FR2235482A1 - Eliminating interface states in MIOS structures - at low temp to avoid degradation of electrical props - Google Patents
Eliminating interface states in MIOS structures - at low temp to avoid degradation of electrical propsInfo
- Publication number
- FR2235482A1 FR2235482A1 FR7416726A FR7416726A FR2235482A1 FR 2235482 A1 FR2235482 A1 FR 2235482A1 FR 7416726 A FR7416726 A FR 7416726A FR 7416726 A FR7416726 A FR 7416726A FR 2235482 A1 FR2235482 A1 FR 2235482A1
- Authority
- FR
- France
- Prior art keywords
- interface states
- mios
- structures
- substrate
- low temp
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H10W74/43—
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D99/00—Subject matter not provided for in other groups of this subclass
-
- H10P95/00—
Landscapes
- Formation Of Insulating Films (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR7416726A FR2235482A1 (en) | 1974-05-07 | 1974-05-07 | Eliminating interface states in MIOS structures - at low temp to avoid degradation of electrical props |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR7416726A FR2235482A1 (en) | 1974-05-07 | 1974-05-07 | Eliminating interface states in MIOS structures - at low temp to avoid degradation of electrical props |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2235482A1 true FR2235482A1 (en) | 1975-01-24 |
| FR2235482B1 FR2235482B1 (enExample) | 1976-12-24 |
Family
ID=9138828
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR7416726A Granted FR2235482A1 (en) | 1974-05-07 | 1974-05-07 | Eliminating interface states in MIOS structures - at low temp to avoid degradation of electrical props |
Country Status (1)
| Country | Link |
|---|---|
| FR (1) | FR2235482A1 (enExample) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR1603354A (enExample) * | 1967-08-02 | 1971-04-13 |
-
1974
- 1974-05-07 FR FR7416726A patent/FR2235482A1/fr active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR1603354A (enExample) * | 1967-08-02 | 1971-04-13 |
Non-Patent Citations (1)
| Title |
|---|
| UE US "JOURNAL OF THE ELECTROCHEMICAL SOCIETY", VOLUME 116, NO. 11, NOVEMBRE 1969, "ANNEALING MECHANIST IN RADIATION DAMAGED MNOS STRUCTURES",J.J. TENTOR, ABSTRACT 233, PAGE 337C) * |
Also Published As
| Publication number | Publication date |
|---|---|
| FR2235482B1 (enExample) | 1976-12-24 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ST | Notification of lapse |