FR2506973A1 - ALGORITHMIC WORD GENERATOR - Google Patents

ALGORITHMIC WORD GENERATOR

Info

Publication number
FR2506973A1
FR2506973A1 FR8209831A FR8209831A FR2506973A1 FR 2506973 A1 FR2506973 A1 FR 2506973A1 FR 8209831 A FR8209831 A FR 8209831A FR 8209831 A FR8209831 A FR 8209831A FR 2506973 A1 FR2506973 A1 FR 2506973A1
Authority
FR
France
Prior art keywords
micro
memory
code
vector
words
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
FR8209831A
Other languages
French (fr)
Inventor
Steven Robert Palmquist
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of FR2506973A1 publication Critical patent/FR2506973A1/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/02—Digital function generators
    • G06F1/03—Digital function generators working, at least partly, by table look-up
    • G06F1/035—Reduction of table size

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Complex Calculations (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

SYSTEME ALGORITHMIQUE MICROPROGRAMMABLE DE GENERATION DE MOTS OU GROUPES DE SIGNAUX POUR STIMULER OU SIMULER UN CIRCUIT OU SYSTEME NUMERIQUE. UNE MEMOIRE A MICRO-CODE EMMAGASINE DES INSTRUCTIONS COMPOSEES DE SIGNAUX D'ORDRE ET D'ADRESSE, ET UNE MEMOIRE A VECTEURS 26 EMMAGASINE DES MOTS; UN CIRCUIT DE COMMANDE 24 FOURNIT DES INFORMATIONS RELATIVES AUX ADRESSES, EN PROVENANCE DE LA MEMOIRE A MICRO-CODE, POUR LES MEMOIRES A MICRO-CODE ET A VECTEURS 22, 26, AFIN DE FAIRE ENGENDRER L'INSTRUCTION SUIVANTE PAR LAMEMOIRE A MICRO-CODE 22 ET LE MOT PAR LA MEMOIRE A VECTEURS 26. UN COMPTEUR DE SORTIE 28 RECOIT LE MOT DE LA MEMOIRE A VECTEURS 26 ET AGIT EN TANT QUE REGISTRE OU EN TANT QUE COMPTEUR POUR ENREGISTRER UNE STRUCTURE DE MOTS. APPLICATION NOTAMMENT A LA MISE AU POINT OU AU DEPANNAGE D'UN APPAREIL NUMERIQUE OU SIMILAIRE.MICROPROGRAMMABLE ALGORITHMIC SYSTEM FOR GENERATING WORDS OR SIGNAL GROUPS TO STIMULATE OR SIMULATE A DIGITAL CIRCUIT OR SYSTEM. A MICRO-CODE MEMORY STORES INSTRUCTIONS CONSISTING OF ORDER AND ADDRESS SIGNALS, AND A VECTOR MEMORY 26 STORES WORDS; A CONTROL CIRCUIT 24 PROVIDES INFORMATION RELATING TO THE ADDRESSES, FROM THE MICRO-CODE MEMORY, FOR THE MICRO-CODE AND VECTOR MEMORIES 22, 26, IN ORDER TO GENERATE THE FOLLOWING INSTRUCTION BY THE MICRO-CODE MEMORY 22 AND THE WORD FROM VECTOR MEMORY 26. AN OUTPUT COUNTER 28 RECEIVES THE WORD FROM VECTOR MEMORY 26 AND ACTS AS A REGISTER OR COUNTER TO REGISTER A STRUCTURE OF WORDS. APPLICATION IN PARTICULAR TO THE TUNING OR TROUBLESHOOTING OF A DIGITAL OR SIMILAR DEVICE.

FR8209831A 1981-06-02 1982-06-01 ALGORITHMIC WORD GENERATOR Withdrawn FR2506973A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US26944381A 1981-06-02 1981-06-02

Publications (1)

Publication Number Publication Date
FR2506973A1 true FR2506973A1 (en) 1982-12-03

Family

ID=23027271

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8209831A Withdrawn FR2506973A1 (en) 1981-06-02 1982-06-01 ALGORITHMIC WORD GENERATOR

Country Status (6)

Country Link
JP (1) JPS57204955A (en)
CA (1) CA1189191A (en)
DE (1) DE3217024A1 (en)
FR (1) FR2506973A1 (en)
GB (1) GB2099618B (en)
NL (1) NL8202113A (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2543709B1 (en) * 1983-03-30 1985-08-09 Centre Nat Rech Scient PROGRAMMABLE APPARATUS FOR GENERATING DIGITAL SEQUENCES FOR TESTING DIGITAL CIRCUITS
FR2553540B1 (en) * 1983-10-13 1986-01-03 Centre Nat Rech Scient RANDOM TEST DEVICE FOR LOGIC CIRCUITS, ESPECIALLY MICROPROCESSORS
GB2149159B (en) * 1983-10-28 1987-07-08 Membrain Ltd Method and apparatus for generating sequence of multibit words
US4764925A (en) * 1984-06-14 1988-08-16 Fairchild Camera & Instrument Method and apparatus for testing integrated circuits
DE3515802A1 (en) * 1985-05-02 1986-11-06 Siemens AG, 1000 Berlin und 8000 München ARRANGEMENT FOR FAST GENERATION OF LARGE TESTING DATA WORDS IN A TESTING DEVICE
US5454088A (en) * 1985-11-15 1995-09-26 Mitsubishi Denki Kabushiki Kaisha Microprogram control device for controlling data path section including designation of instruction cycle values
JPS62117038A (en) * 1985-11-15 1987-05-28 Mitsubishi Electric Corp Microprogram controller

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3641331A (en) * 1969-11-12 1972-02-08 Honeywell Inc Apparatus for performing arithmetic operations on numbers using a multiple generating and storage technique
US3720820A (en) * 1971-03-18 1973-03-13 Tektranex Inc Calculator with a hierarchy control system
US4108358A (en) * 1977-03-22 1978-08-22 The Bendix Corporation Portable circuit tester

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
ELECTRONICS, 22 janvier 1976, pages 100-105, New York, US; A.C.L.CHIANG et al.: "Two new approaches simplify testing of microprocessors" *
IEEE 1976 SEMICONDUCTOR TEST SYMPOSIUM, 7th Annual Symposium, 19-21 octobre 1976, Cherry Hill, New Jersey, pages 70-75, IEEE Computer Society and the Philadelphia Section of the IEEE, Long Beach, US; S.PALMQUIST et al.: "Expanding the boundaries of LSI testing with an advanced pattern controller" *
INTERNATIONAL ELECTRONICS, vol. 54, no. 18, 8 septembre 1981, pages 113-119, New York, US; S.PALMQUIST et al.: "Logic analyzer delivers test patterns, too" *
WESCON TECHNICAL PAPERS, vol. 19, 16-19 septembre 1975, 27/2, pages 1-4, Hollywood, US; J.F.CAMPBELL, Jr: "A new real-time function test generation system for complex LSI testing" *

Also Published As

Publication number Publication date
GB2099618A (en) 1982-12-08
GB2099618B (en) 1985-07-03
DE3217024A1 (en) 1982-12-23
CA1189191A (en) 1985-06-18
JPS57204955A (en) 1982-12-15
NL8202113A (en) 1983-01-03

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Legal Events

Date Code Title Description
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