DE3108523A1 - Contact device - Google Patents
Contact deviceInfo
- Publication number
- DE3108523A1 DE3108523A1 DE19813108523 DE3108523A DE3108523A1 DE 3108523 A1 DE3108523 A1 DE 3108523A1 DE 19813108523 DE19813108523 DE 19813108523 DE 3108523 A DE3108523 A DE 3108523A DE 3108523 A1 DE3108523 A1 DE 3108523A1
- Authority
- DE
- Germany
- Prior art keywords
- contact
- adapter plate
- plate
- circuit board
- contact device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
- H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/71—Coupling devices for rigid printing circuits or like structures
- H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
Abstract
Description
Kontaktvorrichtung Contact device
Aktenzeichen : P .Case number: P.
Anmelder : FEINMETALL GMBH, HERRENBERG Erfinder : Herr Dr. Gustav Krüger Die Erfindung betrifft eine Kontakteinrichtung zum gleichzeitigen Kontaktieren mehrerer zu prüfender Kontaktstellen, beispielsweise einer elektrischen Leiterplatte oder eines integrierten Schlatkreises mit mehreren in einer Adapterplatte parallel nebeneinander liegenden Federkontakten, die aus einer pulse und einem in ihr geführten, durch eine Schraubenfeder verspannten Kontaktkolben bestehen.Applicant: FEINMETALL GMBH, HERRENBERG Inventor: Dr. Gustav Kruger The invention relates to a contact device for simultaneous Contacting several contact points to be tested, for example an electrical one PCB or an integrated circuit with several in one adapter plate spring contacts lying parallel next to each other, consisting of a pulse and an in their guided, by a helical spring tensioned contact piston exist.
Eine solche Kontaktvorrichtung ist in DE-OS 28 26 645 beschrieben. Dort sind zur Weiterleitung des Prüfstromes an die Hülsen Drähte angelötet. Wenn - wie In manchen Anwendungsfällen erforderlich - sehr viele, bis zu 20.000 Federkontakte eingesetzt werden sollen, wird die Lötarbeit recht aufwendig. Es eribt sich zudem eine verwirrende Vielzahl von Drähten. Außerdem ist es schlecht möglich, einen durch Verschleiß unbrauchbar gewordenen ;-ederkontakt auszuwechseln.Such a contact device is described in DE-OS 28 26 645. There, wires are soldered to the sleeves for forwarding the test current. if - as required in some applications - very many, up to 20,000 spring contacts are to be used, the soldering work is quite complex. It also surrenders a confusing multitude of wires. In addition, it is difficult to get through Wear and tear that has become unusable; replace the spring contact.
Die Aufgabe der Erfindung besteht nun darin, die bekannte Kontaktvorrichtung in der Weise weiterzuentwickeln, daß sie auch bei Verwendung sehr vieler Federkontakte einfach herstellbar und in ihrer flinktionsweise überschaubar bleibt. insbesondere gilt dies bei kleinem gegenseitigen Abstand der Kontakte.The object of the invention is now to provide the known contact device to be further developed in such a way that they can also be used when using a large number of spring contacts easy to manufacture and its operation remains manageable. in particular this applies to a small mutual distance between the contacts.
Zur Lösung dieser Aufgabe wird erfindungsgemäß vorgeschlagen, die Federkontakte beim Kontaktieren mit der elektrischen Leiterplatte bzw. eines entsprechenden Bauteils an eine entsprechende Anzahl von zu ihnen fluchtenden Prüfdrähten anzudrücken, die parallel nebeneinander in einer zur Adaptertlatte parallelen Isolierplatte befestigt sind.To solve this problem it is proposed according to the invention that Spring contacts when making contact with the electrical circuit board or a corresponding one To press the component against a corresponding number of test wires aligned with them, which are attached parallel to each other in an insulating plate parallel to the adapter plate are.
