FR2451038A1 - Appareil de test destine a tester des plaques de circuits imprimes - Google Patents
Appareil de test destine a tester des plaques de circuits imprimesInfo
- Publication number
- FR2451038A1 FR2451038A1 FR7909552A FR7909552A FR2451038A1 FR 2451038 A1 FR2451038 A1 FR 2451038A1 FR 7909552 A FR7909552 A FR 7909552A FR 7909552 A FR7909552 A FR 7909552A FR 2451038 A1 FR2451038 A1 FR 2451038A1
- Authority
- FR
- France
- Prior art keywords
- terminal
- printed circuit
- test apparatus
- detection
- circuit plates
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31924—Voltage or current aspects, e.g. driver, receiver
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
UN APPAREIL DE TEST PORTATIF DESTINE A TESTER DES PLAQUES DE CIRCUITS IMPRIMES 18 COMPREND DES CIRCUITS DE COMMANDEDETECTION COMPRENANT CHACUN UNE BORNE PROGRAMMABLE 100 CONNECTABLE, PAR L'INTERMEDIAIRE D'UN COMMUTATEUR 26C, A UNE BORNE CORRESPONDANTE DE LA PLAQUE EN COURS DE TEST. EN FONCTION DE SIGNAUX DE COMMANDE, LA BORNE PROGRAMMABLE 100 PEUT SERVIR DE BORNE DE COMMANDE OU DE BORNE DE DETECTION. LORSQU'ELLE FONCTIONNE COMME BORNE DE DETECTION, LE SIGNAL DETECTE EST APPLIQUE, PAR L'INTERMEDIAIRE D'UN COMPARATEUR 106, POUR ETRE STOCKE DANS UN CIRCUIT A BASCULES 74. PENDANT CETTE OPERATION DE DETECTION, DES SIGNAUX DE COMMANDE PEUVENT RENDRE SELECTIVEMENT OPERATOIRE UNE PAIRE DE SOURCES DE COURANT 119, 121 QUI FOURNISSENT UN COURANT ELEVATEUR ET UN COURANT ABAISSEUR, CE QUI EVITE D'AVOIR A CONNECTER DES RESISTANCES TERMINALES D'ELEVATION ET D'ABAISSEMENT LORSQU'ON TESTE UN CIRCUIT TELS QUE LES CIRCUITS A COLLECTEUR OUVERT EXIGEANT DE TELLES RESISTANCES TERMINALES.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US05/895,899 US4168796A (en) | 1978-04-13 | 1978-04-13 | Tester with driver/sensor circuit having programmable termination devices |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2451038A1 true FR2451038A1 (fr) | 1980-10-03 |
FR2451038B1 FR2451038B1 (fr) | 1983-09-16 |
Family
ID=25405253
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7909552A Granted FR2451038A1 (fr) | 1978-04-13 | 1979-04-13 | Appareil de test destine a tester des plaques de circuits imprimes |
Country Status (5)
Country | Link |
---|---|
US (1) | US4168796A (fr) |
JP (1) | JPS54138352A (fr) |
DE (1) | DE2914106C2 (fr) |
FR (1) | FR2451038A1 (fr) |
GB (1) | GB2019011B (fr) |
Families Citing this family (52)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USRE31828E (en) * | 1978-05-05 | 1985-02-05 | Zehntel, Inc. | In-circuit digital tester |
US4300207A (en) * | 1979-09-25 | 1981-11-10 | Grumman Aerospace Corporation | Multiple matrix switching system |
GB2086103B (en) * | 1980-10-27 | 1985-01-30 | Hal Computers Ltd | Computer peripheral test equipment |
DE3116079A1 (de) * | 1981-04-23 | 1982-11-11 | Robert Bosch Gmbh, 7000 Stuttgart | Pruefsystem |
US4417336A (en) * | 1981-06-18 | 1983-11-22 | The Bendix Corporation | Method of testing with computers |
US4517661A (en) * | 1981-07-16 | 1985-05-14 | International Business Machines Corporation | Programmable chip tester having plural pin unit buffers which each store sufficient test data for independent operations by each pin unit |
US4489414A (en) * | 1981-10-28 | 1984-12-18 | Hal Computers Limited | Computer peripheral testing equipment |
JPS58158566A (ja) * | 1982-03-17 | 1983-09-20 | Hitachi Ltd | 検査装置 |
US4561093A (en) * | 1983-02-22 | 1985-12-24 | Otis Elevator Company | Servicing a software-controlled elevator |
US4630224A (en) * | 1984-04-19 | 1986-12-16 | The United States Of America As Represented By The Secretary Of The Navy | Automation initialization of reconfigurable on-line automatic test system |
