IT1099851B - Procedimento e dispositivo per la prova di elementi conduttori elettrici - Google Patents

Procedimento e dispositivo per la prova di elementi conduttori elettrici

Info

Publication number
IT1099851B
IT1099851B IT29239/78A IT2923978A IT1099851B IT 1099851 B IT1099851 B IT 1099851B IT 29239/78 A IT29239/78 A IT 29239/78A IT 2923978 A IT2923978 A IT 2923978A IT 1099851 B IT1099851 B IT 1099851B
Authority
IT
Italy
Prior art keywords
procedure
conducting elements
electrical conducting
testing electrical
testing
Prior art date
Application number
IT29239/78A
Other languages
English (en)
Other versions
IT7829239A0 (it
Original Assignee
Western Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US05/949,578 external-priority patent/US4213087A/en
Application filed by Western Electric Co filed Critical Western Electric Co
Publication of IT7829239A0 publication Critical patent/IT7829239A0/it
Application granted granted Critical
Publication of IT1099851B publication Critical patent/IT1099851B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
IT29239/78A 1977-10-31 1978-10-30 Procedimento e dispositivo per la prova di elementi conduttori elettrici IT1099851B (it)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US84721377A 1977-10-31 1977-10-31
US05/949,578 US4213087A (en) 1978-10-10 1978-10-10 Method and device for testing electrical conductor elements

Publications (2)

Publication Number Publication Date
IT7829239A0 IT7829239A0 (it) 1978-10-30
IT1099851B true IT1099851B (it) 1985-09-28

Family

ID=27126694

Family Applications (1)

Application Number Title Priority Date Filing Date
IT29239/78A IT1099851B (it) 1977-10-31 1978-10-30 Procedimento e dispositivo per la prova di elementi conduttori elettrici

Country Status (12)

Country Link
JP (1) JPS5488777A (it)
CA (1) CA1120545A (it)
CH (1) CH635686A5 (it)
DE (1) DE2847074A1 (it)
DK (1) DK483278A (it)
FR (1) FR2407483A1 (it)
GB (1) GB2007850B (it)
HK (1) HK25584A (it)
IT (1) IT1099851B (it)
NL (1) NL7810608A (it)
SE (1) SE433782B (it)
SG (1) SG56382G (it)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4547724A (en) * 1983-02-07 1985-10-15 Tektronix, Inc. Method and apparatus for detection of non-linear electrical devices
JPH0630444B2 (ja) * 1985-05-02 1994-04-20 株式会社日立製作所 Ａ／ｄ変換器試験方式

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3500188A (en) * 1966-06-02 1970-03-10 Amp Inc Method and means for measuring constriction resistance based on nonlinearity
GB1221704A (en) * 1968-09-16 1971-02-10 Dale Electronics Method for testing the resistance characteristics of self-heated electric resistors
US3692987A (en) * 1970-07-06 1972-09-19 Western Electric Co Methods and apparatus for allocating the measured noise and resistance of a thin-film resistor between the resistor proper and the contact pads therefor
US3746973A (en) * 1972-05-05 1973-07-17 Ibm Testing of metallization networks on insulative substrates supporting semiconductor chips
US3803483A (en) * 1972-05-05 1974-04-09 Ibm Semiconductor structure for testing of metallization networks on insulative substrates supporting semiconductor chips
US3974443A (en) * 1975-01-02 1976-08-10 International Business Machines Corporation Conductive line width and resistivity measuring system

Also Published As

Publication number Publication date
SE433782B (sv) 1984-06-12
HK25584A (en) 1984-03-30
SE7811012L (sv) 1979-05-01
FR2407483A1 (fr) 1979-05-25
CH635686A5 (de) 1983-04-15
NL7810608A (nl) 1979-05-02
FR2407483B1 (it) 1983-09-16
DE2847074A1 (de) 1979-05-03
GB2007850A (en) 1979-05-23
CA1120545A (en) 1982-03-23
DK483278A (da) 1979-05-01
GB2007850B (en) 1982-05-12
IT7829239A0 (it) 1978-10-30
JPS5488777A (en) 1979-07-14
SG56382G (en) 1983-09-02

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