GB1255465A - Improvements in or relating to electrical contact devices - Google Patents

Improvements in or relating to electrical contact devices

Info

Publication number
GB1255465A
GB1255465A GB303170A GB303170A GB1255465A GB 1255465 A GB1255465 A GB 1255465A GB 303170 A GB303170 A GB 303170A GB 303170 A GB303170 A GB 303170A GB 1255465 A GB1255465 A GB 1255465A
Authority
GB
United Kingdom
Prior art keywords
contacts
contact
tip
carrier
spring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB303170A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Publication of GB1255465A publication Critical patent/GB1255465A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • C—CHEMISTRY; METALLURGY
    • C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2237/00—Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
    • C04B2237/30—Composition of layers of ceramic laminates or of ceramic or metallic articles to be joined by heating, e.g. Si substrates
    • C04B2237/32—Ceramic
    • C04B2237/36—Non-oxidic
    • C04B2237/366—Aluminium nitride

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

1,255,465. Probes. SIEMENS A.G. 21 Jan., 1970 [22 Jan., 1969], No. 3031/70. Heading H2E. In an electrical contact device for testing circuit boards a plurality of resilient contacts 2 ... 2<SP>111</SP> of spring steel slidably mounted in a carrier 17 with bushes I ... 1<SP>111</SP> of P.T.F.E. constructed with collars to reduce " tracking " are. provided with at least partially spherical tip contacts 3 ... 3<SP>111</SP> and spiral springs 4 ... 4<SP>111</SP> to ensure good electrical contact. A heater 6 is provided to keep the contact tips dry. In further embodiments, Figs. 4. and 5 (not shown) the contacts 2 . . . 2<SP>111</SP>, either solid or of thin-walled metal tube, are coated with P.T.F.E. forming an insulating sheath (13.) and the bushes 1 . . . 1<SP>111</SP>are dispensed with. To prevent " tracking ", sleeves of P.T.F.E. are placed between the tip contact and the spring and between a soldering sleeve (14) and the carrier respectively. Electrical connection is effected by connecting the spring 4 to the tip contact 3 and the carrier 17 which is connected to an electrical supply. The tip contacts 3 are changeable and comprise one or two elements, a tube section (10) and a welded-on spheroid (9, Fig. 6, not shown) or a pin (11) and a welded-on sphere (12, Fig. 7, not shown) or a rivet.
GB303170A 1969-01-22 1970-01-21 Improvements in or relating to electrical contact devices Expired GB1255465A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19691903088 DE1903088A1 (en) 1969-01-22 1969-01-22 Contact device

Publications (1)

Publication Number Publication Date
GB1255465A true GB1255465A (en) 1971-12-01

Family

ID=5723108

Family Applications (1)

Application Number Title Priority Date Filing Date
GB303170A Expired GB1255465A (en) 1969-01-22 1970-01-21 Improvements in or relating to electrical contact devices

Country Status (6)

Country Link
JP (1) JPS502060B1 (en)
AT (1) AT300955B (en)
DE (1) DE1903088A1 (en)
FR (1) FR2028879A1 (en)
GB (1) GB1255465A (en)
NL (1) NL143045B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101160532B (en) * 2005-04-28 2010-11-10 日本发条株式会社 Conductive contact holder and conductive contact unit

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2493671A1 (en) * 1980-10-30 1982-05-07 Everett Charles Inc CONTACTS SHIFT, TEST APPARATUS WITH CONTACTS SHIFT, AND METHOD FOR MANUFACTURING CONTACTS SHIFT
DE3108523A1 (en) * 1981-03-06 1982-09-23 Feinmetall Gmbh, 7033 Herrenberg Contact device
EP0069592B1 (en) * 1981-07-08 1985-04-24 Fujitsu Limited Device for testing semiconductor devices at a high temperature
DE3136896A1 (en) * 1981-09-17 1983-04-14 Ingun Prüfmittelbau GmbH & Co KG Elektronik, 7750 Konstanz Device for testing an electronic circuit board
FR2547959B1 (en) * 1983-06-23 1986-06-13 Laudren Cie Ets TEST TAKING DEVICE FOR CABLE HEAD
DE3421799A1 (en) * 1984-06-12 1985-12-12 Feinmetall Gmbh, 7033 Herrenberg CONTACT ELEMENT FOR TEST ADAPTER
DE3844685C2 (en) * 1987-04-16 1995-05-18 Teradyne Inc Contact probe
DE3722485A1 (en) * 1987-07-03 1989-01-12 Deutsche Telephonwerk Kabel Elastic contact needle and contacting device
JPS6430028U (en) * 1987-08-14 1989-02-23
EP0346737A3 (en) * 1988-06-13 1991-04-03 Siemens Aktiengesellschaft Strechable field of needles
FI89842C (en) * 1989-04-12 1993-11-25 Nokia Mobira Oy FJAEDRANDE KONTAKTDON FOER RADIOFREKVENTA SIGNALER
FI84948C (en) * 1989-04-12 1992-02-10 Nokia Mobira Oy YTKONTAKTDON FOER RADIOFREKVENTA SIGNALER.
JP4689196B2 (en) * 2003-11-05 2011-05-25 日本発條株式会社 Conductive contact holder, conductive contact unit

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101160532B (en) * 2005-04-28 2010-11-10 日本发条株式会社 Conductive contact holder and conductive contact unit
US8087956B2 (en) 2005-04-28 2012-01-03 Nhk Spring Co., Ltd. Conductive contact holder and conductive contact unit

Also Published As

Publication number Publication date
FR2028879A1 (en) 1970-10-16
DE1903088A1 (en) 1971-01-21
NL143045B (en) 1974-08-15
NL7000860A (en) 1970-07-24
AT300955B (en) 1972-08-10
JPS502060B1 (en) 1975-01-23

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