US4641254A (en) * | 1984-06-14 | 1987-02-03 | The United States Of America As Represented By The Secretary Of The Navy | Test set for a navigational satellite receiver |
JPS61292755A (ja) * | 1985-06-20 | 1986-12-23 | Fujitsu Ltd | 半導体集積回路 |
JPS622552A (ja) * | 1985-06-27 | 1987-01-08 | Matsushita Electric Ind Co Ltd | 半導体検査装置および半導体検査方法 |
US4771428A (en) * | 1986-04-10 | 1988-09-13 | Cadic Inc. | Circuit testing system |
US4791356A (en) * | 1986-09-19 | 1988-12-13 | Zehntel Incorporation | In-circuit testing system |
US4837764A (en) * | 1987-03-26 | 1989-06-06 | Bunker Ramo Corporation | Programmable apparatus and method for testing computer peripherals |
JPH0227333A (ja) * | 1988-07-15 | 1990-01-30 | Konica Corp | 合成樹脂製の写真フィルム用マガジン |
US5353243A (en) * | 1989-05-31 | 1994-10-04 | Synopsys Inc. | Hardware modeling system and method of use |
US5369593A (en) * | 1989-05-31 | 1994-11-29 | Synopsys Inc. | System for and method of connecting a hardware modeling element to a hardware modeling system |
US5032789A (en) * | 1989-06-19 | 1991-07-16 | Hewlett-Packard Company | Modular/concurrent board tester |
US5287045A (en) * | 1990-02-20 | 1994-02-15 | Kabushiki Kaisha Toshiba | Fully digital apparatus for controlling operation of electric motor |
GB2251081B (en) * | 1990-12-18 | 1995-08-23 | Motorola Ltd | Automatic analysis apparatus |
US5235273A (en) * | 1991-07-12 | 1993-08-10 | Schlumberger Technologies, Inc. | Apparatus for setting pin driver/sensor reference voltage level |
US5414712A (en) * | 1991-07-23 | 1995-05-09 | Progressive Computing, Inc. | Method for transmitting data using a communication interface box |
DE69229389T2 (de) * | 1992-02-25 | 1999-10-07 | Hewlett-Packard Co., Palo Alto | Testsystem für Schaltkreise |
US5455517A (en) * | 1992-06-09 | 1995-10-03 | International Business Machines Corporation | Data output impedance control |
US5559964A (en) * | 1992-12-15 | 1996-09-24 | Rolm Company | Cable connector keying |
US9063191B2 (en) | 2012-02-24 | 2015-06-23 | Power Probe, Inc. | Electrical test device and method |
US7184899B2 (en) * | 2005-01-05 | 2007-02-27 | Power Probe, Inc | Energizable electrical test device for measuring current and resistance of an electrical circuit |
US5561773A (en) * | 1993-04-30 | 1996-10-01 | Unisys Corporation | Programmable, multi-purpose virtual pin multiplier |
US5581463A (en) * | 1993-10-07 | 1996-12-03 | Hewlett-Packard Co | Pay-per-use access to multiple electronic test capabilities and tester resources |
US5412575A (en) * | 1993-10-07 | 1995-05-02 | Hewlett-Packard Company | Pay-per-use access to multiple electronic test capabilities |
US5453705A (en) * | 1993-12-21 | 1995-09-26 | International Business Machines Corporation | Reduced power VLSI chip and driver circuit |
US5673295A (en) * | 1995-04-13 | 1997-09-30 | Synopsis, Incorporated | Method and apparatus for generating and synchronizing a plurality of digital signals |
US6500070B1 (en) | 1999-05-28 | 2002-12-31 | Nintendo Co., Ltd. | Combined game system of portable and video game machines |
US6371854B1 (en) | 1999-08-20 | 2002-04-16 | Ninetendo Co., Ltd. | Combined game system |
JP4691268B2 (ja) | 2001-05-02 | 2011-06-01 | 任天堂株式会社 | ゲームシステムおよびゲームプログラム |
US6851612B2 (en) | 2001-07-20 | 2005-02-08 | Siemens Building Technologies, Inc. | Portable diagnostic device |
JP2005033559A (ja) * | 2003-07-14 | 2005-02-03 | Fuji Xerox Co Ltd | 故障診断装置 |
US7360130B2 (en) * | 2004-05-24 | 2008-04-15 | Jed Margolin | Memory with integrated programmable controller |
