FR2375692A1 - Memoire semi-conductrice a grilles flottantes, programmable electriquement - Google Patents
Memoire semi-conductrice a grilles flottantes, programmable electriquementInfo
- Publication number
- FR2375692A1 FR2375692A1 FR7739174A FR7739174A FR2375692A1 FR 2375692 A1 FR2375692 A1 FR 2375692A1 FR 7739174 A FR7739174 A FR 7739174A FR 7739174 A FR7739174 A FR 7739174A FR 2375692 A1 FR2375692 A1 FR 2375692A1
- Authority
- FR
- France
- Prior art keywords
- matrix
- column lines
- semiconductor storage
- selected row
- electrically programmable
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
- G11C16/0416—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing a single floating gate transistor and no select transistor, e.g. UV EPROM
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
- G11C16/0433—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing a single floating gate transistor and one or more separate select transistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B41/00—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
- H10B41/30—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by the memory core region
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B69/00—Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Non-Volatile Memory (AREA)
- Read Only Memory (AREA)
- Semiconductor Memories (AREA)
Abstract
L'invention concerne une mémoire semi-conductrice rémanente à grilles flottantes, programmable électriquement. Elle comporte des transistors à grilles flottantes, les grilles flottantes étant intercalées entre une couche d'oxyde de grille et des grilles de commande formées par des lignes d'adresse de rangée. Les cellules peuvent être programmées et déprogrammées électriquement en appliquant des tensions déterminées à la source, au drain, à la grille de commande et au substrat; la grille flottante se charge ou se décharge à travers l'isolant qui la sépare de la grille de commande. Applications aux mémoires de calculateurs.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US75414576A | 1976-12-27 | 1976-12-27 | |
US05/754,207 US4122544A (en) | 1976-12-27 | 1976-12-27 | Electrically alterable floating gate semiconductor memory device with series enhancement transistor |
US05/754,144 US4112509A (en) | 1976-12-27 | 1976-12-27 | Electrically alterable floating gate semiconductor memory device |
Publications (1)
Publication Number | Publication Date |
---|---|
FR2375692A1 true FR2375692A1 (fr) | 1978-07-21 |
Family
ID=27419460
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7739174A Withdrawn FR2375692A1 (fr) | 1976-12-27 | 1977-12-26 | Memoire semi-conductrice a grilles flottantes, programmable electriquement |
Country Status (3)
Country | Link |
---|---|
JP (1) | JPS53108247A (fr) |
DE (1) | DE2758161A1 (fr) |
FR (1) | FR2375692A1 (fr) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2462781A1 (fr) * | 1979-07-27 | 1981-02-13 | Thomson Csf | Transistor a effet de champ a grille schottky autoalignee et son procede de fabrication |
FR2464536A1 (fr) * | 1979-09-04 | 1981-03-06 | Texas Instruments Inc | Memoire semi-conductrice a grille flottante, programmable electriquement, et son procede de fabrication |
FR2468185A1 (fr) * | 1980-10-17 | 1981-04-30 | Intel Corp | Procede de fabrication d'une matrice de memoire electriquement programmable a haute densite |
FR2506494A1 (fr) * | 1981-05-22 | 1982-11-26 | Hitachi Ltd | Memoire morte electriquement programmable |
EP0416240A2 (fr) * | 1989-07-21 | 1991-03-13 | EUROSIL electronic GmbH | Dispositif semi-conducteur comportant une zone d'isolation comportant de l'oxyde |
EP0766316A1 (fr) * | 1995-09-26 | 1997-04-02 | Texas Instruments Incorporated | Perfectionnements dans ou relatifs aux motrices de mémoire non volatile |
WO2002045170A1 (fr) * | 2000-11-28 | 2002-06-06 | Infineon Technologies Ag | Systeme de memoire eeprom flash et procede de production correspondant |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6025837B2 (ja) * | 1978-09-14 | 1985-06-20 | 株式会社東芝 | 半導体記憶装置 |
SE7907193L (sv) * | 1978-09-28 | 1980-03-29 | Rca Corp | Bestendigt minne |
JPS5654693A (en) * | 1979-10-05 | 1981-05-14 | Hitachi Ltd | Programable rom |
JPS56156985A (en) * | 1980-02-04 | 1981-12-03 | Texas Instruments Inc | Decoder |
US4868629A (en) * | 1984-05-15 | 1989-09-19 | Waferscale Integration, Inc. | Self-aligned split gate EPROM |
US4698787A (en) * | 1984-11-21 | 1987-10-06 | Exel Microelectronics, Inc. | Single transistor electrically programmable memory device and method |
EP1240670A1 (fr) | 1999-12-20 | 2002-09-18 | Infineon Technologies AG | Memoire non-ou a semiconducteurs non volatile et procede pour programmer cette derniere |
US8320191B2 (en) | 2007-08-30 | 2012-11-27 | Infineon Technologies Ag | Memory cell arrangement, method for controlling a memory cell, memory array and electronic device |
-
1977
- 1977-12-26 JP JP15716977A patent/JPS53108247A/ja active Pending
- 1977-12-26 FR FR7739174A patent/FR2375692A1/fr not_active Withdrawn
- 1977-12-27 DE DE19772758161 patent/DE2758161A1/de not_active Withdrawn
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2462781A1 (fr) * | 1979-07-27 | 1981-02-13 | Thomson Csf | Transistor a effet de champ a grille schottky autoalignee et son procede de fabrication |
FR2464536A1 (fr) * | 1979-09-04 | 1981-03-06 | Texas Instruments Inc | Memoire semi-conductrice a grille flottante, programmable electriquement, et son procede de fabrication |
FR2468185A1 (fr) * | 1980-10-17 | 1981-04-30 | Intel Corp | Procede de fabrication d'une matrice de memoire electriquement programmable a haute densite |
FR2506494A1 (fr) * | 1981-05-22 | 1982-11-26 | Hitachi Ltd | Memoire morte electriquement programmable |
EP0416240A2 (fr) * | 1989-07-21 | 1991-03-13 | EUROSIL electronic GmbH | Dispositif semi-conducteur comportant une zone d'isolation comportant de l'oxyde |
EP0416240A3 (en) * | 1989-07-21 | 1993-09-29 | Eurosil Electronic Gmbh | Semiconductor device using an oxide for the isolation region |
EP0766316A1 (fr) * | 1995-09-26 | 1997-04-02 | Texas Instruments Incorporated | Perfectionnements dans ou relatifs aux motrices de mémoire non volatile |
WO2002045170A1 (fr) * | 2000-11-28 | 2002-06-06 | Infineon Technologies Ag | Systeme de memoire eeprom flash et procede de production correspondant |
US6800893B2 (en) | 2000-11-28 | 2004-10-05 | Infineon Technoloiges Ag | Semiconductor circuit configuration and associated fabrication method |
Also Published As
Publication number | Publication date |
---|---|
DE2758161A1 (de) | 1978-07-06 |
JPS53108247A (en) | 1978-09-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |