IE35317B1 - Method and apparatus for diagnosing faults in electronic assemblies - Google Patents

Method and apparatus for diagnosing faults in electronic assemblies

Info

Publication number
IE35317B1
IE35317B1 IE694/71A IE69471A IE35317B1 IE 35317 B1 IE35317 B1 IE 35317B1 IE 694/71 A IE694/71 A IE 694/71A IE 69471 A IE69471 A IE 69471A IE 35317 B1 IE35317 B1 IE 35317B1
Authority
IE
Ireland
Prior art keywords
electronic assemblies
diagnosing faults
response
faulty
devices
Prior art date
Application number
IE694/71A
Other languages
English (en)
Other versions
IE35317L (en
Original Assignee
Western Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Western Electric Co filed Critical Western Electric Co
Publication of IE35317L publication Critical patent/IE35317L/xx
Publication of IE35317B1 publication Critical patent/IE35317B1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Computer Hardware Design (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Locating Faults (AREA)
IE694/71A 1970-06-01 1971-05-31 Method and apparatus for diagnosing faults in electronic assemblies IE35317B1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US4217670A 1970-06-01 1970-06-01

Publications (2)

Publication Number Publication Date
IE35317L IE35317L (en) 1971-12-01
IE35317B1 true IE35317B1 (en) 1976-01-07

Family

ID=21920453

Family Applications (1)

Application Number Title Priority Date Filing Date
IE694/71A IE35317B1 (en) 1970-06-01 1971-05-31 Method and apparatus for diagnosing faults in electronic assemblies

Country Status (11)

Country Link
US (1) US3702437A (enExample)
KR (1) KR780000392B1 (enExample)
BE (1) BE767541A (enExample)
CH (1) CH540494A (enExample)
DE (1) DE2125984A1 (enExample)
ES (1) ES392156A1 (enExample)
FR (1) FR2093948B1 (enExample)
GB (1) GB1345767A (enExample)
IE (1) IE35317B1 (enExample)
NL (1) NL7107132A (enExample)
SE (1) SE366839B (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4823385A (enExample) * 1971-07-28 1973-03-26
FR2418466A1 (fr) * 1978-02-24 1979-09-21 Telecommunications Sa Appareil pour etablir des prises de contact temporaires sur des circuits electriques
US5659244A (en) * 1994-09-21 1997-08-19 Nec Corporation Electronic circuit tester and method of testing electronic circuit
US6220102B1 (en) * 1999-09-03 2001-04-24 Vanguard International Semiconductor Corporation Die-shear test fixture apparatus
FR3112653B1 (fr) * 2020-07-15 2025-10-24 St Microelectronics Alps Sas Circuit intégré et procédé de diagnostic d’un tel circuit intégré

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3303400A (en) * 1961-07-25 1967-02-07 Fairchild Camera Instr Co Semiconductor device complex
US3549999A (en) * 1968-06-05 1970-12-22 Gen Electric Method and apparatus for testing circuits by measuring secondary emission electrons generated by electron beam bombardment of the pulsed circuit

Also Published As

Publication number Publication date
BE767541A (fr) 1971-10-18
DE2125984A1 (de) 1971-12-16
NL7107132A (enExample) 1971-12-03
ES392156A1 (es) 1974-02-16
IE35317L (en) 1971-12-01
CH540494A (de) 1973-08-15
GB1345767A (en) 1974-02-06
FR2093948A1 (enExample) 1972-02-04
KR780000392B1 (en) 1978-10-04
FR2093948B1 (enExample) 1974-03-08
SE366839B (enExample) 1974-05-06
US3702437A (en) 1972-11-07

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