in weiterer Ausgestaltung der Erfindung sind die Hülsen in der Adapterplatte in Längsrichtung verschiebbar mit solcher Haftkraft befestigt, daß sie ab einer kleinen Verspannung der innen an ihnen anliegenden Schraubenfedern relativ zur Adapterplatte beweglich und an die Prüfdrähte der Isolierplatte andrückbar sind. Es können ferner zusätzliche Mittel vorhanden sein, die das Herausgleiten der Federkontakte aus der Adapterplatte verhindern.In a further embodiment of the invention, the sleeves are in the adapter plate Fastened in the longitudinal direction with such adhesive force that it is from a small tension of the coil springs lying against them on the inside relative to the adapter plate are movable and can be pressed against the test wires of the insulating plate. It can also additional funds may be available to prevent the spring contacts from sliding out of the Prevent adapter plate.
Die einwandfrei überschaubare Zuordnung der Isolierplatten-Prüfdrähte zu den Federkontakten gestattet es, dem an den Früfdrähten abgenommenen und auf Meßgerät gegebenen Prüfstrom jeweils die entsprechende Kontaktstelle der elektrischen Leiterplatte in eindeutiger Weise zuzuordnen. Außerdem sind die Federkontakte bei eventueller Beschädigung oder bei Verschleiß einzeln oder als kompakte Baueinheit leicht und schnell auswechselbar.The perfectly clear assignment of the insulating plate test wires to the spring contacts it allows the removed and opened on the early wires Measuring device given test current in each case the corresponding contact point of the electrical Assign the printed circuit board in a clear manner. In addition, the spring contacts are at possible damage or wear individually or as a compact unit easily and quickly exchangeable.
Ein Ausführungsbeispiel der Erfindung ist in der Zeichnung dargestellt und wird nun näher erläutert.An embodiment of the invention is shown in the drawing and will now be explained in more detail.
Es zeigen Fig. 1 : schematische Darstellung einer Kontaktvorrichtung und einer elektrischen Leiterplatte Fig. 2 : Längsschnitt durch einen Federkontakt Zwischen einer mehrteiligen Isolierplatte 1 und einer zu ]ontaktierenden elektrischen Leiterplatte 2 1; eine Adapterplatte 3 allyeordne-t. In ihr sind parallel nebeneinander eine Vielzahl von Federkontakten 4, je nach Anwendungsfall beispielsweise 200 bis 20.000 Stück, angebracht. Durch eine vordere, aus Isolierm.iate-ial bestehenden Arretierplatte 5 sind die Federkontakte 4 gegen Verschieben nach dieser Seite gesichert. Die Isolierplatte 1 besteht aus einer vorderen Platine 6, eine hinteren Platine 7 und einer Abstandsplatte 5.1 shows a schematic representation of a contact device and an electrical circuit board Fig. 2: Longitudinal section through a spring contact Between a multi-part insulating plate 1 and an electrical one to be contacted Circuit board 2 1; an adapter plate 3 allyeordne-t. In it are parallel to each other a variety of spring contacts 4, depending on the application, for example 200 to 20,000 pieces, attached. Through a front, made of insulating m.iate-ial existing Locking plate 5, the spring contacts 4 are secured against shifting to this side. The insulating plate 1 consists of a front board 6, a rear board 7 and a spacer plate 5.
in der Isolierplatte 1 sind fluchtend zu den Federkontakten 4 eine entsprechende Anzahl von Prüfdrähten 9 betestigt, die an ein nicht yezeichnetes Meß- und Auswertegerät angeschlossen sind. Der zwischen den Platten 6 und 7 entstehende Hohlraum 16 kann vorzugsweise mit Kunststoff ausgeyossen werden.in the insulating plate 1 are aligned with the spring contacts 4 a Corresponding number of test wires 9 confirmed, which are connected to a non-marked Measuring and evaluation device are connected. The resulting between the plates 6 and 7 Cavity 16 can preferably be filled with plastic.
Der Federkontakt nach Fig. 2 besteht aus einer beidseitig eingebördelten Hülse 10, einer Schraubenfeder 11, die an der einen Einbördelung 12 anliegt und einem Kontaktkolben 13, den die Schraubenfeder 11 an die andere Einbördelung 14 anlegt.The spring contact according to FIG. 2 consists of a beaded one on both sides Sleeve 10, a helical spring 11 which rests against the one bead 12 and a contact piston 13 which the helical spring 11 attaches to the other bead 14 applies.
