JPS5223981A - Measuring method of specific azimuthal crystal grains by x-rays - Google Patents

Measuring method of specific azimuthal crystal grains by x-rays

Info

Publication number
JPS5223981A
JPS5223981A JP50100516A JP10051675A JPS5223981A JP S5223981 A JPS5223981 A JP S5223981A JP 50100516 A JP50100516 A JP 50100516A JP 10051675 A JP10051675 A JP 10051675A JP S5223981 A JPS5223981 A JP S5223981A
Authority
JP
Japan
Prior art keywords
rays
measuring method
crystal grains
specific azimuthal
azimuthal crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP50100516A
Other languages
Japanese (ja)
Inventor
Rikuro Ogawa
Toshiyuki Nakamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kobe Steel Ltd
Original Assignee
Kobe Steel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kobe Steel Ltd filed Critical Kobe Steel Ltd
Priority to JP50100516A priority Critical patent/JPS5223981A/en
Publication of JPS5223981A publication Critical patent/JPS5223981A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To prevent noise and enlarge the X-ray radiation area of sample by placing slits allowing passage of only the X-ray diffracted from the crystal of a specific azimuth existing on sample surface, and moving correspondingly Xray detector and sanple.
JP50100516A 1975-08-18 1975-08-18 Measuring method of specific azimuthal crystal grains by x-rays Pending JPS5223981A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50100516A JPS5223981A (en) 1975-08-18 1975-08-18 Measuring method of specific azimuthal crystal grains by x-rays

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50100516A JPS5223981A (en) 1975-08-18 1975-08-18 Measuring method of specific azimuthal crystal grains by x-rays

Publications (1)

Publication Number Publication Date
JPS5223981A true JPS5223981A (en) 1977-02-23

Family

ID=14276104

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50100516A Pending JPS5223981A (en) 1975-08-18 1975-08-18 Measuring method of specific azimuthal crystal grains by x-rays

Country Status (1)

Country Link
JP (1) JPS5223981A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58182543A (en) * 1982-03-31 1983-10-25 エヌ・ベ−・フイリツプス・フル−イランペンフアブリケン Roentgen-ray analyzer
JPS59182349A (en) * 1983-03-31 1984-10-17 Shimadzu Corp Detection of misorientation in crystal

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58182543A (en) * 1982-03-31 1983-10-25 エヌ・ベ−・フイリツプス・フル−イランペンフアブリケン Roentgen-ray analyzer
JPS59182349A (en) * 1983-03-31 1984-10-17 Shimadzu Corp Detection of misorientation in crystal
JPH0457973B2 (en) * 1983-03-31 1992-09-16 Shimadzu Corp

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