GB1414907A - Method of performing a non-destructive chemical analysis - Google Patents

Method of performing a non-destructive chemical analysis

Info

Publication number
GB1414907A
GB1414907A GB5702473A GB5702473A GB1414907A GB 1414907 A GB1414907 A GB 1414907A GB 5702473 A GB5702473 A GB 5702473A GB 5702473 A GB5702473 A GB 5702473A GB 1414907 A GB1414907 A GB 1414907A
Authority
GB
United Kingdom
Prior art keywords
substance
ions
molecular beam
chemical analysis
dec
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB5702473A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bpifrance Financement SA
Original Assignee
Agence National de Valorisation de la Recherche ANVAR
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agence National de Valorisation de la Recherche ANVAR filed Critical Agence National de Valorisation de la Recherche ANVAR
Publication of GB1414907A publication Critical patent/GB1414907A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/142—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using a solid target which is not previously vapourised
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
GB5702473A 1972-12-22 1973-12-10 Method of performing a non-destructive chemical analysis Expired GB1414907A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7246022A FR2212044A5 (enrdf_load_stackoverflow) 1972-12-22 1972-12-22

Publications (1)

Publication Number Publication Date
GB1414907A true GB1414907A (en) 1975-11-19

Family

ID=9109211

Family Applications (1)

Application Number Title Priority Date Filing Date
GB5702473A Expired GB1414907A (en) 1972-12-22 1973-12-10 Method of performing a non-destructive chemical analysis

Country Status (6)

Country Link
JP (1) JPS4998297A (enrdf_load_stackoverflow)
CH (1) CH591080A5 (enrdf_load_stackoverflow)
DE (1) DE2363581C2 (enrdf_load_stackoverflow)
FR (1) FR2212044A5 (enrdf_load_stackoverflow)
GB (1) GB1414907A (enrdf_load_stackoverflow)
NL (1) NL7317452A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2143673A (en) * 1983-06-16 1985-02-13 Hitachi Ltd Ionizing samples for secondary ion mass spectrometry
GB2269934A (en) * 1992-08-19 1994-02-23 Toshiba Cambridge Res Center Mass spectrometer.

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH611735A5 (enrdf_load_stackoverflow) 1975-07-25 1979-06-15 Fernand Marcel Devienne
FR2319194A1 (fr) * 1975-07-25 1977-02-18 Devienne Fernand Source d'ions de masse elevee, notamment d'ions d'oxyde d'uranium uo2
GB8419768D0 (en) * 1984-08-02 1984-09-05 Manchester Inst Science Tech Atom beams
GB8725459D0 (en) * 1987-10-30 1987-12-02 Nat Research Dev Corpn Generating particle beams
DE4028044A1 (de) * 1990-09-05 1992-03-12 Geesthacht Gkss Forschung Verfahren und vorrichtung zur analyse und bestimmung der konzentration von elementen in vorbestimmten tiefen von objekten
FR2745382B1 (fr) * 1996-02-27 1998-05-07 Devienne Fernand Marcel Appareil de detection et d'analyse de molecules de natures diverses

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1349302A (fr) * 1962-11-28 1964-01-17 Centre Nat Rech Scient Microanalyseur par émission ionique secondaire

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2143673A (en) * 1983-06-16 1985-02-13 Hitachi Ltd Ionizing samples for secondary ion mass spectrometry
GB2269934A (en) * 1992-08-19 1994-02-23 Toshiba Cambridge Res Center Mass spectrometer.
GB2269934B (en) * 1992-08-19 1996-03-27 Toshiba Cambridge Res Center Spectrometer

Also Published As

Publication number Publication date
FR2212044A5 (enrdf_load_stackoverflow) 1974-07-19
NL7317452A (enrdf_load_stackoverflow) 1974-06-25
JPS4998297A (enrdf_load_stackoverflow) 1974-09-17
DE2363581A1 (de) 1974-06-27
CH591080A5 (enrdf_load_stackoverflow) 1977-08-31
DE2363581C2 (de) 1984-10-11

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Legal Events

Date Code Title Description
PS Patent sealed
732 Registration of transactions, instruments or events in the register (sect. 32/1977)
PE20 Patent expired after termination of 20 years

Effective date: 19931209