KR780000392B1 - Diagnostic and repair system for semiconductors - Google Patents

Diagnostic and repair system for semiconductors

Info

Publication number
KR780000392B1
KR780000392B1 KR7100756A KR710000756A KR780000392B1 KR 780000392 B1 KR780000392 B1 KR 780000392B1 KR 7100756 A KR7100756 A KR 7100756A KR 710000756 A KR710000756 A KR 710000756A KR 780000392 B1 KR780000392 B1 KR 780000392B1
Authority
KR
South Korea
Prior art keywords
semiconductors
diagnostic
repair system
repair
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
KR7100756A
Other languages
English (en)
Korean (ko)
Inventor
Grath J Mc
Original Assignee
Western Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Western Electric Co filed Critical Western Electric Co
Application granted granted Critical
Publication of KR780000392B1 publication Critical patent/KR780000392B1/ko
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Computer Hardware Design (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Locating Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
KR7100756A 1970-06-01 1971-06-01 Diagnostic and repair system for semiconductors Expired KR780000392B1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US4217670A 1970-06-01 1970-06-01

Publications (1)

Publication Number Publication Date
KR780000392B1 true KR780000392B1 (en) 1978-10-04

Family

ID=21920453

Family Applications (1)

Application Number Title Priority Date Filing Date
KR7100756A Expired KR780000392B1 (en) 1970-06-01 1971-06-01 Diagnostic and repair system for semiconductors

Country Status (11)

Country Link
US (1) US3702437A (enExample)
KR (1) KR780000392B1 (enExample)
BE (1) BE767541A (enExample)
CH (1) CH540494A (enExample)
DE (1) DE2125984A1 (enExample)
ES (1) ES392156A1 (enExample)
FR (1) FR2093948B1 (enExample)
GB (1) GB1345767A (enExample)
IE (1) IE35317B1 (enExample)
NL (1) NL7107132A (enExample)
SE (1) SE366839B (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4823385A (enExample) * 1971-07-28 1973-03-26
FR2418466A1 (fr) * 1978-02-24 1979-09-21 Telecommunications Sa Appareil pour etablir des prises de contact temporaires sur des circuits electriques
US5659244A (en) * 1994-09-21 1997-08-19 Nec Corporation Electronic circuit tester and method of testing electronic circuit
US6220102B1 (en) * 1999-09-03 2001-04-24 Vanguard International Semiconductor Corporation Die-shear test fixture apparatus
FR3112653B1 (fr) * 2020-07-15 2025-10-24 St Microelectronics Alps Sas Circuit intégré et procédé de diagnostic d’un tel circuit intégré

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3303400A (en) * 1961-07-25 1967-02-07 Fairchild Camera Instr Co Semiconductor device complex
US3549999A (en) * 1968-06-05 1970-12-22 Gen Electric Method and apparatus for testing circuits by measuring secondary emission electrons generated by electron beam bombardment of the pulsed circuit

Also Published As

Publication number Publication date
BE767541A (fr) 1971-10-18
DE2125984A1 (de) 1971-12-16
NL7107132A (enExample) 1971-12-03
ES392156A1 (es) 1974-02-16
IE35317L (en) 1971-12-01
CH540494A (de) 1973-08-15
GB1345767A (en) 1974-02-06
IE35317B1 (en) 1976-01-07
FR2093948A1 (enExample) 1972-02-04
FR2093948B1 (enExample) 1974-03-08
SE366839B (enExample) 1974-05-06
US3702437A (en) 1972-11-07

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