FR2269718A1 - Quality testing of semiconductor components and integrated circuits - involves P-N transfer admitting variable current - Google Patents

Quality testing of semiconductor components and integrated circuits - involves P-N transfer admitting variable current

Info

Publication number
FR2269718A1
FR2269718A1 FR7413818A FR7413818A FR2269718A1 FR 2269718 A1 FR2269718 A1 FR 2269718A1 FR 7413818 A FR7413818 A FR 7413818A FR 7413818 A FR7413818 A FR 7413818A FR 2269718 A1 FR2269718 A1 FR 2269718A1
Authority
FR
France
Prior art keywords
transfer
semiconductor components
involves
variable current
integrated circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7413818A
Other languages
English (en)
French (fr)
Other versions
FR2269718B1 (enExample
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MODEL EVGENIA
Original Assignee
MODEL EVGENIA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MODEL EVGENIA filed Critical MODEL EVGENIA
Priority to FR7413818A priority Critical patent/FR2269718A1/fr
Publication of FR2269718A1 publication Critical patent/FR2269718A1/fr
Application granted granted Critical
Publication of FR2269718B1 publication Critical patent/FR2269718B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
FR7413818A 1974-04-19 1974-04-19 Quality testing of semiconductor components and integrated circuits - involves P-N transfer admitting variable current Granted FR2269718A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR7413818A FR2269718A1 (en) 1974-04-19 1974-04-19 Quality testing of semiconductor components and integrated circuits - involves P-N transfer admitting variable current

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7413818A FR2269718A1 (en) 1974-04-19 1974-04-19 Quality testing of semiconductor components and integrated circuits - involves P-N transfer admitting variable current

Publications (2)

Publication Number Publication Date
FR2269718A1 true FR2269718A1 (en) 1975-11-28
FR2269718B1 FR2269718B1 (enExample) 1977-01-07

Family

ID=9137897

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7413818A Granted FR2269718A1 (en) 1974-04-19 1974-04-19 Quality testing of semiconductor components and integrated circuits - involves P-N transfer admitting variable current

Country Status (1)

Country Link
FR (1) FR2269718A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117368700A (zh) * 2023-12-07 2024-01-09 深圳市易检车服科技有限公司 无线均衡仪中电路板的自动测试系统及自动测试方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117368700A (zh) * 2023-12-07 2024-01-09 深圳市易检车服科技有限公司 无线均衡仪中电路板的自动测试系统及自动测试方法
CN117368700B (zh) * 2023-12-07 2024-02-09 深圳市易检车服科技有限公司 无线均衡仪中电路板的自动测试系统及自动测试方法

Also Published As

Publication number Publication date
FR2269718B1 (enExample) 1977-01-07

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