GB1294440A - Detector system for a scanning electron microscope - Google Patents
Detector system for a scanning electron microscopeInfo
- Publication number
- GB1294440A GB1294440A GB21675/71A GB2167571A GB1294440A GB 1294440 A GB1294440 A GB 1294440A GB 21675/71 A GB21675/71 A GB 21675/71A GB 2167571 A GB2167571 A GB 2167571A GB 1294440 A GB1294440 A GB 1294440A
- Authority
- GB
- United Kingdom
- Prior art keywords
- electrons
- detectors
- unscattered
- scattered electrons
- cone
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract 1
- 230000004888 barrier function Effects 0.000 abstract 1
- 238000005286 illumination Methods 0.000 abstract 1
- 229910052710 silicon Inorganic materials 0.000 abstract 1
- 239000010703 silicon Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/045—Beam blanking or chopping, i.e. arrangements for momentarily interrupting exposure to the discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/05—Electron or ion-optical arrangements for separating electrons or ions according to their energy or mass
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical, image processing or photographic arrangements associated with the tube
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/244—Detectors; Associated components or circuits therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
- H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
- H01J49/484—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter with spherical mirrors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/244—Detection characterized by the detecting means
- H01J2237/2446—Position sensitive detectors
- H01J2237/24465—Sectored detectors, e.g. quadrants
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/244—Detection characterized by the detecting means
- H01J2237/24475—Scattered electron detectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/244—Detection characterized by the detecting means
- H01J2237/24485—Energy spectrometers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/244—Detection characterized by the detecting means
- H01J2237/2449—Detector devices with moving charges in electric or magnetic fields
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/245—Detection characterised by the variable being measured
- H01J2237/24507—Intensity, dose or other characteristics of particle beams or electromagnetic radiation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/245—Detection characterised by the variable being measured
- H01J2237/24571—Measurements of non-electric or non-magnetic variables
- H01J2237/24585—Other variables, e.g. energy, mass, velocity, time, temperature
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
1294440 Electron microscopes UNITED STATES ATOMIC ENERGY COMMISSION 19 April 1971 [5 March 1970] 21675/71 Heading H1D In a scanning electron microscope electrons transmitted by an object 45 are detected by three detecting means which respond to unscattered electrons, elastically scattered electrons and inelastically scattered electrons respectively. The unscattered and inelastically scattered electrons are within cone 46 which is of the same angle as the cone of illumination, these electrons passing through an electrostatic analyser 53 which focuses the higher energy unscattered electrons on detector 59, the lower energy inelastically scattered electrons being received by detectors 60, 61. The elastically scattered electrons lie outside cone 46 and impinge upon annular detectors 48 to 51. The signals from the detectors are fed through amplifiers 63 to 69, signal processor 71 which can combine the signals in any desired way, and then to a display 72. The detectors may be scintillation or silicon barrier detectors.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US1680270A | 1970-03-05 | 1970-03-05 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1294440A true GB1294440A (en) | 1972-10-25 |
Family
ID=21779049
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB21675/71A Expired GB1294440A (en) | 1970-03-05 | 1971-04-19 | Detector system for a scanning electron microscope |
Country Status (7)
Country | Link |
---|---|
US (1) | US3626184A (en) |
JP (1) | JPS5411664B1 (en) |
BE (1) | BE763456A (en) |
CH (1) | CH520927A (en) |
DE (1) | DE2110325A1 (en) |
FR (1) | FR2084007A5 (en) |
GB (1) | GB1294440A (en) |
Families Citing this family (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USRE29500E (en) * | 1970-08-31 | 1977-12-20 | Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften E.V. | Scanning charged beam particle beam microscope |
US3857034A (en) * | 1970-08-31 | 1974-12-24 | Max Planck Gesellschaft | Scanning charged beam particle beam microscope |
