GB1345767A - Method and apparatus for diagnosing faults in electronic assemblies - Google Patents

Method and apparatus for diagnosing faults in electronic assemblies

Info

Publication number
GB1345767A
GB1345767A GB1745271A GB1745271A GB1345767A GB 1345767 A GB1345767 A GB 1345767A GB 1745271 A GB1745271 A GB 1745271A GB 1745271 A GB1745271 A GB 1745271A GB 1345767 A GB1345767 A GB 1345767A
Authority
GB
United Kingdom
Prior art keywords
devices
faulty
light
locate
currents
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB1745271A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
Western Electric Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Western Electric Co Inc filed Critical Western Electric Co Inc
Publication of GB1345767A publication Critical patent/GB1345767A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Computer Hardware Design (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Locating Faults (AREA)
GB1745271A 1970-06-01 1971-05-27 Method and apparatus for diagnosing faults in electronic assemblies Expired GB1345767A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US4217670A 1970-06-01 1970-06-01

Publications (1)

Publication Number Publication Date
GB1345767A true GB1345767A (en) 1974-02-06

Family

ID=21920453

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1745271A Expired GB1345767A (en) 1970-06-01 1971-05-27 Method and apparatus for diagnosing faults in electronic assemblies

Country Status (11)

Country Link
US (1) US3702437A (enExample)
KR (1) KR780000392B1 (enExample)
BE (1) BE767541A (enExample)
CH (1) CH540494A (enExample)
DE (1) DE2125984A1 (enExample)
ES (1) ES392156A1 (enExample)
FR (1) FR2093948B1 (enExample)
GB (1) GB1345767A (enExample)
IE (1) IE35317B1 (enExample)
NL (1) NL7107132A (enExample)
SE (1) SE366839B (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5659244A (en) * 1994-09-21 1997-08-19 Nec Corporation Electronic circuit tester and method of testing electronic circuit

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4823385A (enExample) * 1971-07-28 1973-03-26
FR2418466A1 (fr) * 1978-02-24 1979-09-21 Telecommunications Sa Appareil pour etablir des prises de contact temporaires sur des circuits electriques
US6220102B1 (en) * 1999-09-03 2001-04-24 Vanguard International Semiconductor Corporation Die-shear test fixture apparatus
FR3112653B1 (fr) * 2020-07-15 2025-10-24 St Microelectronics Alps Sas Circuit intégré et procédé de diagnostic d’un tel circuit intégré

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3303400A (en) * 1961-07-25 1967-02-07 Fairchild Camera Instr Co Semiconductor device complex
US3549999A (en) * 1968-06-05 1970-12-22 Gen Electric Method and apparatus for testing circuits by measuring secondary emission electrons generated by electron beam bombardment of the pulsed circuit

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5659244A (en) * 1994-09-21 1997-08-19 Nec Corporation Electronic circuit tester and method of testing electronic circuit
US5801540A (en) * 1994-09-21 1998-09-01 Nec Corporation Electronic circuit tester and method of testing electronic circuit

Also Published As

Publication number Publication date
BE767541A (fr) 1971-10-18
DE2125984A1 (de) 1971-12-16
NL7107132A (enExample) 1971-12-03
ES392156A1 (es) 1974-02-16
IE35317L (en) 1971-12-01
CH540494A (de) 1973-08-15
IE35317B1 (en) 1976-01-07
FR2093948A1 (enExample) 1972-02-04
KR780000392B1 (en) 1978-10-04
FR2093948B1 (enExample) 1974-03-08
SE366839B (enExample) 1974-05-06
US3702437A (en) 1972-11-07

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee