JPS57204955A - Word generator - Google Patents

Word generator

Info

Publication number
JPS57204955A
JPS57204955A JP57092069A JP9206982A JPS57204955A JP S57204955 A JPS57204955 A JP S57204955A JP 57092069 A JP57092069 A JP 57092069A JP 9206982 A JP9206982 A JP 9206982A JP S57204955 A JPS57204955 A JP S57204955A
Authority
JP
Japan
Prior art keywords
word generator
word
generator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57092069A
Other languages
Japanese (ja)
Inventor
Robaato Baamukuisuto Suteiibun
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of JPS57204955A publication Critical patent/JPS57204955A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/02—Digital function generators
    • G06F1/03—Digital function generators working, at least partly, by table look-up
    • G06F1/035—Reduction of table size

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Complex Calculations (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP57092069A 1981-06-02 1982-05-28 Word generator Pending JPS57204955A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US26944381A 1981-06-02 1981-06-02

Publications (1)

Publication Number Publication Date
JPS57204955A true JPS57204955A (en) 1982-12-15

Family

ID=23027271

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57092069A Pending JPS57204955A (en) 1981-06-02 1982-05-28 Word generator

Country Status (6)

Country Link
JP (1) JPS57204955A (en)
CA (1) CA1189191A (en)
DE (1) DE3217024A1 (en)
FR (1) FR2506973A1 (en)
GB (1) GB2099618B (en)
NL (1) NL8202113A (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2543709B1 (en) * 1983-03-30 1985-08-09 Centre Nat Rech Scient PROGRAMMABLE APPARATUS FOR GENERATING DIGITAL SEQUENCES FOR TESTING DIGITAL CIRCUITS
FR2553540B1 (en) * 1983-10-13 1986-01-03 Centre Nat Rech Scient RANDOM TEST DEVICE FOR LOGIC CIRCUITS, ESPECIALLY MICROPROCESSORS
GB2149159B (en) * 1983-10-28 1987-07-08 Membrain Ltd Method and apparatus for generating sequence of multibit words
US4764925A (en) * 1984-06-14 1988-08-16 Fairchild Camera & Instrument Method and apparatus for testing integrated circuits
DE3515802A1 (en) * 1985-05-02 1986-11-06 Siemens AG, 1000 Berlin und 8000 München ARRANGEMENT FOR FAST GENERATION OF LARGE TESTING DATA WORDS IN A TESTING DEVICE
JPS62117038A (en) * 1985-11-15 1987-05-28 Mitsubishi Electric Corp Microprogram controller
US5454088A (en) * 1985-11-15 1995-09-26 Mitsubishi Denki Kabushiki Kaisha Microprogram control device for controlling data path section including designation of instruction cycle values

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3641331A (en) * 1969-11-12 1972-02-08 Honeywell Inc Apparatus for performing arithmetic operations on numbers using a multiple generating and storage technique
US3720820A (en) * 1971-03-18 1973-03-13 Tektranex Inc Calculator with a hierarchy control system
US4108358A (en) * 1977-03-22 1978-08-22 The Bendix Corporation Portable circuit tester

Also Published As

Publication number Publication date
CA1189191A (en) 1985-06-18
GB2099618A (en) 1982-12-08
DE3217024A1 (en) 1982-12-23
GB2099618B (en) 1985-07-03
NL8202113A (en) 1983-01-03
FR2506973A1 (en) 1982-12-03

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