FR2093948A1 - - Google Patents

Info

Publication number
FR2093948A1
FR2093948A1 FR7119477A FR7119477A FR2093948A1 FR 2093948 A1 FR2093948 A1 FR 2093948A1 FR 7119477 A FR7119477 A FR 7119477A FR 7119477 A FR7119477 A FR 7119477A FR 2093948 A1 FR2093948 A1 FR 2093948A1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7119477A
Other languages
French (fr)
Other versions
FR2093948B1 (enExample
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
Western Electric Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Western Electric Co Inc filed Critical Western Electric Co Inc
Publication of FR2093948A1 publication Critical patent/FR2093948A1/fr
Application granted granted Critical
Publication of FR2093948B1 publication Critical patent/FR2093948B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Computer Hardware Design (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Locating Faults (AREA)
FR7119477A 1970-06-01 1971-05-28 Expired FR2093948B1 (enExample)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US4217670A 1970-06-01 1970-06-01

Publications (2)

Publication Number Publication Date
FR2093948A1 true FR2093948A1 (enExample) 1972-02-04
FR2093948B1 FR2093948B1 (enExample) 1974-03-08

Family

ID=21920453

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7119477A Expired FR2093948B1 (enExample) 1970-06-01 1971-05-28

Country Status (11)

Country Link
US (1) US3702437A (enExample)
KR (1) KR780000392B1 (enExample)
BE (1) BE767541A (enExample)
CH (1) CH540494A (enExample)
DE (1) DE2125984A1 (enExample)
ES (1) ES392156A1 (enExample)
FR (1) FR2093948B1 (enExample)
GB (1) GB1345767A (enExample)
IE (1) IE35317B1 (enExample)
NL (1) NL7107132A (enExample)
SE (1) SE366839B (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4823385A (enExample) * 1971-07-28 1973-03-26
FR2418466A1 (fr) * 1978-02-24 1979-09-21 Telecommunications Sa Appareil pour etablir des prises de contact temporaires sur des circuits electriques
US5659244A (en) * 1994-09-21 1997-08-19 Nec Corporation Electronic circuit tester and method of testing electronic circuit
US6220102B1 (en) * 1999-09-03 2001-04-24 Vanguard International Semiconductor Corporation Die-shear test fixture apparatus
FR3112653B1 (fr) * 2020-07-15 2025-10-24 St Microelectronics Alps Sas Circuit intégré et procédé de diagnostic d’un tel circuit intégré

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3303400A (en) * 1961-07-25 1967-02-07 Fairchild Camera Instr Co Semiconductor device complex

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3549999A (en) * 1968-06-05 1970-12-22 Gen Electric Method and apparatus for testing circuits by measuring secondary emission electrons generated by electron beam bombardment of the pulsed circuit

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3303400A (en) * 1961-07-25 1967-02-07 Fairchild Camera Instr Co Semiconductor device complex

Non-Patent Citations (13)

* Cited by examiner, † Cited by third party
Title
"A FLYNG SPOT SCANNER"DE POTTER ET AL.PAGES 180 A 183.PAGE 180.DISPOSITIF UTILISE POUR *
APPLIQUE A OSCILLOSCOPE. *
ARTICLE *
D'UN SEMICONDUCTEUR PHOTOSENSIBLE.LE SIGNAL DE SORTIE DU SEMICONDUCTEUR EST AMPLIFIE ET *
FAISCEAU DE LUMIERE DE LONGUEUR D'ONDE DE 1,15M OBTENU D'UNE SOURCE"LASER"SUR LA SURFACE *
L'ETUDE DES PROPRIETES DE DISPOSITIFS SEMICONDUCTEURS COMPORTANT DES MOYENS POUR DIRIGER UN *
MICROSCOPE A ELECTRONS SEM .DANS CETTE METHODE,ON UTILISE LES PAIRES ELECTRON-TROU ENGENDREES *
ON COMPARE LES RESULTATS OBTENUS DES DI *
PAR LE FAISCEAU PRIMAIRE DU MICROSCOPE POUR ETABLIR UN COURANT DANS UN CIRCUIT EXTERIEUR ET *
REVUE AMERICAINE"THE REVIEW OF SCIENTIFIC INSTRUMENTS",VOLUME 39,NO 2,FEVRIER 1968 *
REVUE BRITANNIQUE"MICRO-ELECTRONICS AND RELIABILITY" "PERGAMON PRESS" *
THORNTON ET AL.PAGES 9-16.PAGE 10.METHODE DE TEST DE MICROCIRCUITS COMPLEXES UTILISANT UN *
VOLUME 6,1967,ARTICLE:"FACTURE ANALYSIS OF MICROCIRCUITRY BY SCANNING ELECTRON MICROSCOPY"DE *

Also Published As

Publication number Publication date
BE767541A (fr) 1971-10-18
DE2125984A1 (de) 1971-12-16
NL7107132A (enExample) 1971-12-03
ES392156A1 (es) 1974-02-16
IE35317L (en) 1971-12-01
CH540494A (de) 1973-08-15
GB1345767A (en) 1974-02-06
IE35317B1 (en) 1976-01-07
KR780000392B1 (en) 1978-10-04
FR2093948B1 (enExample) 1974-03-08
SE366839B (enExample) 1974-05-06
US3702437A (en) 1972-11-07

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Legal Events

Date Code Title Description
ST Notification of lapse