GB1512950A - Electrical testing apparatus - Google Patents

Electrical testing apparatus

Info

Publication number
GB1512950A
GB1512950A GB21227/74A GB2122774A GB1512950A GB 1512950 A GB1512950 A GB 1512950A GB 21227/74 A GB21227/74 A GB 21227/74A GB 2122774 A GB2122774 A GB 2122774A GB 1512950 A GB1512950 A GB 1512950A
Authority
GB
United Kingdom
Prior art keywords
various
circuit
under test
points
testing apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB21227/74A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Plessey Co Ltd
Original Assignee
Plessey Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Plessey Co Ltd filed Critical Plessey Co Ltd
Priority to GB21227/74A priority Critical patent/GB1512950A/en
Publication of GB1512950A publication Critical patent/GB1512950A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/67—Testing the correctness of wire connections in electric apparatus or circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

1512950 Testing circuits PLESSEY CO Ltd 28 July 1975 [14 May 1974] 21227/74 Addition to 1386092 Heading G1U The system described in the Parent Specification is modified in that having performed one test cycle in which various inputs to a circuit under test are earthed and earth potential is then looked for at various other circuit points, another cycle is then performed with an appropriate non-zero bias voltage applied to the various points, whereby those short circuit faults within the circuit under test that are shunted by p-n junctions can be detected by the fact that a forward-biased current-carrying p-n junction drops about 0À8 volts.
GB21227/74A 1975-07-28 1975-07-28 Electrical testing apparatus Expired GB1512950A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB21227/74A GB1512950A (en) 1975-07-28 1975-07-28 Electrical testing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB21227/74A GB1512950A (en) 1975-07-28 1975-07-28 Electrical testing apparatus

Publications (1)

Publication Number Publication Date
GB1512950A true GB1512950A (en) 1978-06-01

Family

ID=10159337

Family Applications (1)

Application Number Title Priority Date Filing Date
GB21227/74A Expired GB1512950A (en) 1975-07-28 1975-07-28 Electrical testing apparatus

Country Status (1)

Country Link
GB (1) GB1512950A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0305148A1 (en) * 1987-08-26 1989-03-01 Hewlett-Packard Company Determining component orientation

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0305148A1 (en) * 1987-08-26 1989-03-01 Hewlett-Packard Company Determining component orientation

Similar Documents

Publication Publication Date Title
ES485464A1 (en) Test device for the stepwise indication of a measurement voltage.
GB1169706A (en) An Electrical Fault Detector
ATE74237T1 (en) METHOD AND DEVICE FOR LOCATING AN EARTH FAULT IN A CONDUCTOR IN A THREE-PHASE SYSTEM.
KR890004171A (en) Reverse orientation IC inspection device and method
GB1375744A (en)
GB1160968A (en) Universal Electronic Test System
SE7706322L (en) SYNTHETIC TEST COUPLING DEVICE
GB1512950A (en) Electrical testing apparatus
GB1247466A (en) Method for determining excess carrier lifetime in semiconductor devices
GB1278632A (en) Improvements relating to measuring and testing electrical circuits
US2900534A (en) Phase discriminator
BE861237A (en) PROCEDURE FOR TESTING FAULT CURRENT AND FAULT VOLTAGE PROTECTION CIRCUITS AND ARRANGEMENT FOR PERFORMING THIS PROCEDURE
GB1090901A (en) Protective relay apparatus
GB1428944A (en) Method and apparatus for automatic fault diagnosis of electrical circuits employing on-line simulation of faults in such circuits during diagnosis
GB1345767A (en) Method and apparatus for diagnosing faults in electronic assemblies
AT346959B (en) SYSTEM FOR AUTOMATIC RECONCUCTION OF THE CIRCUIT BREAKERS OF FAILED HIGH VOLTAGE LINES IN STAR POINT EARTHED HIGH VOLTAGE NETWORKS
SE7602161L (en) POWER CONTROL SYSTEM
JPS5650526A (en) Semiconductor device
JPS5674894A (en) Sense amplifier
SU513436A1 (en) Device for automatic compensation of capacitive ground fault currents
GB1305010A (en)
GB1376595A (en) Methods of testing electric circuit arrangements
JPS54110704A (en) High impedance detector circuit for defferential transmission
GB1501100A (en) Testing printed circuit boards
JPS5444485A (en) Semiconductor device

Legal Events

Date Code Title Description
PS Patent sealed
PCNP Patent ceased through non-payment of renewal fee