Zum Prüfen wird entweder die Isolierplatte 1 zusammen Anit der Adapterplatte 3 zur elektrischen Leiterplatte 2 hin oder die zu kontaktierende Leiterplatte 2 gegen die Adapterplatte 3 bewegt. Sobald die Kontaktspitzen 15 an der Leiterplatte 2 anliegen, dringen beim weiteren Andrücken die Kontaktkolben 13 tiefer in die Hülsen It ein und erhöhen die Spannung der Schraubenfedern 11.For testing, either the insulating plate 1 is used together with the adapter plate 3 towards the electrical circuit board 2 or the circuit board 2 to be contacted moved against the adapter plate 3. As soon as the contact tips 15 on the circuit board 2, the contact pistons 13 penetrate deeper into the sleeves when the pressure is continued It and increase the tension of the coil springs 11.
Wenn die Federspannung größer wird als die Haftkraft der Hülsen, die längsbeweglich in der Adapterplatte 3 betestigt sind, so werden diese relativ zur Adapterplatte 3 in Richtung Platte 6 bewegt und gegen die Stirn flächen der Kontaktdrähte 9 gedrückt. Die über die Hülsen 10 auf die Berührungsstellen zu den Prüfdrähten 9 ausgeübte Kontaktkraft wird durch Weiterbewegen der Isolierplatte 1 in Richtung Adapterplatte 3 so yroß gemacht, daß sich an der Berührungsstelle zu den Prüfdrähten 9 ein ausreienend kleiner Kontaktwiderstand einstellt. Innerhalb des Federkontaktes 4 fließt der Prüfstrom teils über die Schraubenfeder 3], teils über deX Hlsenmantel lo zum umgebördelten Hülsenende 12.When the spring tension is greater than the adhesive force of the sleeves, the are fixed longitudinally movable in the adapter plate 3, these are relative to the Adapter plate 3 moves in the direction of plate 6 and surfaces against the front of the contact wires 9 pressed. The over the sleeves 10 on the contact points to the test wires 9 exerted contact force is by moving the insulating plate 1 in the direction Adapter plate 3 made so big that it is at the point of contact with the test wires 9 sets an excessively small contact resistance. Inside the spring contact 4 the test current flows partly via the coil spring 3], partly via the deX sleeve jacket lo to the beaded end of the sleeve 12.
LeerseiteBlank page
Claims (1)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19813108523 DE3108523A1 (en) | 1981-03-06 | 1981-03-06 | Contact device |
DE19813115787 DE3115787A1 (en) | 1981-03-06 | 1981-04-18 | Contact device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19813108523 DE3108523A1 (en) | 1981-03-06 | 1981-03-06 | Contact device |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3108523A1 true DE3108523A1 (en) | 1982-09-23 |
Family
ID=6126515
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19813108523 Ceased DE3108523A1 (en) | 1981-03-06 | 1981-03-06 | Contact device |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE3108523A1 (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2570830A1 (en) * | 1984-09-27 | 1986-03-28 | Feinmetall Gmbh | CONTACT ROD HAS A SPRING PARTICULARLY FOR AN ELECTRICAL OR ELECTRONIC CIRCUIT CONTROL APPARATUS |
EP0257832A2 (en) * | 1986-08-01 | 1988-03-02 | Tektronix, Inc. | Telescoping pin probe |
EP0489666A1 (en) * | 1990-12-06 | 1992-06-10 | Schneider Electric Sa | Connection set with test plug |
DE19951501A1 (en) * | 1999-10-26 | 2001-05-23 | Atg Test Systems Gmbh | Test pin for a device for testing printed circuit boards |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1800657A1 (en) * | 1968-10-02 | 1970-05-27 | Siemens Ag | Contact device, in particular for the electrical testing of the lines of printed or etched circuit boards in telecommunications technology |
