HK35879A - Improvements in or relating to test leads for use with multimeters in testing the current amplification factor of transistors - Google Patents
Improvements in or relating to test leads for use with multimeters in testing the current amplification factor of transistorsInfo
- Publication number
- HK35879A HK35879A HK35879A HK35879A HK35879A HK 35879 A HK35879 A HK 35879A HK 35879 A HK35879 A HK 35879A HK 35879 A HK35879 A HK 35879A HK 35879 A HK35879 A HK 35879A
- Authority
- HK
- Hong Kong
- Prior art keywords
- multimeters
- transistors
- relating
- testing
- amplification factor
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2608—Circuits therefor for testing bipolar transistors
- G01R31/2614—Circuits therefor for testing bipolar transistors for measuring gain factor thereof
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1974044980U JPS547487Y2 (en) | 1974-04-21 | 1974-04-21 |
Publications (1)
Publication Number | Publication Date |
---|---|
HK35879A true HK35879A (en) | 1979-06-15 |
Family
ID=12706604
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK35879A HK35879A (en) | 1974-04-21 | 1979-06-07 | Improvements in or relating to test leads for use with multimeters in testing the current amplification factor of transistors |
Country Status (3)
Country | Link |
---|---|
JP (1) | JPS547487Y2 (en) |
GB (1) | GB1482137A (en) |
HK (1) | HK35879A (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2535850A1 (en) * | 1982-11-10 | 1984-05-11 | Chauvin Arnoux Sa | ACCESSORIES COULD BE CONNECTED TO A MULTIMETER FOR MEASURING EARTH RESISTORS |
CN114236336B (en) * | 2021-12-08 | 2024-02-13 | 成都海光微电子技术有限公司 | Triode amplification factor detection circuit, method and sensor |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4828370U (en) * | 1971-08-11 | 1973-04-06 | ||
JPS4866375A (en) * | 1971-12-14 | 1973-09-11 |
-
1974
- 1974-04-21 JP JP1974044980U patent/JPS547487Y2/ja not_active Expired
- 1974-08-14 GB GB3581874A patent/GB1482137A/en not_active Expired
-
1979
- 1979-06-07 HK HK35879A patent/HK35879A/en unknown
Also Published As
Publication number | Publication date |
---|---|
JPS547487Y2 (en) | 1979-04-07 |
JPS50135069U (en) | 1975-11-07 |
GB1482137A (en) | 1977-08-03 |
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