FR2426963A1 - FAULT DETECTION DEVICE FOR DYNAMIC MEMORY - Google Patents
FAULT DETECTION DEVICE FOR DYNAMIC MEMORYInfo
- Publication number
- FR2426963A1 FR2426963A1 FR7912891A FR7912891A FR2426963A1 FR 2426963 A1 FR2426963 A1 FR 2426963A1 FR 7912891 A FR7912891 A FR 7912891A FR 7912891 A FR7912891 A FR 7912891A FR 2426963 A1 FR2426963 A1 FR 2426963A1
- Authority
- FR
- France
- Prior art keywords
- dynamic memory
- detection device
- fault detection
- error check
- read
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1048—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using arrangements adapted for a specific error detection or correction feature
- G06F11/106—Correcting systematically all correctable errors, i.e. scrubbing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/38—Response verification devices
- G11C29/42—Response verification devices using error correcting codes [ECC] or parity check
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/44—Indication or identification of errors, e.g. for repair
Abstract
L'invention concerne les mémoires dynamiques. Un système de mémoire dynamique comporte notamment un circuit de lecture qui, au cours de chaque opération de régénération, lit un mot appartenant au groupe de mots régénérés; et un circuit de contrôle d'erreur 225 déterminant si la partie d'information du mot lu correspond à la partie de contrôle d'erreur associée. Le circuit de contrôle engendre un signal de défaut lorsque la correspondance contrôlée n'existe pas. Applications aux ordinateurs.The invention relates to dynamic memories. A dynamic memory system comprises in particular a read circuit which, during each regeneration operation, reads a word belonging to the group of regenerated words; and an error check circuit 225 determining whether the information part of the read word matches the associated error check part. The control circuit generates a fault signal when the checked match does not exist. Applications to computers.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US05/909,367 US4183096A (en) | 1978-05-25 | 1978-05-25 | Self checking dynamic memory system |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2426963A1 true FR2426963A1 (en) | 1979-12-21 |
FR2426963B1 FR2426963B1 (en) | 1985-03-08 |
Family
ID=25427121
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7912891A Granted FR2426963A1 (en) | 1978-05-25 | 1979-05-21 | FAULT DETECTION DEVICE FOR DYNAMIC MEMORY |
Country Status (12)
Country | Link |
---|---|
US (1) | US4183096A (en) |
JP (1) | JPS54154228A (en) |
AU (1) | AU531591B2 (en) |
BE (1) | BE876484A (en) |
CA (1) | CA1107862A (en) |
DE (1) | DE2921243A1 (en) |
ES (1) | ES480935A1 (en) |
FR (1) | FR2426963A1 (en) |
GB (1) | GB2021826B (en) |
IT (1) | IT1114048B (en) |
NL (1) | NL7904100A (en) |
SE (1) | SE438747B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0019150A1 (en) * | 1979-05-15 | 1980-11-26 | Mostek Corporation | Method of testing the operation of an internal refresh counter in a random access memory and circuit for the testing thereof |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4506362A (en) * | 1978-12-22 | 1985-03-19 | Gould Inc. | Systematic memory error detection and correction apparatus and method |
US4360917A (en) * | 1979-02-07 | 1982-11-23 | The Warner & Swasey Company | Parity fault locating means |
US4241425A (en) * | 1979-02-09 | 1980-12-23 | Bell Telephone Laboratories, Incorporated | Organization for dynamic random access memory |
US4319356A (en) * | 1979-12-19 | 1982-03-09 | Ncr Corporation | Self-correcting memory system |
EP0031706B1 (en) * | 1979-12-27 | 1984-11-07 | Fujitsu Limited | Apparatus and method for testing semiconductor memory devices |
US4380812A (en) * | 1980-04-25 | 1983-04-19 | Data General Corporation | Refresh and error detection and correction technique for a data processing system |
WO1981003567A1 (en) * | 1980-06-02 | 1981-12-10 | Mostek Corp | Semiconductor memory for use in conjunction with error detection and correction circuit |
US4412314A (en) * | 1980-06-02 | 1983-10-25 | Mostek Corporation | Semiconductor memory for use in conjunction with error detection and correction circuit |
US4369510A (en) * | 1980-07-25 | 1983-01-18 | Honeywell Information Systems Inc. | Soft error rewrite control system |
US4359771A (en) * | 1980-07-25 | 1982-11-16 | Honeywell Information Systems Inc. | Method and apparatus for testing and verifying the operation of error control apparatus within a memory |
WO1982000917A1 (en) * | 1980-09-08 | 1982-03-18 | Proebsting R | Tape burn-in circuit |
US4380805A (en) * | 1980-09-08 | 1983-04-19 | Mostek Corporation | Tape burn-in circuit |
