FR3046683B1 - Dispositif d'imagerie du champs electromagnetique d'un echantillon - Google Patents

Dispositif d'imagerie du champs electromagnetique d'un echantillon Download PDF

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Publication number
FR3046683B1
FR3046683B1 FR1650165A FR1650165A FR3046683B1 FR 3046683 B1 FR3046683 B1 FR 3046683B1 FR 1650165 A FR1650165 A FR 1650165A FR 1650165 A FR1650165 A FR 1650165A FR 3046683 B1 FR3046683 B1 FR 3046683B1
Authority
FR
France
Prior art keywords
imaging
sample
electromagnetic fields
electromagnetic
fields
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1650165A
Other languages
English (en)
Other versions
FR3046683A1 (fr
Inventor
Yannick DE WILDE
Leo Greusard
Gilles Tessier
Sylvain Gigan
Samuel GRESILLON
Kamel BENCHEIKH
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Original Assignee
Centre National de la Recherche Scientifique CNRS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS filed Critical Centre National de la Recherche Scientifique CNRS
Priority to FR1650165A priority Critical patent/FR3046683B1/fr
Priority to PCT/FR2017/050041 priority patent/WO2017118828A2/fr
Priority to JP2018535414A priority patent/JP7141948B2/ja
Priority to US16/068,639 priority patent/US10684113B2/en
Priority to EP17711703.3A priority patent/EP3400488A2/fr
Publication of FR3046683A1 publication Critical patent/FR3046683A1/fr
Application granted granted Critical
Publication of FR3046683B1 publication Critical patent/FR3046683B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
    • G01B9/02003—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies using beat frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02041—Interferometers characterised by particular imaging or detection techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G01Q30/02—Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0892—Details related to signal analysis or treatment; presenting results, e.g. displays; measuring specific signal features other than field strength, e.g. polarisation, field modes, phase, envelope, maximum value
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
    • G03H1/00—Holographic processes or apparatus using light, infrared or ultraviolet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
    • G03H1/04—Processes or apparatus for producing holograms
    • G03H1/0443—Digital holography, i.e. recording holograms with digital recording means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
    • G03H1/00—Holographic processes or apparatus using light, infrared or ultraviolet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
    • G03H1/04—Processes or apparatus for producing holograms
    • G03H1/0443—Digital holography, i.e. recording holograms with digital recording means
    • G03H2001/0463—Frequency heterodyne, i.e. one beam is frequency shifted
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
    • G03H1/00—Holographic processes or apparatus using light, infrared or ultraviolet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
    • G03H1/04—Processes or apparatus for producing holograms
    • G03H1/0465—Particular recording light; Beam shape or geometry
    • G03H2001/0469—Object light being reflected by the object
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
    • G03H1/00—Holographic processes or apparatus using light, infrared or ultraviolet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
    • G03H1/04—Processes or apparatus for producing holograms
    • G03H1/0465—Particular recording light; Beam shape or geometry
    • G03H2001/0471—Object light being transmitted through the object, e.g. illumination through living cells
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
    • G03H2223/00—Optical components
    • G03H2223/12—Amplitude mask, e.g. diaphragm, Louver filter

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Computing Systems (AREA)
  • Theoretical Computer Science (AREA)
  • Electromagnetism (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
FR1650165A 2016-01-08 2016-01-08 Dispositif d'imagerie du champs electromagnetique d'un echantillon Active FR3046683B1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR1650165A FR3046683B1 (fr) 2016-01-08 2016-01-08 Dispositif d'imagerie du champs electromagnetique d'un echantillon
PCT/FR2017/050041 WO2017118828A2 (fr) 2016-01-08 2017-01-06 Dispositif d'imagerie du champs électromagnétique d'un échantillon
JP2018535414A JP7141948B2 (ja) 2016-01-08 2017-01-06 サンプルの電磁場を撮像するための装置
US16/068,639 US10684113B2 (en) 2016-01-08 2017-01-06 SNOM device using heterodyne detection
EP17711703.3A EP3400488A2 (fr) 2016-01-08 2017-01-06 Dispositif d'imagerie du champs électromagnétique d'un échantillon

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1650165 2016-01-08
FR1650165A FR3046683B1 (fr) 2016-01-08 2016-01-08 Dispositif d'imagerie du champs electromagnetique d'un echantillon

Publications (2)

Publication Number Publication Date
FR3046683A1 FR3046683A1 (fr) 2017-07-14
FR3046683B1 true FR3046683B1 (fr) 2018-06-29

Family

ID=56069028

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1650165A Active FR3046683B1 (fr) 2016-01-08 2016-01-08 Dispositif d'imagerie du champs electromagnetique d'un echantillon

Country Status (5)

Country Link
US (1) US10684113B2 (fr)
EP (1) EP3400488A2 (fr)
JP (1) JP7141948B2 (fr)
FR (1) FR3046683B1 (fr)
WO (1) WO2017118828A2 (fr)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3009199B2 (ja) * 1990-09-28 2000-02-14 株式会社日立製作所 光音響信号検出方法及び装置
JPH08262038A (ja) * 1995-03-20 1996-10-11 Nikon Corp 微小開口プローブ及び微小開口プローブの製造方法
JPH11316240A (ja) * 1998-05-01 1999-11-16 Olympus Optical Co Ltd 走査型近接場光学顕微鏡
FR2792082B1 (fr) * 1999-04-06 2003-05-30 Thomson Csf Dispositif d'holographie numerique
JP4117348B2 (ja) * 1999-08-19 2008-07-16 独立行政法人産業技術総合研究所 近接場プローブ及び近接場プローブ作成方法
JP2003009199A (ja) * 2001-06-19 2003-01-10 Toshiba Corp 電話システム、電話端末

Also Published As

Publication number Publication date
JP7141948B2 (ja) 2022-09-26
US10684113B2 (en) 2020-06-16
US20190041185A1 (en) 2019-02-07
JP2019501394A (ja) 2019-01-17
WO2017118828A2 (fr) 2017-07-13
FR3046683A1 (fr) 2017-07-14
WO2017118828A3 (fr) 2017-10-05
EP3400488A2 (fr) 2018-11-14

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