FR2407483A1 - Procede et dispositif de test d'elements conducteurs - Google Patents
Procede et dispositif de test d'elements conducteursInfo
- Publication number
- FR2407483A1 FR2407483A1 FR7830633A FR7830633A FR2407483A1 FR 2407483 A1 FR2407483 A1 FR 2407483A1 FR 7830633 A FR7830633 A FR 7830633A FR 7830633 A FR7830633 A FR 7830633A FR 2407483 A1 FR2407483 A1 FR 2407483A1
- Authority
- FR
- France
- Prior art keywords
- linearity
- conductive element
- test method
- test
- element test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
L'INVENTION CONCERNE LE TEST D'ELEMENTS CONDUCTEURS DE L'ELECTRICITE. LE PROCEDE DE L'INVENTION EST BASE SUR LA DETERMINATION DE LA NON-LINEARITE DE LA RESISTANCE ELECTRIQUE D'UN ELEMENT CONDUCTEUR, CETTE NON-LINEARITE ETANT ETROITEMENT LIEE A LA FIABILITE DE CET ELEMENT. UN GENERATEUR DE SIGNAL 11 APPLIQUE UN TRAIN REPETITIF D'IMPULSIONS A UN RESEAU DE COUPLAGE EN ALTERNATIF 15, ENTRE LES BORNES DE SORTIE DUQUEL EST PLACE L'ELEMENT 14 QUI FAIT L'OBJET DU TEST. LE COURANT MOYEN PASSANT PAR CE DERNIER OU LA TENSION MOYENNE ENTRE SES BORNES EST UNE MESURE DE LA NON-LINEARITE DE LA RESISTANCE. APPLICATION A LA FABRICATION DES CIRCUITS INTEGRES.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US84721377A | 1977-10-31 | 1977-10-31 | |
US05/949,578 US4213087A (en) | 1978-10-10 | 1978-10-10 | Method and device for testing electrical conductor elements |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2407483A1 true FR2407483A1 (fr) | 1979-05-25 |
FR2407483B1 FR2407483B1 (fr) | 1983-09-16 |
Family
ID=27126694
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7830633A Granted FR2407483A1 (fr) | 1977-10-31 | 1978-10-27 | Procede et dispositif de test d'elements conducteurs |
Country Status (12)
Country | Link |
---|---|
JP (1) | JPS5488777A (fr) |
CA (1) | CA1120545A (fr) |
CH (1) | CH635686A5 (fr) |
DE (1) | DE2847074A1 (fr) |
DK (1) | DK483278A (fr) |
FR (1) | FR2407483A1 (fr) |
GB (1) | GB2007850B (fr) |
HK (1) | HK25584A (fr) |
IT (1) | IT1099851B (fr) |
NL (1) | NL7810608A (fr) |
SE (1) | SE433782B (fr) |
SG (1) | SG56382G (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2540634A1 (fr) * | 1983-02-07 | 1984-08-10 | Tektronix Inc | Procede et appareil de detection de composants electriques non lineaires |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0630444B2 (ja) * | 1985-05-02 | 1994-04-20 | 株式会社日立製作所 | A/d変換器試験方式 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3500188A (en) * | 1966-06-02 | 1970-03-10 | Amp Inc | Method and means for measuring constriction resistance based on nonlinearity |
GB1221704A (en) * | 1968-09-16 | 1971-02-10 | Dale Electronics | Method for testing the resistance characteristics of self-heated electric resistors |
US3692987A (en) * | 1970-07-06 | 1972-09-19 | Western Electric Co | Methods and apparatus for allocating the measured noise and resistance of a thin-film resistor between the resistor proper and the contact pads therefor |
FR2183691A1 (fr) * | 1972-05-05 | 1973-12-21 | Ibm | |
US3803483A (en) * | 1972-05-05 | 1974-04-09 | Ibm | Semiconductor structure for testing of metallization networks on insulative substrates supporting semiconductor chips |
FR2296852A1 (fr) * | 1975-01-02 | 1976-07-30 | Ibm | Systeme de mesure des caracteristiques de lignes conductrices |
-
1978
- 1978-10-23 SE SE7811012A patent/SE433782B/sv unknown
- 1978-10-24 NL NL7810608A patent/NL7810608A/xx not_active Application Discontinuation
- 1978-10-27 FR FR7830633A patent/FR2407483A1/fr active Granted
- 1978-10-28 DE DE19782847074 patent/DE2847074A1/de not_active Withdrawn
- 1978-10-30 DK DK483278A patent/DK483278A/da not_active Application Discontinuation
- 1978-10-30 IT IT29239/78A patent/IT1099851B/it active
- 1978-10-31 CA CA000315697A patent/CA1120545A/fr not_active Expired
- 1978-10-31 GB GB7842658A patent/GB2007850B/en not_active Expired
- 1978-10-31 JP JP13337178A patent/JPS5488777A/ja active Pending
- 1978-10-31 CH CH1121678A patent/CH635686A5/de not_active IP Right Cessation
-
1982
- 1982-11-04 SG SG563/82A patent/SG56382G/en unknown
-
1984
- 1984-03-22 HK HK255/84A patent/HK25584A/xx unknown
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3500188A (en) * | 1966-06-02 | 1970-03-10 | Amp Inc | Method and means for measuring constriction resistance based on nonlinearity |
GB1221704A (en) * | 1968-09-16 | 1971-02-10 | Dale Electronics | Method for testing the resistance characteristics of self-heated electric resistors |
US3692987A (en) * | 1970-07-06 | 1972-09-19 | Western Electric Co | Methods and apparatus for allocating the measured noise and resistance of a thin-film resistor between the resistor proper and the contact pads therefor |
FR2183691A1 (fr) * | 1972-05-05 | 1973-12-21 | Ibm | |
US3803483A (en) * | 1972-05-05 | 1974-04-09 | Ibm | Semiconductor structure for testing of metallization networks on insulative substrates supporting semiconductor chips |
FR2296852A1 (fr) * | 1975-01-02 | 1976-07-30 | Ibm | Systeme de mesure des caracteristiques de lignes conductrices |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2540634A1 (fr) * | 1983-02-07 | 1984-08-10 | Tektronix Inc | Procede et appareil de detection de composants electriques non lineaires |
Also Published As
Publication number | Publication date |
---|---|
SG56382G (en) | 1983-09-02 |
NL7810608A (nl) | 1979-05-02 |
CA1120545A (fr) | 1982-03-23 |
DE2847074A1 (de) | 1979-05-03 |
SE433782B (sv) | 1984-06-12 |
SE7811012L (sv) | 1979-05-01 |
DK483278A (da) | 1979-05-01 |
HK25584A (en) | 1984-03-30 |
IT7829239A0 (it) | 1978-10-30 |
CH635686A5 (de) | 1983-04-15 |
GB2007850A (en) | 1979-05-23 |
JPS5488777A (en) | 1979-07-14 |
IT1099851B (it) | 1985-09-28 |
GB2007850B (en) | 1982-05-12 |
FR2407483B1 (fr) | 1983-09-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |