GB1303053A - - Google Patents

Info

Publication number
GB1303053A
GB1303053A GB4000669A GB1303053DA GB1303053A GB 1303053 A GB1303053 A GB 1303053A GB 4000669 A GB4000669 A GB 4000669A GB 1303053D A GB1303053D A GB 1303053DA GB 1303053 A GB1303053 A GB 1303053A
Authority
GB
United Kingdom
Prior art keywords
station
wafer
test
wafers
diodes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB4000669A
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of GB1303053A publication Critical patent/GB1303053A/en
Expired legal-status Critical Current

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
GB4000669A 1969-08-11 1969-08-11 Expired GB1303053A (enExample)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB4000669 1969-08-11

Publications (1)

Publication Number Publication Date
GB1303053A true GB1303053A (enExample) 1973-01-17

Family

ID=10412692

Family Applications (1)

Application Number Title Priority Date Filing Date
GB4000669A Expired GB1303053A (enExample) 1969-08-11 1969-08-11

Country Status (2)

Country Link
US (1) US3704418A (enExample)
GB (1) GB1303053A (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1097654B (it) * 1978-08-02 1985-08-31 Eurodomestici Ind Riunite Itmetodo e impianto per il collaudo di articoli prodotti in grande serie
US4379259A (en) * 1980-03-12 1983-04-05 National Semiconductor Corporation Process of performing burn-in and parallel functional testing of integrated circuit memories in an environmental chamber
US4905445A (en) * 1988-03-14 1990-03-06 Tdk Corporation System for arranging chips in series

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3344351A (en) * 1963-06-03 1967-09-26 Gen Instrument Corp Testing apparatus for a sequence of transistors and the like having a condition responsive marker
US3345567A (en) * 1964-02-26 1967-10-03 Kulicke And Soffa Mfg Company Multipoint probe apparatus for electrically testing multiple surface points within small zones

Also Published As

Publication number Publication date
US3704418A (en) 1972-11-28

Similar Documents

Publication Publication Date Title
US9519007B2 (en) Handling system for testing electronic components
GB1416787A (en) Circuit board
GB1416786A (en) Method of testing an integrated circuit block
ES312237A1 (es) Maquina-herramienta
US3492571A (en) Apparatus for testing an electrical circuit for opens,shorts and cross connections with its terminal groups being sequentially connected to the apparatus
GB1303053A (enExample)
US5686834A (en) Handling system
GB1503935A (en) Monolithically integrated semiconductor elements
Feather Value differences in relation to ethnocentrism, intolerance of ambiguity, and dogmatism.
US2996184A (en) Automatic sorting device
GB969632A (en) Superconductor circuits
CN102222632A (zh) 晶圆测试方法及装置
GB1345767A (en) Method and apparatus for diagnosing faults in electronic assemblies
JPS649378A (en) Semiconductor testing apparatus
GB1404863A (en) Method for testing semiconductor junctions
GB1485176A (en) Automatic test arrangement for electronic components
JPS5740951A (en) Manufacture of semiconductor device
CN221352694U (zh) Led生产设备
GB1292308A (en) Apparatus for inspecting containers for leaks
GB1318930A (en) Microelectronic circuit arrangement and method of manufacture thereof
GB875024A (en) Improvements in or relating to a method of and apparatus for manufacturing projection lamps
GB1153355A (en) Improvements in or relating to Apparatus for Automatically Classifying Electrical Components.
BRITT et al. Fault isolation techniques in the saturn s-ii automatic checkout equipment(Automatic checkout equipment with central computer linked to checkout stations to isolate faults in Saturn V second stage)
GB1305010A (enExample)
US3715576A (en) Synchronized illumination for operations on light sensitive articles

Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee