GB1473414A - X-ray diffraction apparatus - Google Patents

X-ray diffraction apparatus

Info

Publication number
GB1473414A
GB1473414A GB3235674A GB3235674A GB1473414A GB 1473414 A GB1473414 A GB 1473414A GB 3235674 A GB3235674 A GB 3235674A GB 3235674 A GB3235674 A GB 3235674A GB 1473414 A GB1473414 A GB 1473414A
Authority
GB
United Kingdom
Prior art keywords
slit
specimen
ray diffraction
diffraction apparatus
july
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB3235674A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips North America LLC
US Philips Corp
Original Assignee
US Philips Corp
North American Philips Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by US Philips Corp, North American Philips Corp filed Critical US Philips Corp
Publication of GB1473414A publication Critical patent/GB1473414A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
GB3235674A 1973-07-25 1974-07-22 X-ray diffraction apparatus Expired GB1473414A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US00382481A US3852594A (en) 1973-07-25 1973-07-25 X-ray diffraction apparatus

Publications (1)

Publication Number Publication Date
GB1473414A true GB1473414A (en) 1977-05-11

Family

ID=23509145

Family Applications (1)

Application Number Title Priority Date Filing Date
GB3235674A Expired GB1473414A (en) 1973-07-25 1974-07-22 X-ray diffraction apparatus

Country Status (4)

Country Link
US (1) US3852594A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPS5328222B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
CA (1) CA1016669A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
GB (1) GB1473414A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2748501C3 (de) * 1977-10-28 1985-05-30 Born, Eberhard, Dr. Verfahren und Vorrichtung zur Erstellung von Texturtopogrammen
US4322618A (en) * 1979-01-05 1982-03-30 North American Philips Corporation Diffracted beam monochromator
JPS55112554A (en) * 1979-01-05 1980-08-30 Philips Corp Diffraction beam monochrometer assembly
DE2907160C2 (de) * 1979-02-23 1986-09-25 Siemens AG, 1000 Berlin und 8000 München Röntgen-Pulverdiffraktometer
US4278883A (en) * 1979-12-27 1981-07-14 The United States Of America As Represented By The Secretary Of The Interior Sample mount for X-ray diffraction
NL8201343A (nl) * 1982-03-31 1983-10-17 Philips Nv Roentgen analyse apparaat met instelbare strooistralenspleet.
NL8300419A (nl) * 1983-02-04 1984-09-03 Philips Nv Roentgen analyse apparaat.
DE3379075D1 (en) * 1983-10-12 1989-03-02 Philips Nv X-ray examination apparatus
NL8304009A (nl) * 1983-11-22 1985-06-17 Philips Nv Roentgen analyse apparaat met afbuigsysteem.
JPS6163370U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1984-09-28 1986-04-30
DE3439471A1 (de) * 1984-10-27 1986-04-30 MTU Motoren- und Turbinen-Union München GmbH, 8000 München Verfahren und vorrichtung zum pruefen einkristalliner gegenstaende
NL8903044A (nl) * 1989-12-12 1991-07-01 Philips Nv Roentgen analyse apparaat met een instelbaar spleetdiafragma.
US5008909A (en) * 1990-02-07 1991-04-16 The United States Of America As Represented By The Department Of Energy Diffractometer data collecting method and apparatus
SE502223C2 (sv) 1994-01-14 1995-09-18 Sandvik Ab Sätt och alster vid beläggning av ett skärande verktyg med ett aluminiumoxidskikt
EP0815437A1 (en) * 1996-01-12 1998-01-07 Koninklijke Philips Electronics N.V. X-ray analysis apparatus including a rotatable primary collimator
US7245699B2 (en) * 2003-02-28 2007-07-17 Osmic, Inc. X-ray optical system with adjustable convergence
EP1477795B1 (en) * 2003-05-14 2007-03-14 Bruker AXS GmbH X-ray diffractometer for grazing incidence diffraction of horizontally and vertically oriented samples
US7310410B2 (en) * 2004-07-28 2007-12-18 General Electric Co. Single-leaf X-ray collimator
JP4711430B2 (ja) * 2006-08-01 2011-06-29 株式会社リガク Ｘ線回折装置
US7443952B2 (en) * 2006-10-06 2008-10-28 Rigaku Corporation X-ray diffraction measurement method and X-ray diffraction apparatus
EP3719484B1 (en) * 2019-04-04 2024-02-14 Malvern Panalytical B.V. X-ray beam shaping apparatus and method
JP7492261B2 (ja) 2021-01-29 2024-05-29 株式会社リガク Ｘ線分析装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3124681A (en) * 1964-03-10 Zingaro
DE1080320B (de) * 1954-04-09 1960-04-21 Siemens Ag Einrichtung zur Beugung von Roentgenstrahlen
NL113488C (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1958-06-19
DE1472373B2 (de) * 1964-05-23 1970-02-26 Chirana Praha n.p., Prag Spindel, insbesondere für Röntgengo niomet er
US3411000A (en) * 1965-04-14 1968-11-12 Siemens Ag X-ray diffractometer diaphragm which is synchronously rotated with the specimen
DE1497531A1 (de) * 1965-07-22 1969-03-27 Jeol Ltd Goniometer
US3566111A (en) * 1967-06-19 1971-02-23 Siemens Ag Apparatus for varying the detector slit width in fully focusing x-ray spectrometers

Also Published As

Publication number Publication date
AU7154374A (en) 1976-01-29
CA1016669A (en) 1977-08-30
JPS5063982A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1975-05-30
JPS5328222B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1978-08-12
US3852594A (en) 1974-12-03

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee