JPS4866375A - - Google Patents
Info
- Publication number
- JPS4866375A JPS4866375A JP10175971A JP10175971A JPS4866375A JP S4866375 A JPS4866375 A JP S4866375A JP 10175971 A JP10175971 A JP 10175971A JP 10175971 A JP10175971 A JP 10175971A JP S4866375 A JPS4866375 A JP S4866375A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10175971A JPS4866375A (fr) | 1971-12-14 | 1971-12-14 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10175971A JPS4866375A (fr) | 1971-12-14 | 1971-12-14 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS4866375A true JPS4866375A (fr) | 1973-09-11 |
Family
ID=14309146
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10175971A Pending JPS4866375A (fr) | 1971-12-14 | 1971-12-14 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS4866375A (fr) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS50135069U (fr) * | 1974-04-21 | 1975-11-07 | ||
JPS55124242A (en) * | 1979-03-19 | 1980-09-25 | Toshiba Corp | Testing method of semiconductor device |
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1971
- 1971-12-14 JP JP10175971A patent/JPS4866375A/ja active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS50135069U (fr) * | 1974-04-21 | 1975-11-07 | ||
JPS547487Y2 (fr) * | 1974-04-21 | 1979-04-07 | ||
JPS55124242A (en) * | 1979-03-19 | 1980-09-25 | Toshiba Corp | Testing method of semiconductor device |