GB1376595A - Methods of testing electric circuit arrangements - Google Patents

Methods of testing electric circuit arrangements

Info

Publication number
GB1376595A
GB1376595A GB5156870A GB5156870A GB1376595A GB 1376595 A GB1376595 A GB 1376595A GB 5156870 A GB5156870 A GB 5156870A GB 5156870 A GB5156870 A GB 5156870A GB 1376595 A GB1376595 A GB 1376595A
Authority
GB
United Kingdom
Prior art keywords
voltages
board
testing
semi
methods
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB5156870A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co PLC
Original Assignee
General Electric Co PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co PLC filed Critical General Electric Co PLC
Priority to GB5156870A priority Critical patent/GB1376595A/en
Publication of GB1376595A publication Critical patent/GB1376595A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

1376595 Testing printed circuit boards GENERAL ELECTRIC CO Ltd 3 Jan 1972 [29 Oct 1970] 51568/70 Heading G1U A method of testing a printed circuit board carrying one or more semi-conductor junctions is characterized in that the fixed potentials applied to the board, and those that are subsequently applied to effect the tests, are less than the barrier potentials of the semi-conductor junctions on the board. As described, fixed voltages of e.g. 100mV and OV are applied to appropriate lines 10, 11 of a circuit under test such as that shown, and then test voltages of a similar magnitude are applied sequentially to points A,B,C, automatically under programme control and the resulting voltages at other points 1, 2, 3 .... in the circuit are measured and compared with programmed pre-set tolerances, any deviations causing a print-out to be made.
GB5156870A 1970-10-29 1970-10-29 Methods of testing electric circuit arrangements Expired GB1376595A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB5156870A GB1376595A (en) 1970-10-29 1970-10-29 Methods of testing electric circuit arrangements

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB5156870A GB1376595A (en) 1970-10-29 1970-10-29 Methods of testing electric circuit arrangements

Publications (1)

Publication Number Publication Date
GB1376595A true GB1376595A (en) 1974-12-04

Family

ID=10460518

Family Applications (1)

Application Number Title Priority Date Filing Date
GB5156870A Expired GB1376595A (en) 1970-10-29 1970-10-29 Methods of testing electric circuit arrangements

Country Status (1)

Country Link
GB (1) GB1376595A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2167196A (en) * 1984-11-09 1986-05-21 Membrain Ltd Device orientation test method
EP0305148A1 (en) * 1987-08-26 1989-03-01 Hewlett-Packard Company Determining component orientation

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2167196A (en) * 1984-11-09 1986-05-21 Membrain Ltd Device orientation test method
US4727317A (en) * 1984-11-09 1988-02-23 Membrain Ltd. Device orientation test method suitable for automatic test equipment
EP0305148A1 (en) * 1987-08-26 1989-03-01 Hewlett-Packard Company Determining component orientation

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Legal Events

Date Code Title Description
PS Patent sealed
PCNP Patent ceased through non-payment of renewal fee