Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Eurotechnique SA
Original Assignee
Eurotechnique SA
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Filing date
Publication date
Application filed by Eurotechnique SAfiledCriticalEurotechnique SA
Priority to FR8408499ApriorityCriticalpatent/FR2565354B3/fr
Publication of FR2565354A1publicationCriticalpatent/FR2565354A1/fr
Application grantedgrantedCritical
Publication of FR2565354B3publicationCriticalpatent/FR2565354B3/fr
H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
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Engineering & Computer Science
(AREA)
Manufacturing & Machinery
(AREA)
Computer Hardware Design
(AREA)
Microelectronics & Electronic Packaging
(AREA)
Power Engineering
(AREA)
Testing Or Measuring Of Semiconductors Or The Like
(AREA)
Tests Of Electronic Circuits
(AREA)
FR8408499A1984-05-301984-05-30Procede et dispositif de test de circuits integres sur tranches
ExpiredFR2565354B3
(fr)
Procede pour tester des supports portant plusieurs circuits integres a fonctionnement numerique, support pourvu de tels circuits, circuit integre propre a etre monte sur un tel support et dispositif de test pour tester de tels supports