FR2918475B1 - Systeme d'imagerie par rayonnement - Google Patents

Systeme d'imagerie par rayonnement

Info

Publication number
FR2918475B1
FR2918475B1 FR0854455A FR0854455A FR2918475B1 FR 2918475 B1 FR2918475 B1 FR 2918475B1 FR 0854455 A FR0854455 A FR 0854455A FR 0854455 A FR0854455 A FR 0854455A FR 2918475 B1 FR2918475 B1 FR 2918475B1
Authority
FR
France
Prior art keywords
imaging system
radiation imaging
radiation
imaging
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0854455A
Other languages
English (en)
Other versions
FR2918475A1 (fr
Inventor
Kejun Kang
Zhiqiang Chen
Yuanjing Li
Liming Wang
Yinong Liu
Shangmin Sun
Li Zhang
Yaohong Liu
Guang Yang
Qingjun Zhang
Wenguo Liu
Siyuan Liang
Zhenbin Guo
Bin Hu
Yanli Deng
Yucheng Wu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tsinghua University
Nuctech Co Ltd
Original Assignee
Tsinghua University
Nuctech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tsinghua University, Nuctech Co Ltd filed Critical Tsinghua University
Publication of FR2918475A1 publication Critical patent/FR2918475A1/fr
Application granted granted Critical
Publication of FR2918475B1 publication Critical patent/FR2918475B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
FR0854455A 2007-07-02 2008-07-01 Systeme d'imagerie par rayonnement Expired - Fee Related FR2918475B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2007101182007A CN101339147B (zh) 2007-07-02 2007-07-02 辐射成像系统

Publications (2)

Publication Number Publication Date
FR2918475A1 FR2918475A1 (fr) 2009-01-09
FR2918475B1 true FR2918475B1 (fr) 2012-06-08

Family

ID=39707923

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0854455A Expired - Fee Related FR2918475B1 (fr) 2007-07-02 2008-07-01 Systeme d'imagerie par rayonnement

Country Status (8)

Country Link
US (1) US7660387B2 (fr)
JP (1) JP5455332B2 (fr)
CN (1) CN101339147B (fr)
AU (1) AU2008202891B8 (fr)
DE (1) DE102008029470B4 (fr)
FR (1) FR2918475B1 (fr)
GB (1) GB2451548B (fr)
RU (1) RU2399172C2 (fr)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102540928B (zh) * 2011-12-30 2013-09-18 北京华航无线电测量研究所 一种三维成像安检门伺服控制装置伺服控制器的控制方法
US9274065B2 (en) 2012-02-08 2016-03-01 Rapiscan Systems, Inc. High-speed security inspection system
CN103901488A (zh) * 2012-12-27 2014-07-02 同方威视技术股份有限公司 固定式ct装置
CN103528550B (zh) * 2013-10-14 2016-05-18 广西壮族自治区质量技术监督局珍珠产品质量监督检验站 一种珍珠珠层厚度的无损检测方法
CN103528549B (zh) * 2013-10-14 2016-05-18 广西壮族自治区质量技术监督局珍珠产品质量监督检验站 一种珍珠珠层厚度的无损检测方法
CN106526685B (zh) * 2015-09-09 2019-03-19 同方威视技术股份有限公司 一种行李物品的安检方法和系统
CN106054271B (zh) * 2016-07-22 2020-02-07 同方威视技术股份有限公司 安全检查方法和系统
CN106249307B (zh) * 2016-07-22 2018-12-28 同方威视技术股份有限公司 安全检查方法和系统
CN106226338B (zh) * 2016-09-20 2023-04-07 同方威视技术股份有限公司 用于集装箱的射线检查系统和检查方法
CN106331660A (zh) * 2016-11-14 2017-01-11 天津三英精密仪器股份有限公司 一种数字岩心成像系统

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7045787B1 (en) * 1995-10-23 2006-05-16 Science Applications International Corporation Density detection using real time discrete photon counting for fast moving targets
JPH10246708A (ja) * 1997-03-03 1998-09-14 Hitachi Ltd 非破壊検査装置及び方法
JPH10197456A (ja) * 1997-01-08 1998-07-31 Hitachi Ltd 非破壊検査装置
FR2776914B1 (fr) * 1998-04-03 2000-06-23 Thomson Tubes Electroniques Procede d'acquisition de mesures et tomodensitometre a detecteurs groupes
JP2001216152A (ja) * 2000-01-28 2001-08-10 Rooran:Kk 論理集積回路及びそのcpuコアのソースを記録したコンピュータ読み取り可能な記録媒体
US20030128801A1 (en) * 2002-01-07 2003-07-10 Multi-Dimensional Imaging, Inc. Multi-modality apparatus for dynamic anatomical, physiological and molecular imaging
JP4005828B2 (ja) * 2002-03-27 2007-11-14 石川島運搬機械株式会社 X線検査方法
US6895079B2 (en) * 2002-08-20 2005-05-17 General Electric Company Multiple focal spot X-ray inspection system
JP3873912B2 (ja) * 2003-03-07 2007-01-31 株式会社日立製作所 X線センサ信号処理回路及びx線センサ信号処理方法
RU2273844C1 (ru) * 2004-07-07 2006-04-10 Иркутский государственный университет путей сообщения (ИрГУПС) Способ импульсной микродозовой рентгеновской диагностики
JP2007093501A (ja) * 2005-09-30 2007-04-12 Ishikawajima Inspection & Instrumentation Co X線検査装置のデータ採取システム

Also Published As

Publication number Publication date
CN101339147A (zh) 2009-01-07
AU2008202891A1 (en) 2009-01-22
GB2451548B (en) 2010-06-30
DE102008029470A1 (de) 2009-01-15
JP5455332B2 (ja) 2014-03-26
US7660387B2 (en) 2010-02-09
FR2918475A1 (fr) 2009-01-09
CN101339147B (zh) 2012-03-28
US20090010387A1 (en) 2009-01-08
GB0812129D0 (en) 2008-08-06
GB2451548A (en) 2009-02-04
AU2008202891B8 (en) 2010-12-23
DE102008029470B4 (de) 2015-12-10
AU2008202891B2 (en) 2010-08-26
JP2009014724A (ja) 2009-01-22
RU2399172C2 (ru) 2010-09-10
RU2008124347A (ru) 2009-12-27

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