SG56382G - Method and device for testing electrical conductors - Google Patents

Method and device for testing electrical conductors

Info

Publication number
SG56382G
SG56382G SG563/82A SG56382A SG56382G SG 56382 G SG56382 G SG 56382G SG 563/82 A SG563/82 A SG 563/82A SG 56382 A SG56382 A SG 56382A SG 56382 G SG56382 G SG 56382G
Authority
SG
Singapore
Prior art keywords
electrical conductors
testing electrical
testing
conductors
electrical
Prior art date
Application number
SG563/82A
Other languages
English (en)
Original Assignee
Western Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US05/949,578 external-priority patent/US4213087A/en
Application filed by Western Electric Co filed Critical Western Electric Co
Publication of SG56382G publication Critical patent/SG56382G/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
SG563/82A 1977-10-31 1982-11-04 Method and device for testing electrical conductors SG56382G (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US84721377A 1977-10-31 1977-10-31
US05/949,578 US4213087A (en) 1978-10-10 1978-10-10 Method and device for testing electrical conductor elements

Publications (1)

Publication Number Publication Date
SG56382G true SG56382G (en) 1983-09-02

Family

ID=27126694

Family Applications (1)

Application Number Title Priority Date Filing Date
SG563/82A SG56382G (en) 1977-10-31 1982-11-04 Method and device for testing electrical conductors

Country Status (12)

Country Link
JP (1) JPS5488777A (fr)
CA (1) CA1120545A (fr)
CH (1) CH635686A5 (fr)
DE (1) DE2847074A1 (fr)
DK (1) DK483278A (fr)
FR (1) FR2407483A1 (fr)
GB (1) GB2007850B (fr)
HK (1) HK25584A (fr)
IT (1) IT1099851B (fr)
NL (1) NL7810608A (fr)
SE (1) SE433782B (fr)
SG (1) SG56382G (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4547724A (en) * 1983-02-07 1985-10-15 Tektronix, Inc. Method and apparatus for detection of non-linear electrical devices
JPH0630444B2 (ja) * 1985-05-02 1994-04-20 株式会社日立製作所 Ａ／ｄ変換器試験方式

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3500188A (en) * 1966-06-02 1970-03-10 Amp Inc Method and means for measuring constriction resistance based on nonlinearity
GB1221704A (en) * 1968-09-16 1971-02-10 Dale Electronics Method for testing the resistance characteristics of self-heated electric resistors
US3692987A (en) * 1970-07-06 1972-09-19 Western Electric Co Methods and apparatus for allocating the measured noise and resistance of a thin-film resistor between the resistor proper and the contact pads therefor
US3746973A (en) * 1972-05-05 1973-07-17 Ibm Testing of metallization networks on insulative substrates supporting semiconductor chips
US3803483A (en) * 1972-05-05 1974-04-09 Ibm Semiconductor structure for testing of metallization networks on insulative substrates supporting semiconductor chips
US3974443A (en) * 1975-01-02 1976-08-10 International Business Machines Corporation Conductive line width and resistivity measuring system

Also Published As

Publication number Publication date
GB2007850A (en) 1979-05-23
GB2007850B (en) 1982-05-12
NL7810608A (nl) 1979-05-02
DK483278A (da) 1979-05-01
FR2407483A1 (fr) 1979-05-25
HK25584A (en) 1984-03-30
SE433782B (sv) 1984-06-12
JPS5488777A (en) 1979-07-14
DE2847074A1 (de) 1979-05-03
IT1099851B (it) 1985-09-28
IT7829239A0 (it) 1978-10-30
FR2407483B1 (fr) 1983-09-16
SE7811012L (sv) 1979-05-01
CH635686A5 (de) 1983-04-15
CA1120545A (fr) 1982-03-23

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