EP0082198A1 (en) * | 1981-06-26 | 1983-06-29 | Ncr Corporation | High speed memory error checker |
US4542454A (en) * | 1983-03-30 | 1985-09-17 | Advanced Micro Devices, Inc. | Apparatus for controlling access to a memory |
US4612640A (en) * | 1984-02-21 | 1986-09-16 | Seeq Technology, Inc. | Error checking and correction circuitry for use with an electrically-programmable and electrically-erasable memory array |
JPH0620303B2 (en) * | 1984-11-08 | 1994-03-16 | 日本電信電話株式会社 | Refresh processing method in interframe coding method |
CA1240066A (en) * | 1985-08-15 | 1988-08-02 | John R. Ramsay | Dynamic memory refresh and parity checking circuit |
JPH087995B2 (en) * | 1985-08-16 | 1996-01-29 | 富士通株式会社 | Method and apparatus for refreshing dynamic semiconductor memory device |
US4691303A (en) * | 1985-10-31 | 1987-09-01 | Sperry Corporation | Refresh system for multi-bank semiconductor memory |
US4783782A (en) * | 1985-12-12 | 1988-11-08 | Alcatel U.S.A. Corporation | Manufacturing test data storage apparatus for dynamically reconfigurable cellular array processor chip |
US4733393A (en) * | 1985-12-12 | 1988-03-22 | Itt Corporation | Test method and apparatus for cellular array processor chip |
US6760881B2 (en) | 2001-10-16 | 2004-07-06 | International Business Machines Corporation | Method for combining refresh operation with parity validation in a DRAM-based content addressable memory (CAM) |
FR2851862B1 (en) * | 2003-02-27 | 2006-12-29 | Radiotelephone Sfr | METHOD FOR GENERATING A PSEUDO-RANDOM PERMUTATION OF A WORD COMPRISING N DIGITS |
US7752427B2 (en) * | 2005-12-09 | 2010-07-06 | Atmel Corporation | Stack underflow debug with sticky base |
US20080080284A1 (en) * | 2006-09-15 | 2008-04-03 | Peter Mayer | Method and apparatus for refreshing memory cells of a memory |
US8621324B2 (en) * | 2010-12-10 | 2013-12-31 | Qualcomm Incorporated | Embedded DRAM having low power self-correction capability |
US9583219B2 (en) | 2014-09-27 | 2017-02-28 | Qualcomm Incorporated | Method and apparatus for in-system repair of memory in burst refresh |
JP7016332B2 (en) * | 2019-07-05 | 2022-02-04 | 華邦電子股▲ふん▼有限公司 | Semiconductor memory device |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3944800A (en) * | 1975-08-04 | 1976-03-16 | Bell Telephone Laboratories, Incorporated | Memory diagnostic arrangement |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1197418A (en) * | 1969-02-05 | 1970-07-01 | Ibm | Data Storage Apparatus |
US3801964A (en) * | 1972-02-24 | 1974-04-02 | Advanced Memory Sys Inc | Semiconductor memory with address decoding |
US3814922A (en) * | 1972-12-01 | 1974-06-04 | Honeywell Inf Systems | Availability and diagnostic apparatus for memory modules |
-
1978
- 1978-05-25 US US05/909,367 patent/US4183096A/en not_active Expired - Lifetime
-
1979
- 1979-05-10 CA CA327,324A patent/CA1107862A/en not_active Expired
- 1979-05-17 SE SE7904350A patent/SE438747B/en not_active IP Right Cessation
- 1979-05-21 AU AU47245/79A patent/AU531591B2/en not_active Ceased
- 1979-05-21 FR FR7912891A patent/FR2426963A1/en active Granted
- 1979-05-22 GB GB7917743A patent/GB2021826B/en not_active Expired
- 1979-05-23 BE BE0/195338A patent/BE876484A/en unknown
- 1979-05-23 NL NL7904100A patent/NL7904100A/en not_active Application Discontinuation
- 1979-05-24 IT IT22960/79A patent/IT1114048B/en active
- 1979-05-25 JP JP6409579A patent/JPS54154228A/en active Pending
- 1979-05-25 ES ES480935A patent/ES480935A1/en not_active Expired
- 1979-05-25 DE DE19792921243 patent/DE2921243A1/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3944800A (en) * | 1975-08-04 | 1976-03-16 | Bell Telephone Laboratories, Incorporated | Memory diagnostic arrangement |
Non-Patent Citations (1)
Title |
---|
EXBK/75 * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0019150A1 (en) * | 1979-05-15 | 1980-11-26 | Mostek Corporation | Method of testing the operation of an internal refresh counter in a random access memory and circuit for the testing thereof |
Also Published As
Publication number | Publication date |
---|---|
AU4724579A (en) | 1979-11-29 |
US4183096A (en) | 1980-01-08 |
AU531591B2 (en) | 1983-09-01 |
CA1107862A (en) | 1981-08-25 |
BE876484A (en) | 1979-09-17 |
JPS54154228A (en) | 1979-12-05 |
ES480935A1 (en) | 1980-01-16 |
DE2921243A1 (en) | 1979-11-29 |
SE7904350L (en) | 1979-11-26 |
IT1114048B (en) | 1986-01-27 |
GB2021826A (en) | 1979-12-05 |
SE438747B (en) | 1985-04-29 |
DE2921243C2 (en) | 1987-06-25 |
GB2021826B (en) | 1982-09-22 |
IT7922960A0 (en) | 1979-05-24 |
NL7904100A (en) | 1979-11-27 |
FR2426963B1 (en) | 1985-03-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |