FR2254788B3 - - Google Patents
Info
- Publication number
- FR2254788B3 FR2254788B3 FR7441528A FR7441528A FR2254788B3 FR 2254788 B3 FR2254788 B3 FR 2254788B3 FR 7441528 A FR7441528 A FR 7441528A FR 7441528 A FR7441528 A FR 7441528A FR 2254788 B3 FR2254788 B3 FR 2254788B3
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
- H01J37/256—Tubes for spot-analysing by electron or ion beams; Microanalysers using scanning beams
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US425457A US3878392A (en) | 1973-12-17 | 1973-12-17 | Specimen analysis with ion and electrom beams |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2254788A1 FR2254788A1 (en) | 1975-07-11 |
| FR2254788B3 true FR2254788B3 (en) | 1977-09-16 |
Family
ID=23686655
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR7441528A Expired FR2254788B3 (en) | 1973-12-17 | 1974-12-17 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US3878392A (en) |
| JP (1) | JPS5093692A (en) |
| DE (1) | DE2454826A1 (en) |
| FR (1) | FR2254788B3 (en) |
| GB (1) | GB1457975A (en) |
Families Citing this family (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3942005A (en) * | 1974-12-12 | 1976-03-02 | Hitachi, Ltd. | Electron scanning apparatus |
| US4088895A (en) * | 1977-07-08 | 1978-05-09 | Martin Frederick Wight | Memory device utilizing ion beam readout |
| US4591984A (en) * | 1981-08-10 | 1986-05-27 | Tokyo Shibaura Denki Kabushiki Kaisha | Radiation measuring device |
| DE3403254A1 (en) * | 1984-01-31 | 1985-08-01 | Siemens AG, 1000 Berlin und 8000 München | METHOD AND DEVICE FOR COMPENSATING CHARGES IN SECONDARY ISSUE MASS SPECTROMETRY (SIMS) ELECTRICALLY BAD CONDUCTING SAMPLES |
| JPS60221944A (en) * | 1985-03-28 | 1985-11-06 | Shimadzu Corp | Method of totally analyzing local area of sample |
| IE58049B1 (en) * | 1985-05-21 | 1993-06-16 | Tekscan Ltd | Surface analysis microscopy apparatus |
| EP0265245A3 (en) * | 1986-10-21 | 1992-07-01 | Matsushita Electric Industrial Co., Ltd. | Method of erasable recording and reading of information |
| JPH0754287B2 (en) * | 1987-12-16 | 1995-06-07 | 三菱電機株式会社 | Impurity detection analysis method |
| JPH02183150A (en) * | 1989-01-09 | 1990-07-17 | Hitachi Ltd | Mass spectrometry method and apparatus for ion |
| US5014287A (en) * | 1990-04-18 | 1991-05-07 | Thornton Michael G | Portable x-ray fluorescence spectrometer for environmental monitoring of inorganic pollutants |
| WO1993011704A1 (en) * | 1991-12-17 | 1993-06-24 | Eduard Emmanuilovich Godik | Method and device for diagnosis of living organism |
| DE4232509A1 (en) * | 1992-09-29 | 1994-03-31 | Holstein & Kappert Maschf | Measuring contaminants in containers,e.g. plastic bottles - involves using mass spectrometer with ionisation and photon stimulation |
| US5699797A (en) * | 1992-10-05 | 1997-12-23 | Dynamics Imaging, Inc. | Method of investigation of microcirculation functional dynamics of physiological liquids in skin and apparatus for its realization |
| US6002958A (en) * | 1992-12-24 | 1999-12-14 | Dynamics Imaging, Inc. | Method and apparatus for diagnostics of internal organs |
| US5747789A (en) * | 1993-12-01 | 1998-05-05 | Dynamics Imaging, Inc. | Method for investigation of distribution of physiological components in human body tissues and apparatus for its realization |
| US6192262B1 (en) | 1994-02-23 | 2001-02-20 | Dobi Medical Systems, Llc | Method of living organism multimodal functional mapping |
| US5865743A (en) * | 1994-02-23 | 1999-02-02 | Dynamics Imaging, Inc. | Method of living organism multimodal functional mapping |
| US5730133A (en) * | 1994-05-20 | 1998-03-24 | Dynamics Imaging, Inc. | Optical functional mamoscope |
| US6373070B1 (en) | 1999-10-12 | 2002-04-16 | Fei Company | Method apparatus for a coaxial optical microscope with focused ion beam |
| FR2806527B1 (en) * | 2000-03-20 | 2002-10-25 | Schlumberger Technologies Inc | SIMULTANEOUS FOCUSING COLUMN OF PARTICLE BEAM AND OPTICAL BEAM |
| AU2003213579B2 (en) * | 2002-03-04 | 2008-11-13 | Glowlink Communications Technology | Detecting and measuring interference contained within a digital carrier |
| CN106950191B (en) * | 2017-02-28 | 2019-11-05 | 电子科技大学 | Mating test sample generates the experimental system of spectral characteristic under electronics note excitation |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2356633A (en) * | 1939-10-19 | 1944-08-22 | Ardenne Manfred Von | Electronic microscope |
| DE1006983B (en) * | 1955-02-01 | 1957-04-25 | Leitz Ernst Gmbh | Method and device for super-microscopic imaging by means of an ion microscope |
| CH391912A (en) * | 1961-11-09 | 1965-05-15 | Trueb Taeuber & Co Ag | Process for visualization and recording of electron-optical images |
| US3445650A (en) * | 1965-10-11 | 1969-05-20 | Applied Res Lab | Double focussing mass spectrometer including a wedge-shaped magnetic sector field |
| DE1937482C3 (en) * | 1969-07-23 | 1974-10-10 | Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E.V., 3400 Goettingen | Microbeam probe |
-
1973
- 1973-12-17 US US425457A patent/US3878392A/en not_active Expired - Lifetime
-
1974
- 1974-11-19 DE DE19742454826 patent/DE2454826A1/en active Pending
- 1974-12-02 GB GB5209774A patent/GB1457975A/en not_active Expired
- 1974-12-17 JP JP49144903A patent/JPS5093692A/ja active Pending
- 1974-12-17 FR FR7441528A patent/FR2254788B3/fr not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| US3878392A (en) | 1975-04-15 |
| JPS5093692A (en) | 1975-07-25 |
| DE2454826A1 (en) | 1975-06-19 |
| FR2254788A1 (en) | 1975-07-11 |
| GB1457975A (en) | 1976-12-08 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ST | Notification of lapse |