GB1482137A - Test leads for use with multimeters in testing the current amplification factor of transistors - Google Patents

Test leads for use with multimeters in testing the current amplification factor of transistors

Info

Publication number
GB1482137A
GB1482137A GB3581874A GB3581874A GB1482137A GB 1482137 A GB1482137 A GB 1482137A GB 3581874 A GB3581874 A GB 3581874A GB 3581874 A GB3581874 A GB 3581874A GB 1482137 A GB1482137 A GB 1482137A
Authority
GB
United Kingdom
Prior art keywords
amplification factor
current amplification
meter
transistors
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB3581874A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SANWA INSTR WORKS Ltd
Original Assignee
SANWA INSTR WORKS Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SANWA INSTR WORKS Ltd filed Critical SANWA INSTR WORKS Ltd
Publication of GB1482137A publication Critical patent/GB1482137A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2608—Circuits therefor for testing bipolar transistors
    • G01R31/2614—Circuits therefor for testing bipolar transistors for measuring gain factor thereof

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
GB3581874A 1974-04-21 1974-08-14 Test leads for use with multimeters in testing the current amplification factor of transistors Expired GB1482137A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1974044980U JPS547487Y2 (fr) 1974-04-21 1974-04-21

Publications (1)

Publication Number Publication Date
GB1482137A true GB1482137A (en) 1977-08-03

Family

ID=12706604

Family Applications (1)

Application Number Title Priority Date Filing Date
GB3581874A Expired GB1482137A (en) 1974-04-21 1974-08-14 Test leads for use with multimeters in testing the current amplification factor of transistors

Country Status (3)

Country Link
JP (1) JPS547487Y2 (fr)
GB (1) GB1482137A (fr)
HK (1) HK35879A (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4590421A (en) * 1982-11-10 1986-05-20 Chauvin Arnoux Measuring attachment connectible to a multimeter for measuring earth resistances
CN114236336A (zh) * 2021-12-08 2022-03-25 成都海光微电子技术有限公司 一种三极管放大倍数检测电路、方法及传感器

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4828370U (fr) * 1971-08-11 1973-04-06
JPS4866375A (fr) * 1971-12-14 1973-09-11

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4590421A (en) * 1982-11-10 1986-05-20 Chauvin Arnoux Measuring attachment connectible to a multimeter for measuring earth resistances
CN114236336A (zh) * 2021-12-08 2022-03-25 成都海光微电子技术有限公司 一种三极管放大倍数检测电路、方法及传感器
CN114236336B (zh) * 2021-12-08 2024-02-13 成都海光微电子技术有限公司 一种三极管放大倍数检测电路、方法及传感器

Also Published As

Publication number Publication date
JPS547487Y2 (fr) 1979-04-07
HK35879A (en) 1979-06-15
JPS50135069U (fr) 1975-11-07

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Legal Events

Date Code Title Description
PS Patent sealed
PCNP Patent ceased through non-payment of renewal fee