FR2396093A1 - Appareil pour le depot en phase de vapeurs sous vide - Google Patents
Appareil pour le depot en phase de vapeurs sous videInfo
- Publication number
- FR2396093A1 FR2396093A1 FR7819740A FR7819740A FR2396093A1 FR 2396093 A1 FR2396093 A1 FR 2396093A1 FR 7819740 A FR7819740 A FR 7819740A FR 7819740 A FR7819740 A FR 7819740A FR 2396093 A1 FR2396093 A1 FR 2396093A1
- Authority
- FR
- France
- Prior art keywords
- phase
- vacuum
- vapors
- vacuum vapors
- nacelles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
- C23C14/542—Controlling the film thickness or evaporation rate
- C23C14/545—Controlling the film thickness or evaporation rate using measurement on deposited material
- C23C14/546—Controlling the film thickness or evaporation rate using measurement on deposited material using crystal oscillators
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D5/00—Control of dimensions of material
- G05D5/02—Control of dimensions of material of thickness, e.g. of rolled material
- G05D5/03—Control of dimensions of material of thickness, e.g. of rolled material characterised by the use of electric means
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Automation & Control Theory (AREA)
- Physical Vapour Deposition (AREA)
Abstract
L'appareil pour dépôt de vapeurs sous vide selon l'invention comprend : un plateau tournant 9 pour supporter des substrats 8 sur lesquels doit être déposée la vapeur, des nacelles d'évaporation 10 et 11, des sources d'alimentation 25 et 26 destinées au chauffage des nacelles, des obturateurs 16 et 17 entraînés par des moyens d'entraînement 35 et 36, au moins un dispositif de contrôle de dépôt 18 à quartz, un dispositif de couplage 19, un compteur de fréquence numérique 29.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7791377A JPS5413478A (en) | 1977-07-01 | 1977-07-01 | Vacuum depositing apparatus |
JP8096877A JPS5431089A (en) | 1977-07-08 | 1977-07-08 | Vacuum metallizer |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2396093A1 true FR2396093A1 (fr) | 1979-01-26 |
FR2396093B1 FR2396093B1 (fr) | 1982-09-17 |
Family
ID=26418962
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7819740A Granted FR2396093A1 (fr) | 1977-07-01 | 1978-06-30 | Appareil pour le depot en phase de vapeurs sous vide |
Country Status (4)
Country | Link |
---|---|
US (1) | US4207836A (fr) |
DE (1) | DE2828651C2 (fr) |
FR (1) | FR2396093A1 (fr) |
GB (1) | GB2000882B (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0124063A1 (fr) * | 1983-04-29 | 1984-11-07 | Siemens Aktiengesellschaft | Procédé pour mesurer l'application et l'enlèvement des conches minces |
Families Citing this family (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH644722A5 (de) * | 1980-07-21 | 1984-08-15 | Balzers Hochvakuum | Schwingquarzmesskopf. |
DE3028123A1 (de) * | 1980-07-24 | 1982-02-25 | Siemens AG, 1000 Berlin und 8000 München | Verfahren und vorrichtung zur herstellung von schichtkondensatoren |
JPS5998520A (ja) * | 1982-11-27 | 1984-06-06 | Toshiba Mach Co Ltd | 半導体気相成長装置 |
US4478174A (en) * | 1983-02-25 | 1984-10-23 | Canadian Patents & Development Limited | Vacuum coating vessel with movable shutter plate |
US5125138A (en) * | 1983-12-19 | 1992-06-30 | Spectrum Control, Inc. | Miniaturized monolithic multi-layer capacitor and apparatus and method for making same |
US5032461A (en) * | 1983-12-19 | 1991-07-16 | Spectrum Control, Inc. | Method of making a multi-layered article |
US5018048A (en) * | 1983-12-19 | 1991-05-21 | Spectrum Control, Inc. | Miniaturized monolithic multi-layer capacitor and apparatus and method for making |
US4842893A (en) * | 1983-12-19 | 1989-06-27 | Spectrum Control, Inc. | High speed process for coating substrates |
US5097800A (en) * | 1983-12-19 | 1992-03-24 | Spectrum Control, Inc. | High speed apparatus for forming capacitors |
US4579083A (en) * | 1984-01-21 | 1986-04-01 | Canadian Patents And Development Limited | Automatic variable rate evaporation source for thin film deposition |
JPS60178616A (ja) * | 1984-02-27 | 1985-09-12 | Hitachi Ltd | 分子線エピタキシ装置の試料回転ホルダ |
US4553853A (en) * | 1984-02-27 | 1985-11-19 | International Business Machines Corporation | End point detector for a tin lead evaporator |
DE3412724A1 (de) * | 1984-04-04 | 1985-10-17 | Siemens AG, 1000 Berlin und 8000 München | Verfahren und anordnung zum messen der schichtdicke und/oder der konzentration von auf substraten abgeschiedenen duennen schichten waehrend ihrer herstellung |
