FR2245957B1 - - Google Patents

Info

Publication number
FR2245957B1
FR2245957B1 FR7425019A FR7425019A FR2245957B1 FR 2245957 B1 FR2245957 B1 FR 2245957B1 FR 7425019 A FR7425019 A FR 7425019A FR 7425019 A FR7425019 A FR 7425019A FR 2245957 B1 FR2245957 B1 FR 2245957B1
Authority
FR
France
Prior art keywords
under test
instrument
digital
test
trigger signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7425019A
Other languages
English (en)
Other versions
FR2245957A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of FR2245957A1 publication Critical patent/FR2245957A1/fr
Application granted granted Critical
Publication of FR2245957B1 publication Critical patent/FR2245957B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
FR7425019A 1973-07-20 1974-07-18 Expired FR2245957B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US38120773 US3843893A (en) 1973-07-20 1973-07-20 Logical synchronization of test instruments

Publications (2)

Publication Number Publication Date
FR2245957A1 FR2245957A1 (fr) 1975-04-25
FR2245957B1 true FR2245957B1 (fr) 1979-08-24

Family

ID=23504117

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7425019A Expired FR2245957B1 (fr) 1973-07-20 1974-07-18

Country Status (5)

Country Link
US (1) US3843893A (fr)
JP (1) JPS5528509B2 (fr)
DE (1) DE2433885C3 (fr)
FR (1) FR2245957B1 (fr)
GB (1) GB1475382A (fr)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4100532A (en) * 1976-11-19 1978-07-11 Hewlett-Packard Company Digital pattern triggering circuit
JPS5985972U (ja) * 1982-12-01 1984-06-11 株式会社日立製作所 音声合成ｌｓｉの故障診断回路
US4534030A (en) * 1982-12-20 1985-08-06 International Business Machines Corporation Self-clocked signature analyzer
USRE34843E (en) * 1983-08-11 1995-01-31 Duffers Scientific, Inc. Signal controlled waveform recorder
US4631697A (en) * 1983-08-11 1986-12-23 Duffers Scientific, Inc. Signal controlled waveform recorder
US6026350A (en) * 1996-08-30 2000-02-15 Hewlett Packard Company Self-framing serial trigger for an oscilloscope or the like
GB9714130D0 (en) * 1997-07-05 1997-09-10 Deas Alexander R In situ memory characterisation tool
US6466007B1 (en) * 2000-08-14 2002-10-15 Teradyne, Inc. Test system for smart card and indentification devices and the like
GB0026849D0 (en) * 2000-11-03 2000-12-20 Acuid Corp Ltd DDR SDRAM memory test system with fault strobe synchronization
US20050261853A1 (en) * 2004-05-18 2005-11-24 Dobyns Kenneth P Method and apparatus for detecting multiple signal anomalies
US11002764B2 (en) * 2019-02-12 2021-05-11 Tektronix, Inc. Systems and methods for synchronizing multiple test and measurement instruments
CN111505593B (zh) * 2020-04-30 2022-03-29 北京无线电测量研究所 一种频综综合测试系统及测试方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1115233B (de) * 1956-07-20 1961-10-19 Exxon Research Engineering Co Verfahren zur Herstellung von Aluminiumalkoholaten
FR1582790A (fr) * 1968-01-16 1969-10-10
FR1568083A (fr) * 1968-01-26 1969-05-23
BE756827A (fr) * 1969-09-30 1971-03-30 Int Standard Electric Corp Perfectionnements aux systemes de transmission de
DE2049947C3 (de) * 1970-10-10 1980-10-02 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Anordnung zum Erkennen einer im bitseriellen Datenfluß auftretenden vorgegebenen Bitfolge
CH522982A (de) * 1971-03-24 1972-05-15 Siemens Ag Albis Verfahren und Einrichtung zur Synchronisation des empfangsseitigen Kanalverteilers in PCM-Zeitmultiplex-Anlagen
US3766316A (en) * 1972-05-03 1973-10-16 Us Navy Frame synchronization detector

Also Published As

Publication number Publication date
DE2433885B2 (de) 1976-10-14
JPS5041587A (fr) 1975-04-16
DE2433885C3 (de) 1982-03-04
JPS5528509B2 (fr) 1980-07-28
GB1475382A (en) 1977-06-01
DE2433885A1 (de) 1975-03-13
US3843893A (en) 1974-10-22
FR2245957A1 (fr) 1975-04-25

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