DE7031415U (en) * | 1970-08-21 | 1971-01-07 | Siemens Ag | DEVICE FOR ELECTRIC TESTING OF PRINTED CIRCUIT BOARDS. |
DE1903088A1 (en) * | 1969-01-22 | 1971-01-21 | Siemens Ag | Contact device |
FR2194108A1 (en) * | 1972-07-27 | 1974-02-22 | Itt France | |
US3805006A (en) * | 1972-10-13 | 1974-04-16 | Gen Motors Corp | Resilient electrical contact assembly |
DE2707900B2 (en) * | 1977-02-24 | 1978-12-14 | Ante 6980 Wertheim Milkovic | Universal adapter for devices for electrical testing of various printed circuits |
DE2826645A1 (en) * | 1978-06-19 | 1980-02-07 | Feinmetall Gmbh | SPRING CONTACT DEVICE FOR MEASURING AND TESTING PURPOSES |
-
1981
- 1981-03-06 DE DE19813108523 patent/DE3108523A1/en not_active Ceased
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1800657A1 (en) * | 1968-10-02 | 1970-05-27 | Siemens Ag | Contact device, in particular for the electrical testing of the lines of printed or etched circuit boards in telecommunications technology |
DE1903088A1 (en) * | 1969-01-22 | 1971-01-21 | Siemens Ag | Contact device |
DE7031415U (en) * | 1970-08-21 | 1971-01-07 | Siemens Ag | DEVICE FOR ELECTRIC TESTING OF PRINTED CIRCUIT BOARDS. |
FR2194108A1 (en) * | 1972-07-27 | 1974-02-22 | Itt France | |
US3805006A (en) * | 1972-10-13 | 1974-04-16 | Gen Motors Corp | Resilient electrical contact assembly |
DE2707900B2 (en) * | 1977-02-24 | 1978-12-14 | Ante 6980 Wertheim Milkovic | Universal adapter for devices for electrical testing of various printed circuits |
DE2826645A1 (en) * | 1978-06-19 | 1980-02-07 | Feinmetall Gmbh | SPRING CONTACT DEVICE FOR MEASURING AND TESTING PURPOSES |
Non-Patent Citations (3)
Title |
---|
US-Z: Electronics, Sept. 4, 1975, S.98-102 * |
US-Z: IBM Technical Disclosure Bulletin, Vol.17, Nr.2, Juli 1974, S.459-460 * |
US-Z: Technical Digest, Nr.43, July 1976, S.5,6, Western Electric * |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2570830A1 (en) * | 1984-09-27 | 1986-03-28 | Feinmetall Gmbh | CONTACT ROD HAS A SPRING PARTICULARLY FOR AN ELECTRICAL OR ELECTRONIC CIRCUIT CONTROL APPARATUS |
EP0257832A2 (en) * | 1986-08-01 | 1988-03-02 | Tektronix, Inc. | Telescoping pin probe |
EP0257832A3 (en) * | 1986-08-01 | 1989-12-27 | Tektronix, Inc. | Telescoping pin probe |
EP0489666A1 (en) * | 1990-12-06 | 1992-06-10 | Schneider Electric Sa | Connection set with test plug |
FR2670294A1 (en) * | 1990-12-06 | 1992-06-12 | Merlin Gerin | TEST TAKE. |
US5226827A (en) * | 1990-12-06 | 1993-07-13 | Merlin Gerin | Test connector |
DE19951501A1 (en) * | 1999-10-26 | 2001-05-23 | Atg Test Systems Gmbh | Test pin for a device for testing printed circuit boards |
US6720781B2 (en) | 1999-10-26 | 2004-04-13 | Atg Test Systems Gmbh & Co. Kg | Circuit board tester probe system |
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Legal Events
Date | Code | Title | Description |
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OM8 | Search report available as to paragraph 43 lit. 1 sentence 1 patent law | ||
AG | Has addition no. |
Ref country code: DE Ref document number: 3115787 Format of ref document f/p: P |
|
8110 | Request for examination paragraph 44 | ||
8125 | Change of the main classification |
Ipc: G01R 31/28 |
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8131 | Rejection |