DE3613112A1 (de) * | 1986-04-18 | 1987-10-22 | Grundig Emv | Einrichtung zum messen der magnetischen eigenschaften von durch sputtern oder bedampfen aufgebrachten schichten waehrend des bearbeitungsvorganges |
US4669418A (en) * | 1986-05-19 | 1987-06-02 | Gte Laboratories Incorporated | Optical coating apparatus |
US4954371A (en) * | 1986-06-23 | 1990-09-04 | Spectrum Control, Inc. | Flash evaporation of monomer fluids |
US4858556A (en) * | 1986-09-15 | 1989-08-22 | Siebert Jerome F | Method and apparatus for physical vapor deposition of thin films |
US5117192A (en) * | 1990-01-12 | 1992-05-26 | Leybold Inficon Inc. | Control circuitry for quartz crystal deposition monitor |
JP2633106B2 (ja) * | 1991-05-24 | 1997-07-23 | シャープ株式会社 | レジスト塗布装置 |
US5948983A (en) * | 1997-07-25 | 1999-09-07 | Leybold Inficon, Inc. | Wall deposition monitoring system |
JPH11189874A (ja) * | 1997-12-25 | 1999-07-13 | Tdk Corp | 薄膜形成方法および装置 |
US6090444A (en) * | 1999-02-08 | 2000-07-18 | Saunders & Associates, Inc. | Base plater or vacuum deposition apparatus with individually and selectively controlled work holders and capacitively coupled crystal monitor |
US6370955B1 (en) | 1999-06-15 | 2002-04-16 | Massachusetts Institute Of Technology | High-temperature balance |
US7828929B2 (en) * | 2004-12-30 | 2010-11-09 | Research Electro-Optics, Inc. | Methods and devices for monitoring and controlling thin film processing |
EP2309220A1 (fr) * | 2009-10-02 | 2011-04-13 | Applied Materials, Inc. | Dispositif et procédé pour mesurer l'épaisseur d'une couche |
EP2418545B1 (fr) | 2010-08-12 | 2018-10-10 | Applied Materials, Inc. | Module de manipulation de masques |
JP5888919B2 (ja) * | 2010-11-04 | 2016-03-22 | キヤノン株式会社 | 成膜装置及び成膜方法 |
AT512949B1 (de) * | 2012-06-04 | 2016-06-15 | Leica Microsysteme Gmbh | Verfahren zur Beschichtung mit einem Verdampfungsmaterial |
WO2019003499A1 (fr) * | 2017-06-28 | 2019-01-03 | 株式会社アルバック | Tête de capteur d'un dispositif de surveillance d'épaisseur de film de type à oscillation de cristal |
US20190062902A1 (en) * | 2017-08-22 | 2019-02-28 | Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd. | Evaporation source device |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR1478820A (fr) * | 1966-05-04 | 1967-04-28 | Smidth & Co As F L | Procédé et appareil de transfert de données |
FR1538598A (fr) * | 1967-07-27 | 1968-09-06 | Sfim | Dispositif de transmission d'un signal électrique entre une pièce tournante et une pièce fixe |
FR1586500A (fr) * | 1967-09-30 | 1970-02-20 | ||
FR2027049A1 (fr) * | 1968-12-24 | 1970-09-25 | Barmag Barmer Maschf | |
FR2117066A5 (fr) * | 1970-12-09 | 1972-07-21 | Ibm | |
FR2292517A1 (fr) * | 1974-11-29 | 1976-06-25 | Instrumentarium Oy | Procede et appareil de formation de pellicules minces de composes |
FR2344643A1 (fr) * | 1976-03-19 | 1977-10-14 | Hitachi Ltd | Appareil de depot sous vide |
-
1978
- 1978-06-22 GB GB7827597A patent/GB2000882B/en not_active Expired
- 1978-06-22 US US05/918,272 patent/US4207836A/en not_active Expired - Lifetime
- 1978-06-29 DE DE2828651A patent/DE2828651C2/de not_active Expired
- 1978-06-30 FR FR7819740A patent/FR2396093A1/fr active Granted
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR1478820A (fr) * | 1966-05-04 | 1967-04-28 | Smidth & Co As F L | Procédé et appareil de transfert de données |
FR1538598A (fr) * | 1967-07-27 | 1968-09-06 | Sfim | Dispositif de transmission d'un signal électrique entre une pièce tournante et une pièce fixe |
FR1586500A (fr) * | 1967-09-30 | 1970-02-20 | ||
FR2027049A1 (fr) * | 1968-12-24 | 1970-09-25 | Barmag Barmer Maschf | |
FR2117066A5 (fr) * | 1970-12-09 | 1972-07-21 | Ibm | |
FR2292517A1 (fr) * | 1974-11-29 | 1976-06-25 | Instrumentarium Oy | Procede et appareil de formation de pellicules minces de composes |
FR2344643A1 (fr) * | 1976-03-19 | 1977-10-14 | Hitachi Ltd | Appareil de depot sous vide |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0124063A1 (fr) * | 1983-04-29 | 1984-11-07 | Siemens Aktiengesellschaft | Procédé pour mesurer l'application et l'enlèvement des conches minces |
Also Published As
Publication number | Publication date |
---|---|
GB2000882A (en) | 1979-01-17 |
US4207836A (en) | 1980-06-17 |
DE2828651A1 (de) | 1979-01-18 |
DE2828651C2 (de) | 1982-04-29 |
FR2396093B1 (fr) | 1982-09-17 |
GB2000882B (en) | 1982-04-07 |
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