GB1111133A - Improvements relating to electromechanical transducers - Google Patents

Improvements relating to electromechanical transducers

Info

Publication number
GB1111133A
GB1111133A GB18324/65A GB1832465A GB1111133A GB 1111133 A GB1111133 A GB 1111133A GB 18324/65 A GB18324/65 A GB 18324/65A GB 1832465 A GB1832465 A GB 1832465A GB 1111133 A GB1111133 A GB 1111133A
Authority
GB
United Kingdom
Prior art keywords
neck
pads
sectional area
cross
shape
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB18324/65A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Meggitt Orange County Inc
Original Assignee
Endevco Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Endevco Corp filed Critical Endevco Corp
Publication of GB1111133A publication Critical patent/GB1111133A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
    • H04R21/00—Variable-resistance transducers
    • H04R21/04—Gramophone pick-ups using a stylus; Recorders using a stylus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01G—WEIGHING
    • G01G21/00—Details of weighing apparatus
    • G01G21/02—Arrangements of bearings
    • G01G21/12—Devices for preventing derangement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/18—Measuring force or stress, in general using properties of piezo-resistive materials, i.e. materials of which the ohmic resistance varies according to changes in magnitude or direction of force applied to the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P15/12—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by alteration of electrical resistance
    • G01P15/123—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by alteration of electrical resistance by piezo-resistive elements, e.g. semiconductor strain gauges
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01C—RESISTORS
    • H01C10/00—Adjustable resistors
    • H01C10/10—Adjustable resistors adjustable by mechanical pressure or force
    • H01C10/12—Adjustable resistors adjustable by mechanical pressure or force by changing surface pressure between resistive masses or resistive and conductive masses, e.g. pile type

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Acoustics & Sound (AREA)
  • Signal Processing (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Pressure Sensors (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Gyroscopes (AREA)
  • Piezo-Electric Transducers For Audible Bands (AREA)
  • Force Measurement Appropriate To Specific Purposes (AREA)

Abstract

1,111,133. Electric solid-state devices. ENDEVCO CORPORATION. 30 April, 1965 [4 May, 1964], No. 18324/65. Heading H1K. [Also in Division H1] A block of single conductivity type piezo resistive semi-conductor material is shaped to form two pads 12 bridged by a thinner neck 10. The shape of the neck is such that it will crush before buckling under compressive stress, so that it can be used as a strain gauge in both tension and compression, and also in bending. Several transducer applications are described (see Division G1). The material may be silicon, germanium, silicon carbide or gallium arsenide doped, e.g. with boron, to achieve a resistivity of about 3 ohm-cm. The shape of the neck is such that in longitudinal section it is bounded by two semi-circular arcs and it is bi-concave in all transverse, sections. The neck length is not more than four times the thickness of the thinnest portion, and the cross-sectional area of the pads is at least ten times the cross-sectional area of the thinnest portion of the neck.
GB18324/65A 1964-05-04 1965-04-30 Improvements relating to electromechanical transducers Expired GB1111133A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US36467364A 1964-05-04 1964-05-04
US42186964A 1964-12-29 1964-12-29

Publications (1)

Publication Number Publication Date
GB1111133A true GB1111133A (en) 1968-04-24

Family

ID=27002594

Family Applications (3)

Application Number Title Priority Date Filing Date
GB18324/65A Expired GB1111133A (en) 1964-05-04 1965-04-30 Improvements relating to electromechanical transducers
GB54418/65A Expired GB1111134A (en) 1964-05-04 1965-04-30 Improvements relating to electromechanical transducers
GB54672/65A Expired GB1137889A (en) 1964-05-04 1965-12-23 Improvements relating to electro-mechanical transducers

Family Applications After (2)

Application Number Title Priority Date Filing Date
GB54418/65A Expired GB1111134A (en) 1964-05-04 1965-04-30 Improvements relating to electromechanical transducers
GB54672/65A Expired GB1137889A (en) 1964-05-04 1965-12-23 Improvements relating to electro-mechanical transducers

Country Status (3)

Country Link
US (1) US3501732A (en)
DE (2) DE1698644A1 (en)
GB (3) GB1111133A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3849874A (en) * 1972-07-28 1974-11-26 Bell & Howell Co Method for making a semiconductor strain transducer
USRE29009E (en) 1972-07-28 1976-10-26 Bell & Howell Company High sensitivity semiconductor strain gauge

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3673354A (en) * 1969-05-08 1972-06-27 Matsushita Electric Industrial Co Ltd Semiconductor stress transducer
US4080636A (en) * 1976-03-19 1978-03-21 Ampex Corporation System for damping vibrations in a deflectable transducer
US4498229A (en) * 1982-10-04 1985-02-12 Becton, Dickinson And Company Piezoresistive transducer
US4809552A (en) * 1987-11-23 1989-03-07 Allied-Signal, Inc. Multidirectional force-sensing transducer
GB2343953A (en) * 1998-11-18 2000-05-24 Autoliv Dev A sensor arrangement with a deformable region
US6969809B2 (en) 2003-09-22 2005-11-29 Cts Corporation Vehicle seat weight sensor
US6988412B1 (en) * 2004-11-30 2006-01-24 Endevco Corporation Piezoresistive strain concentrator
DE202006004145U1 (en) * 2006-03-11 2007-08-02 Dr. Hahn Gmbh & Co. Kg Band for hingedly connecting a movable wing to a fixed frame
FR2942538B1 (en) * 2009-02-26 2012-06-08 Airbus France MEASURING DEVICE OF HINGE MOMENT
CN107796955B (en) * 2017-09-30 2019-10-11 西安交通大学 Multi-beam type single-mass in-plane biaxial acceleration sensor chip and preparation method thereof
CN107817364B (en) * 2017-09-30 2019-10-11 西安交通大学 A MEMS direct-pull direct-compression two-axis accelerometer chip and its preparation method

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2909744A (en) * 1956-10-22 1959-10-20 Stxtham Instr Inc Electrical accelerometer
NL101891C (en) * 1957-02-23
US3089108A (en) * 1962-09-05 1963-05-07 Electro Optical Systems Inc Semiconductor strain gauge

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3849874A (en) * 1972-07-28 1974-11-26 Bell & Howell Co Method for making a semiconductor strain transducer
USRE29009E (en) 1972-07-28 1976-10-26 Bell & Howell Company High sensitivity semiconductor strain gauge

Also Published As

Publication number Publication date
DE1447995A1 (en) 1968-11-21
DE1447995B2 (en) 1970-12-10
GB1137889A (en) 1968-12-27
DE1698644A1 (en) 1971-02-25
DE1447995C3 (en) 1975-02-20
GB1111134A (en) 1968-04-24
US3501732A (en) 1970-03-17

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