FR2478879A1 - Procede de realisation de dispositifs a effet memoire a semi-conducteurs amorphes - Google Patents
Procede de realisation de dispositifs a effet memoire a semi-conducteurs amorphes Download PDFInfo
- Publication number
- FR2478879A1 FR2478879A1 FR8006480A FR8006480A FR2478879A1 FR 2478879 A1 FR2478879 A1 FR 2478879A1 FR 8006480 A FR8006480 A FR 8006480A FR 8006480 A FR8006480 A FR 8006480A FR 2478879 A1 FR2478879 A1 FR 2478879A1
- Authority
- FR
- France
- Prior art keywords
- layer
- compound
- constituting
- electrodes
- amorphous
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 27
- 238000000034 method Methods 0.000 title claims abstract description 16
- 230000003446 memory effect Effects 0.000 title claims abstract description 9
- 150000001875 compounds Chemical class 0.000 claims abstract description 25
- 239000000758 substrate Substances 0.000 claims abstract description 7
- 229910052751 metal Inorganic materials 0.000 claims abstract description 4
- 239000002184 metal Substances 0.000 claims abstract description 4
- 230000004888 barrier function Effects 0.000 claims description 18
- 239000000203 mixture Substances 0.000 claims description 7
- 229910052715 tantalum Inorganic materials 0.000 claims description 7
- 229910052714 tellurium Inorganic materials 0.000 claims description 7
- PORWMNRCUJJQNO-UHFFFAOYSA-N tellurium atom Chemical compound [Te] PORWMNRCUJJQNO-UHFFFAOYSA-N 0.000 claims description 7
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 claims description 6
- 239000004020 conductor Substances 0.000 claims description 5
- 239000011521 glass Substances 0.000 claims description 5
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 4
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 4
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 claims description 3
- 238000004519 manufacturing process Methods 0.000 claims description 3
- 230000006641 stabilisation Effects 0.000 claims description 3
- 238000011105 stabilization Methods 0.000 claims description 3
- 229910052717 sulfur Inorganic materials 0.000 claims description 3
- 239000011593 sulfur Substances 0.000 claims description 3
- HQZPMWBCDLCGCL-UHFFFAOYSA-N tantalum telluride Chemical compound [Te]=[Ta]=[Te] HQZPMWBCDLCGCL-UHFFFAOYSA-N 0.000 claims description 3
- 229910052785 arsenic Inorganic materials 0.000 claims description 2
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 claims description 2
- 229910052732 germanium Inorganic materials 0.000 claims description 2
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 claims description 2
- 239000000463 material Substances 0.000 abstract description 6
- 230000000694 effects Effects 0.000 description 5
- 238000000151 deposition Methods 0.000 description 4
- 238000009792 diffusion process Methods 0.000 description 4
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 3
- 230000008021 deposition Effects 0.000 description 3
- 229910052750 molybdenum Inorganic materials 0.000 description 3
- 239000011733 molybdenum Substances 0.000 description 3
- 239000011148 porous material Substances 0.000 description 3
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 3
- 229910052721 tungsten Inorganic materials 0.000 description 3
- 239000010937 tungsten Substances 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000003628 erosive effect Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 150000003481 tantalum Chemical class 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/20—Multistable switching devices, e.g. memristors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/801—Constructional details of multistable switching devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/801—Constructional details of multistable switching devices
- H10N70/821—Device geometry
- H10N70/826—Device geometry adapted for essentially vertical current flow, e.g. sandwich or pillar type devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/801—Constructional details of multistable switching devices
- H10N70/841—Electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/801—Constructional details of multistable switching devices
- H10N70/881—Switching materials
- H10N70/882—Compounds of sulfur, selenium or tellurium, e.g. chalcogenides
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/084—Ion implantation of compound devices
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/90—Bulk effect device making
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/93—Ternary or quaternary semiconductor comprised of elements from three different groups, e.g. I-III-V
Landscapes
- Semiconductor Memories (AREA)
- Bipolar Transistors (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR8006480A FR2478879A1 (fr) | 1980-03-24 | 1980-03-24 | Procede de realisation de dispositifs a effet memoire a semi-conducteurs amorphes |
| EP81400378A EP0036802B1 (fr) | 1980-03-24 | 1981-03-11 | Procédé de réalisation de dispositifs à effet mémoire à semi-conducteurs amorphes |
| DE8181400378T DE3165324D1 (en) | 1980-03-24 | 1981-03-11 | Method of manufacturing amorphous semiconductor memory devices |
| US06/244,608 US4366614A (en) | 1980-03-24 | 1981-03-17 | Method for constructing devices with a storage action and having amorphous semiconductors |
| JP4224181A JPS56147493A (en) | 1980-03-24 | 1981-03-23 | Method of manufacturing amorphous semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR8006480A FR2478879A1 (fr) | 1980-03-24 | 1980-03-24 | Procede de realisation de dispositifs a effet memoire a semi-conducteurs amorphes |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2478879A1 true FR2478879A1 (fr) | 1981-09-25 |