FR2134296B1 (en) * | 1971-04-30 | 1974-03-22 | Thomson Csf | |
US3917946A (en) * | 1972-04-12 | 1975-11-04 | Philips Corp | Electron-optical device for the recording of selected diffraction patterns |
JPS521869B2 (en) * | 1972-07-11 | 1977-01-18 | ||
JPS49118493A (en) * | 1973-03-12 | 1974-11-12 | ||
FR2220871B1 (en) * | 1973-07-27 | 1978-01-20 | Jeol Ltd | |
JPS532755B2 (en) * | 1973-08-22 | 1978-01-31 | ||
FR2275022A2 (en) * | 1974-06-14 | 1976-01-09 | Cgr Mev | DEVICE FOR MONITORING THE POSITION, INTENSITY, HOMOGENEITY AND DIRECTIVITY OF AN IONIZING RADIATION BEAM |
US3908124A (en) * | 1974-07-01 | 1975-09-23 | Us Energy | Phase contrast in high resolution electron microscopy |
US4058730A (en) * | 1974-09-12 | 1977-11-15 | Siemens Aktiengesellschaft | Irradiating device with an electronic accelerator |
US3965351A (en) * | 1974-10-30 | 1976-06-22 | The United States Of America As Represented By The United States Energy Research And Development Administration | Differential auger spectrometry |
DE2542356C2 (en) * | 1975-09-19 | 1977-10-20 | Siemens AG, 1000 Berlin und 8000 München | Method for focusing the objective lens of a corpuscular transmission scanning microscope and device for automatic implementation of the method, as well as application |
JPS5248964A (en) * | 1975-10-17 | 1977-04-19 | Hitachi Ltd | Transmission-type scanning electronic microscope |
NL7804037A (en) * | 1978-04-17 | 1979-10-19 | Philips Nv | ELECTRONIC MICROSKOP WITH UNDIFFERENTIATED PHASE IMAGE. |
AU534811B2 (en) * | 1979-07-03 | 1984-02-16 | Unisearch Limited | Atmospheric scanning electron microscope |
US4514629A (en) * | 1982-07-07 | 1985-04-30 | National Research Development Corporation | Scanning transmission electron microscopes |
GB8509493D0 (en) * | 1985-04-12 | 1985-05-15 | Plessey Co Plc | Scanning microscopes |
US4760567A (en) * | 1986-08-11 | 1988-07-26 | Electron Beam Memories | Electron beam memory system with ultra-compact, high current density electron gun |
JPS6482445A (en) * | 1987-09-25 | 1989-03-28 | Hitachi Ltd | Charged particle detector |
JP2602287B2 (en) * | 1988-07-01 | 1997-04-23 | 株式会社日立製作所 | X-ray mask defect inspection method and apparatus |
US5008535A (en) * | 1988-09-02 | 1991-04-16 | U.S. Philips Corporation | Energy analyzer and spectrometer for low-energy electrons |
US4877961A (en) * | 1988-10-26 | 1989-10-31 | Varian Associates, Inc. | In-line electron beam energy monitor and control |
JPH0766766B2 (en) * | 1989-03-30 | 1995-07-19 | 株式会社日立製作所 | electronic microscope |
US5475228A (en) * | 1994-11-28 | 1995-12-12 | University Of Puerto Rico | Unipolar blocking method and apparatus for monitoring electrically charged particles |
JP3776887B2 (en) * | 2003-01-07 | 2006-05-17 | 株式会社日立ハイテクノロジーズ | Electron beam equipment |
DE10331137B4 (en) * | 2003-07-09 | 2008-04-30 | Carl Zeiss Nts Gmbh | Detector system for a scanning electron microscope and scanning electron microscope with a corresponding detector system |
JP4664041B2 (en) * | 2004-10-27 | 2011-04-06 | 株式会社日立ハイテクノロジーズ | Charged particle beam apparatus and sample preparation method |
US7105817B2 (en) * | 2005-01-18 | 2006-09-12 | International Business Machines Inc. | Method of forming images in a scanning electron microscope |
ITBO20070409A1 (en) * | 2007-06-11 | 2008-12-12 | C N R Consiglio Naz Delle Ri C | DETECTOR DEVICE FOR ELECTRONIC MICROSCOPE. |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3191028A (en) * | 1963-04-22 | 1965-06-22 | Albert V Crewe | Scanning electron microscope |
-
1970
- 1970-03-05 US US168020*A patent/US3626184A/en not_active Expired - Lifetime
-
1971
- 1971-02-25 BE BE763456A patent/BE763456A/en not_active IP Right Cessation
- 1971-02-26 FR FR7106854A patent/FR2084007A5/fr not_active Expired
- 1971-03-02 CH CH304071A patent/CH520927A/en not_active IP Right Cessation
- 1971-03-04 DE DE19712110325 patent/DE2110325A1/en active Pending
- 1971-03-05 JP JP1134771A patent/JPS5411664B1/ja active Pending
- 1971-04-19 GB GB21675/71A patent/GB1294440A/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
DE2110325A1 (en) | 1971-09-16 |
US3626184A (en) | 1971-12-07 |
BE763456A (en) | 1971-07-16 |
CH520927A (en) | 1972-03-31 |
FR2084007A5 (en) | 1971-12-17 |
JPS5411664B1 (en) | 1979-05-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed [section 19, patents act 1949] | ||
PLNP | Patent lapsed through nonpayment of renewal fees | ||
427A | Application made for restoration (sect. 27/1949) | ||
427C | Application for amendment of specification now open to opposition (sect. 27/1949) | ||
427B | Order made restoring the patent (sect. 27/1949) | ||
746 | Register noted 'licences of right' (sect. 46/1977) | ||
PCNP | Patent ceased through non-payment of renewal fee |