FR2417779A1 - Dispositif d'analyse de plaques de cablage electriques destine a identifier un circuit integre defectueux - Google Patents
Dispositif d'analyse de plaques de cablage electriques destine a identifier un circuit integre defectueuxInfo
- Publication number
- FR2417779A1 FR2417779A1 FR7904446A FR7904446A FR2417779A1 FR 2417779 A1 FR2417779 A1 FR 2417779A1 FR 7904446 A FR7904446 A FR 7904446A FR 7904446 A FR7904446 A FR 7904446A FR 2417779 A1 FR2417779 A1 FR 2417779A1
- Authority
- FR
- France
- Prior art keywords
- wiring
- integrated circuit
- identify
- wiring plate
- analysis device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/316—Testing of analog circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
L'invention concerne une sonde et un circuit électrique permettant d'identifier des circuits intégrés montés sur des plaques de câblage et défectueux. La sonde comprend au moins deux pointes de contact suffisamment rapprochées l'une de l'autre pour établir un contact simultané avec un conducteur d'un élement de circuit intégré monté sur la plaque de câblage, mais suffisamment espacées l'une de l'autre pour permettre de mesurer l'activité électrique dans ledit segment de câblage entre les pointes. Des moyens de mesure sont prévus pour mesurer la baisse de tension entre les pointes résultant du passage du courant d'essai dans la résistance du segment conducteur. Application à la détection d'éléments défectueux dans des plaques de câblage comprenant des circuits intégrés.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US05/879,881 US4179652A (en) | 1978-02-21 | 1978-02-21 | Analyzing electrical circuit boards |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2417779A1 true FR2417779A1 (fr) | 1979-09-14 |
FR2417779B1 FR2417779B1 (fr) | 1985-08-16 |
Family
ID=25375076
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7904446A Expired FR2417779B1 (fr) | 1978-02-21 | 1979-02-21 | Dispositif d'analyse de plaques de cablage electriques destine a identifier un circuit integre defectueux |
Country Status (6)
Country | Link |
---|---|
US (1) | US4179652A (fr) |
JP (1) | JPS54129885A (fr) |
CA (1) | CA1144236A (fr) |
DE (1) | DE2906736C2 (fr) |
FR (1) | FR2417779B1 (fr) |
GB (1) | GB2015172B (fr) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4713607A (en) * | 1985-12-23 | 1987-12-15 | Tektronix, Inc. | Current sensing circuit |
US4857831A (en) * | 1986-12-29 | 1989-08-15 | Schlumberger Technology Corporation | Borehole casing diagnostic apparatus and method |
US4876430A (en) * | 1988-07-25 | 1989-10-24 | General Electric Company | Preweld test method |
EP0382868B1 (fr) * | 1989-02-16 | 1993-01-27 | MANIA GmbH & Co. | Circuit de mesure de résistance d'échantillons |
US5126680A (en) * | 1990-08-23 | 1992-06-30 | Hydro-Quebec | Probe for use in non-destructive measuring of electrical resistance of a high current electrical connection |
US5264797A (en) * | 1991-05-15 | 1993-11-23 | United Technologies Corporation | Device for detecting contaminants on conductive surfaces |
DE10120524B4 (de) * | 2001-04-26 | 2015-08-20 | Infineon Technologies Ag | Vorrichtung zur Ermittlung des Stromes durch ein Leistungs-Halbleiterbauelement |
FR2851097B1 (fr) * | 2003-02-11 | 2005-04-29 | Cit Alcatel | Unite de branchement integrable dans un systeme sous-marin de telecommunications, un tel systeme sous-marin de telecommunications et procede de reconfiguration d'un tel systeme sous-marin de telecommunications |
US7129719B2 (en) * | 2004-06-01 | 2006-10-31 | Samsung Techwin Co., Ltd. | Apparatus for detecting defect in circuit pattern and defect detecting system having the same |
US20100018286A1 (en) * | 2006-10-10 | 2010-01-28 | Masaya Numajiri | Calibration apparatus, contact judging method and semiconductor testing apparatus |
US10698020B2 (en) | 2014-03-26 | 2020-06-30 | Teradyne, Inc. | Current regulation for accurate and low-cost voltage measurements at the wafer level |
US11041900B2 (en) | 2014-03-26 | 2021-06-22 | Teradyne, Inc. | Equi-resistant probe distribution for high-accuracy voltage measurements at the wafer level |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1169711A (en) * | 1966-05-12 | 1969-11-05 | South London Electric Equipmen | Improvements relating to the Measurement of Resistivity |
GB1201679A (en) * | 1968-04-10 | 1970-08-12 | British Comm Corp Ltd | Location of short circuits |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA665756A (en) * | 1959-06-08 | 1963-06-25 | Western Electric Company, Incorporated | Resistivity measuring circuit |
DE1516121A1 (de) * | 1966-02-23 | 1969-09-25 | Eugen Lehmann Elektronische Me | Tastkopf fuer elektrische Messgeraete |
NL7008274A (fr) * | 1970-06-06 | 1971-12-08 | ||
US3996514A (en) * | 1975-11-21 | 1976-12-07 | Bell Telephone Laboratories, Incorporated | Circuit board contact resistance probe |
-
1978
- 1978-02-21 US US05/879,881 patent/US4179652A/en not_active Expired - Lifetime
-
1979
- 1979-01-30 GB GB7903170A patent/GB2015172B/en not_active Expired
- 1979-02-21 DE DE2906736A patent/DE2906736C2/de not_active Expired
- 1979-02-21 CA CA000322004A patent/CA1144236A/fr not_active Expired
- 1979-02-21 JP JP1961879A patent/JPS54129885A/ja active Granted
- 1979-02-21 FR FR7904446A patent/FR2417779B1/fr not_active Expired
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1169711A (en) * | 1966-05-12 | 1969-11-05 | South London Electric Equipmen | Improvements relating to the Measurement of Resistivity |
GB1201679A (en) * | 1968-04-10 | 1970-08-12 | British Comm Corp Ltd | Location of short circuits |
Non-Patent Citations (1)
Title |
---|
EXBK/63 * |
Also Published As
Publication number | Publication date |
---|---|
JPS6226428B2 (fr) | 1987-06-09 |
GB2015172A (en) | 1979-09-05 |
GB2015172B (en) | 1982-07-21 |
JPS54129885A (en) | 1979-10-08 |
CA1144236A (fr) | 1983-04-05 |
DE2906736C2 (de) | 1985-07-18 |
FR2417779B1 (fr) | 1985-08-16 |
US4179652A (en) | 1979-12-18 |
DE2906736A1 (de) | 1979-08-23 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |