinitesima Ltd Multiple probe actuation

Also Published As

Publication number Publication date
JP2021001905A (ja) 2021-01-07
WO2014033451A1 (en) 2014-03-06
JP2015526739A (ja) 2015-09-10
US9739798B2 (en) 2017-08-22
EP2891117B1 (en) 2023-09-20
US20150219686A1 (en) 2015-08-06
EP2891117A1 (en) 2015-07-08

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Legal Events

Date Code Title Description
AT Applications terminated before publication under section 16(1)