FR2468100B1 - - Google Patents

Info

Publication number
FR2468100B1
FR2468100B1 FR8021700A FR8021700A FR2468100B1 FR 2468100 B1 FR2468100 B1 FR 2468100B1 FR 8021700 A FR8021700 A FR 8021700A FR 8021700 A FR8021700 A FR 8021700A FR 2468100 B1 FR2468100 B1 FR 2468100B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8021700A
Other languages
French (fr)
Other versions
FR2468100A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jenoptik AG
Original Assignee
VEB Carl Zeiss Jena GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by VEB Carl Zeiss Jena GmbH filed Critical VEB Carl Zeiss Jena GmbH
Publication of FR2468100A1 publication Critical patent/FR2468100A1/fr
Application granted granted Critical
Publication of FR2468100B1 publication Critical patent/FR2468100B1/fr
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/68Preparation processes not covered by groups G03F1/20 - G03F1/50
    • G03F1/82Auxiliary processes, e.g. cleaning or inspecting
    • G03F1/84Inspecting
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR8021700A 1979-10-16 1980-10-10 Dispositif pour le controle automatique de photo-masques Granted FR2468100A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DD21623879A DD146500A1 (de) 1979-10-16 1979-10-16 Anordnung zur automatischen pruefung von photomasken

Publications (2)

Publication Number Publication Date
FR2468100A1 FR2468100A1 (fr) 1981-04-30
FR2468100B1 true FR2468100B1 (enExample) 1984-02-24

Family

ID=5520612

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8021700A Granted FR2468100A1 (fr) 1979-10-16 1980-10-10 Dispositif pour le controle automatique de photo-masques

Country Status (6)

Country Link
JP (1) JPS56142533A (enExample)
DD (1) DD146500A1 (enExample)
DE (1) DE3037467A1 (enExample)
FR (1) FR2468100A1 (enExample)
GB (1) GB2060876B (enExample)
SU (1) SU1142733A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3274015D1 (en) * 1981-07-14 1986-12-04 Hitachi Ltd Pattern detection system
JPS58204346A (ja) * 1982-05-24 1983-11-29 Nippon Jido Seigyo Kk パタ−ンの欠陥検査装置
JP3069417B2 (ja) * 1991-11-21 2000-07-24 シャープ株式会社 位相シフトマスクの検査方法
WO2005026706A1 (en) * 2003-09-04 2005-03-24 Applied Materials Israel, Ltd. Method for high efficiency multipass article inspection

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5265671A (en) * 1975-11-26 1977-05-31 Nippon Jidoseigyo Ltd Apparatus for testing defects in pattern
JPS5419664A (en) * 1977-07-15 1979-02-14 Nippon Jidoseigyo Ltd Device for inspecting fault of pattern

Also Published As

Publication number Publication date
GB2060876A (en) 1981-05-07
FR2468100A1 (fr) 1981-04-30
DE3037467A1 (de) 1981-04-30
DD146500A1 (de) 1981-02-11
SU1142733A1 (ru) 1985-02-28
JPS56142533A (en) 1981-11-06
GB2060876B (en) 1983-12-21

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Legal Events

Date Code Title Description
ST Notification of lapse