GB1232878A - - Google Patents
Info
- Publication number
- GB1232878A GB1232878A GB1232878DA GB1232878A GB 1232878 A GB1232878 A GB 1232878A GB 1232878D A GB1232878D A GB 1232878DA GB 1232878 A GB1232878 A GB 1232878A
- Authority
- GB
- United Kingdom
- Prior art keywords
- diaphragms
- specimen
- cooled
- polepiece
- detectors
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 abstract 2
- 239000007788 liquid Substances 0.000 abstract 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 abstract 1
- 238000011109 contamination Methods 0.000 abstract 1
- 229910052802 copper Inorganic materials 0.000 abstract 1
- 239000010949 copper Substances 0.000 abstract 1
- 238000010894 electron beam technology Methods 0.000 abstract 1
- 230000005669 field effect Effects 0.000 abstract 1
- 239000001307 helium Substances 0.000 abstract 1
- 229910052734 helium Inorganic materials 0.000 abstract 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 abstract 1
- 229910052757 nitrogen Inorganic materials 0.000 abstract 1
- 239000004065 semiconductor Substances 0.000 abstract 1
- 239000007787 solid Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/244—Detectors; Associated components or circuits therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/244—Detection characterized by the detecting means
- H01J2237/2441—Semiconductor detectors, e.g. diodes
- H01J2237/24415—X-ray
- H01J2237/2442—Energy-dispersive (Si-Li type) spectrometer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/244—Detection characterized by the detecting means
- H01J2237/2445—Photon detectors for X-rays, light, e.g. photomultipliers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/244—Detection characterized by the detecting means
- H01J2237/2446—Position sensitive detectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/245—Detection characterised by the variable being measured
- H01J2237/24507—Intensity, dose or other characteristics of particle beams or electromagnetic radiation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/245—Detection characterised by the variable being measured
- H01J2237/24571—Measurements of non-electric or non-magnetic variables
- H01J2237/24585—Other variables, e.g. energy, mass, velocity, time, temperature
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19671614595 DE1614595B2 (de) | 1967-09-01 | 1967-09-01 | Korpuskularstrahlgeraet zur abbildung eines praeparates mittels kokeln insbesondere elektronenmikroskop |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1232878A true GB1232878A (zh) | 1971-05-19 |
Family
ID=5682002
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB1232878D Expired GB1232878A (zh) | 1967-09-01 | 1968-08-28 |
Country Status (2)
Country | Link |
---|---|
DE (1) | DE1614595B2 (zh) |
GB (1) | GB1232878A (zh) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL2008042A (en) * | 2010-12-27 | 2012-06-28 | Zeiss Carl Nts Gmbh | Particle beam microscope. |
CN105789004A (zh) * | 2016-04-20 | 2016-07-20 | 兰州大学 | 一种全温区热电两场扫描电镜原位物性测量台 |
EP3279921A1 (en) * | 2016-07-31 | 2018-02-07 | FEI Company | Electron microscope with multipe types of integrated x-ray detectors arranged in an array |
-
1967
- 1967-09-01 DE DE19671614595 patent/DE1614595B2/de not_active Withdrawn
-
1968
- 1968-08-28 GB GB1232878D patent/GB1232878A/en not_active Expired
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL2008042A (en) * | 2010-12-27 | 2012-06-28 | Zeiss Carl Nts Gmbh | Particle beam microscope. |
CN105789004A (zh) * | 2016-04-20 | 2016-07-20 | 兰州大学 | 一种全温区热电两场扫描电镜原位物性测量台 |
CN105789004B (zh) * | 2016-04-20 | 2018-01-23 | 兰州大学 | 一种全温区热电两场扫描电镜原位物性测量台及测量方法 |
EP3279921A1 (en) * | 2016-07-31 | 2018-02-07 | FEI Company | Electron microscope with multipe types of integrated x-ray detectors arranged in an array |
US9972474B2 (en) | 2016-07-31 | 2018-05-15 | Fei Company | Electron microscope with multiple types of integrated x-ray detectors arranged in an array |
Also Published As
Publication number | Publication date |
---|---|
DE1614595A1 (de) | 1970-10-29 |
DE1614595B2 (de) | 1972-03-30 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US2967961A (en) | Thermally sensitive pickup tube | |
GB1232878A (zh) | ||
GB1046550A (en) | Improvements in corpuscular ray apparatus | |
GB1420803A (en) | Electron microscopes | |
GB1332398A (en) | Multi-converter thermionic energy module | |
US3127749A (en) | Thermoelectric refrigeration | |
US2522153A (en) | Image sensitive tube | |
GB1194268A (en) | Improvements in or relating to Corpuscular Beam Apparatus Magnetic Lens Pole Piece Arrangements. | |
GB1038041A (en) | Improvements relating to solid state radiation detectors | |
GB1454097A (en) | Corpuscular beam transmission microscopes | |
Piercy et al. | A liquid helium cooled finger for the Siemens electron microscope | |
US2922935A (en) | Semi-conductor device | |
GB857952A (en) | Improvements relating to systems for observing objects under poor lighting conditions | |
GB691156A (en) | Improvements in or relating to corpuscular ray apparatus | |
JP2955913B2 (ja) | X線回折装置用超電導磁石装置 | |
GB1363900A (en) | System to protect equipment for studying samples by means of an electron beam | |
US3708772A (en) | Magnetic lens arrangement | |
GB1225579A (zh) | ||
Jones et al. | Experimental Demonstration of Electron‐Optical Regenerative Image Amplification | |
GB1278444A (en) | Improvements in or relating to a radiation detector comprising a semiconductor device | |
GB626671A (en) | Improvements in and relating to anode structures for cathode ray tubes | |
Frommhold et al. | The reduction of noise and dark current in photomultiplier tubes by magnetic defocusing | |
GB1053169A (zh) | ||
Hale et al. | Video recording in electron microscopy | |
GB364093A (en) | Improvements relating to electron discharge devices such as electric rectifying tubes and the like |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed | ||
PCNP | Patent ceased through non-payment of renewal fee |