| FR2478879B1 FR2478879B1 (enExample) | 1983-10-14 |
Family
ID=9240006
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR8006480A Granted FR2478879A1 (fr) | 1980-03-24 | 1980-03-24 | Procede de realisation de dispositifs a effet memoire a semi-conducteurs amorphes |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US4366614A (enExample) |
| EP (1) | EP0036802B1 (enExample) |
| JP (1) | JPS56147493A (enExample) |
| DE (1) | DE3165324D1 (enExample) |
| FR (1) | FR2478879A1 (enExample) |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4433342A (en) * | 1981-04-06 | 1984-02-21 | Harris Corporation | Amorphous switching device with residual crystallization retardation |
| FR2533072B1 (fr) * | 1982-09-14 | 1986-07-18 | Coissard Pierre | Procede de fabrication de circuits electroniques a base de transistors en couches minces et de condensateurs |
| US4677742A (en) * | 1983-01-18 | 1987-07-07 | Energy Conversion Devices, Inc. | Electronic matrix arrays and method for making the same |
| US4545111A (en) * | 1983-01-18 | 1985-10-08 | Energy Conversion Devices, Inc. | Method for making, parallel preprogramming or field programming of electronic matrix arrays |
| US4847732A (en) * | 1983-09-15 | 1989-07-11 | Mosaic Systems, Inc. | Wafer and method of making same |
| DE3586450T2 (de) * | 1984-02-21 | 1993-03-18 | Environmental Res Inst | Kapazitive vorrichtung. |
| US4845533A (en) * | 1986-08-22 | 1989-07-04 | Energy Conversion Devices, Inc. | Thin film electrical devices with amorphous carbon electrodes and method of making same |
| KR910019241A (ko) * | 1990-04-30 | 1991-11-30 | 리챠드 데이빗 라우만 | 안티퓨즈를 갖는 집적회로 |
| AUPO613797A0 (en) * | 1997-04-09 | 1997-05-08 | University Of Sydney, The | Digital information storage |
| DE10023116B4 (de) * | 2000-05-11 | 2005-12-15 | Infineon Technologies Ag | Feldeffekttransistor-Struktur mit isoliertem Gate |
| US7381611B2 (en) * | 2003-08-04 | 2008-06-03 | Intel Corporation | Multilayered phase change memory |
| US7482616B2 (en) * | 2004-05-27 | 2009-01-27 | Samsung Electronics Co., Ltd. | Semiconductor devices having phase change memory cells, electronic systems employing the same and methods of fabricating the same |
| DE102005025209B4 (de) * | 2004-05-27 | 2011-01-13 | Samsung Electronics Co., Ltd., Suwon | Halbleiterspeicherbauelement, elektronisches System und Verfahren zur Herstellung eines Halbleiterspeicherbauelements |
| US7411208B2 (en) * | 2004-05-27 | 2008-08-12 | Samsung Electronics Co., Ltd. | Phase-change memory device having a barrier layer and manufacturing method |
| US20050263801A1 (en) * | 2004-05-27 | 2005-12-01 | Jae-Hyun Park | Phase-change memory device having a barrier layer and manufacturing method |
| US7835170B2 (en) | 2005-05-09 | 2010-11-16 | Nantero, Inc. | Memory elements and cross point switches and arrays of same using nonvolatile nanotube blocks |
| WO2008021900A2 (en) * | 2006-08-08 | 2008-02-21 | Nantero, Inc. | Nonvolatile nanotube diodes and nonvolatile nanotube blocks and systems using same and methods of making same |
| WO2009115995A1 (en) * | 2008-03-21 | 2009-09-24 | Nxp B.V. | An electronic component comprising a convertible structure |
| US9263126B1 (en) | 2010-09-01 | 2016-02-16 | Nantero Inc. | Method for dynamically accessing and programming resistive change element arrays |
| US8377741B2 (en) * | 2008-12-30 | 2013-02-19 | Stmicroelectronics S.R.L. | Self-heating phase change memory cell architecture |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2389239A2 (fr) * | 1977-04-27 | 1978-11-24 | Commissariat Energie Atomique | Procede de realisation de dispositifs semiconducteurs amorphes et dispositifs en faisant application |
| FR2407572A1 (fr) * | 1977-10-31 | 1979-05-25 | Burroughs Corp | Composant de memoire, amorphe, pour memoire morte |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3675090A (en) * | 1968-11-04 | 1972-07-04 | Energy Conversion Devices Inc | Film deposited semiconductor devices |
| US3619732A (en) * | 1969-05-16 | 1971-11-09 | Energy Conversion Devices Inc | Coplanar semiconductor switch structure |
| US3611063A (en) * | 1969-05-16 | 1971-10-05 | Energy Conversion Devices Inc | Amorphous electrode or electrode surface |
| US3886577A (en) * | 1973-09-12 | 1975-05-27 | Energy Conversion Devices Inc | Filament-type memory semiconductor device and method of making the same |
| US4167806A (en) * | 1976-09-28 | 1979-09-18 | Commissariat A L'energie Atomique | Method of fabrication of an amorphous semiconductor device on a substrate |
-
1980
- 1980-03-24 FR FR8006480A patent/FR2478879A1/fr active Granted
-
1981
- 1981-03-11 EP EP81400378A patent/EP0036802B1/fr not_active Expired
- 1981-03-11 DE DE8181400378T patent/DE3165324D1/de not_active Expired
- 1981-03-17 US US06/244,608 patent/US4366614A/en not_active Expired - Fee Related
- 1981-03-23 JP JP4224181A patent/JPS56147493A/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2389239A2 (fr) * | 1977-04-27 | 1978-11-24 | Commissariat Energie Atomique | Procede de realisation de dispositifs semiconducteurs amorphes et dispositifs en faisant application |
| FR2407572A1 (fr) * | 1977-10-31 | 1979-05-25 | Burroughs Corp | Composant de memoire, amorphe, pour memoire morte |
Also Published As
| Publication number | Publication date |
|---|---|
| US4366614A (en) | 1983-01-04 |
| JPS56147493A (en) | 1981-11-16 |
| EP0036802A1 (fr) | 1981-09-30 |
| DE3165324D1 (en) | 1984-09-13 |
| FR2478879B1 (enExample) | 1983-10-14 |
| EP0036802B1 (fr) | 1984-08-08 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ST | Notification of lapse |