US7259665B2 (en) * | 2004-10-27 | 2007-08-21 | International Business Machines Corporation | Battery backed service indicator aids for field maintenance |
DE602005002131T2 (de) * | 2005-05-20 | 2008-05-15 | Verigy (Singapore) Pte. Ltd. | Prüfvorrichtung mit Anpassung des Prüfparameters |
US8041529B2 (en) * | 2007-02-09 | 2011-10-18 | Robert Bosch Gmbh | Changing parameters in a tested system using virtual working pages |
US7739070B2 (en) * | 2007-08-28 | 2010-06-15 | Agilent Technologies, Inc. | Standardized interfaces for proprietary instruments |
US7525319B1 (en) | 2008-08-28 | 2009-04-28 | International Business Machines Corporation | Method and apparatus to electrically qualify high speed PCB connectors |
US8464143B2 (en) * | 2009-01-12 | 2013-06-11 | Board Of Regents Of The Nevada System Of Higher Education | Error detection method |
US8639474B2 (en) * | 2010-08-31 | 2014-01-28 | Toshiba International Corporation | Microcontroller-based diagnostic module |
JP5533935B2 (ja) * | 2012-05-10 | 2014-06-25 | トヨタ自動車株式会社 | ソフトウェア配信システム、ソフトウェア配信方法 |
EP3433685B1 (fr) * | 2016-03-21 | 2023-11-15 | Mobile Electronics Inc. | Procédé et système pour un module de tension programmable universel |
CN106771983A (zh) * | 2017-01-24 | 2017-05-31 | 安徽锐能科技有限公司 | 电池管理系统pcb测试装置 |
US11860189B2 (en) | 2019-12-12 | 2024-01-02 | Innova Electronics Corporation | Rotational electrical probe |
CN113514759B (zh) * | 2021-09-07 | 2021-12-17 | 南京宏泰半导体科技有限公司 | 一种多核测试处理器及集成电路测试系统与方法 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3849726A (en) * | 1974-01-28 | 1974-11-19 | Sperry Rand Corp | Universal programmable digital testing interface line |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3492572A (en) * | 1966-10-10 | 1970-01-27 | Ibm | Programmable electronic circuit testing apparatus having plural multifunction test condition generating circuits |
US3739349A (en) * | 1971-05-24 | 1973-06-12 | Sperry Rand Corp | Digital equipment interface unit |
US4000460A (en) * | 1974-07-01 | 1976-12-28 | Xerox Corporation | Digital circuit module test system |
US3924109A (en) * | 1974-07-22 | 1975-12-02 | Technology Marketing Inc | Automatic circuit card testing system |
US3976864A (en) * | 1974-09-03 | 1976-08-24 | Hewlett-Packard Company | Apparatus and method for testing digital circuits |
US3922537A (en) * | 1974-09-26 | 1975-11-25 | Instrumentation Engineering | Multiplex device for automatic test equipment |
US3976940A (en) * | 1975-02-25 | 1976-08-24 | Fairchild Camera And Instrument Corporation | Testing circuit |
US4012625A (en) * | 1975-09-05 | 1977-03-15 | Honeywell Information Systems, Inc. | Non-logic printed wiring board test system |
-
1978
- 1978-04-13 US US05/895,899 patent/US4168796A/en not_active Expired - Lifetime
-
1979
- 1979-04-07 DE DE2914106A patent/DE2914106C2/de not_active Expired
- 1979-04-09 GB GB7912401A patent/GB2019011B/en not_active Expired
- 1979-04-12 JP JP4371679A patent/JPS54138352A/ja active Granted
- 1979-04-13 FR FR7909552A patent/FR2451038A1/fr active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3849726A (en) * | 1974-01-28 | 1974-11-19 | Sperry Rand Corp | Universal programmable digital testing interface line |
Also Published As
Publication number | Publication date |
---|---|
GB2019011A (en) | 1979-10-24 |
GB2019011B (en) | 1982-06-23 |
JPS54138352A (en) | 1979-10-26 |
DE2914106A1 (de) | 1979-11-15 |
DE2914106C2 (de) | 1985-03-21 |
US4168796A (en) | 1979-09-25 |
JPS6311634B2 (fr) | 1988-03-15 |
FR2451038B1 (fr) | 1983-09-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
TP | Transmission of property | ||
ST | Notification of lapse |