FI991071A0 - Menetelmä ja mittausjärjestely mitata paperin pintaa - Google Patents

Menetelmä ja mittausjärjestely mitata paperin pintaa

Info

Publication number
FI991071A0
FI991071A0 FI991071A FI991071A FI991071A0 FI 991071 A0 FI991071 A0 FI 991071A0 FI 991071 A FI991071 A FI 991071A FI 991071 A FI991071 A FI 991071A FI 991071 A0 FI991071 A0 FI 991071A0
Authority
FI
Finland
Prior art keywords
procedure
paper surface
measurement arrangement
measuring paper
measuring
Prior art date
Application number
FI991071A
Other languages
English (en)
Finnish (fi)
Swedish (sv)
Inventor
Hannu Komulainen
Jaana Hakkarainen
Keijo Lehmikangas
Original Assignee
Valmet Automation Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Valmet Automation Inc filed Critical Valmet Automation Inc
Priority to FI991071A priority Critical patent/FI991071A0/fi
Publication of FI991071A0 publication Critical patent/FI991071A0/fi
Priority to CA002373674A priority patent/CA2373674A1/fr
Priority to JP2000617381A priority patent/JP2002544497A/ja
Priority to PCT/FI2000/000412 priority patent/WO2000068638A1/fr
Priority to AU44088/00A priority patent/AU4408800A/en
Priority to EP00925332A priority patent/EP1194735A1/fr
Priority to US10/003,333 priority patent/US6549286B2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
FI991071A 1999-05-10 1999-05-10 Menetelmä ja mittausjärjestely mitata paperin pintaa FI991071A0 (fi)

Priority Applications (7)

Application Number Priority Date Filing Date Title
FI991071A FI991071A0 (fi) 1999-05-10 1999-05-10 Menetelmä ja mittausjärjestely mitata paperin pintaa
CA002373674A CA2373674A1 (fr) 1999-05-10 2000-05-09 Procede et dispositif de mesure de proprietes d'une surface de papier
JP2000617381A JP2002544497A (ja) 1999-05-10 2000-05-09 紙表面特性決定方法および紙表面特性を決定するための測定装置
PCT/FI2000/000412 WO2000068638A1 (fr) 1999-05-10 2000-05-09 Procede et dispositif de mesure de proprietes d'une surface de papier
AU44088/00A AU4408800A (en) 1999-05-10 2000-05-09 Method and measuring arrangement for measuring paper surface
EP00925332A EP1194735A1 (fr) 1999-05-10 2000-05-09 Procede et dispositif de mesure de proprietes d'une surface de papier
US10/003,333 US6549286B2 (en) 1999-05-10 2001-10-31 Method and measuring arrangement for measuring paper surface

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI991071A FI991071A0 (fi) 1999-05-10 1999-05-10 Menetelmä ja mittausjärjestely mitata paperin pintaa

Publications (1)

Publication Number Publication Date
FI991071A0 true FI991071A0 (fi) 1999-05-10

Family

ID=8554636

Family Applications (1)

Application Number Title Priority Date Filing Date
FI991071A FI991071A0 (fi) 1999-05-10 1999-05-10 Menetelmä ja mittausjärjestely mitata paperin pintaa

Country Status (7)

Country Link
US (1) US6549286B2 (fr)
EP (1) EP1194735A1 (fr)
JP (1) JP2002544497A (fr)
AU (1) AU4408800A (fr)
CA (1) CA2373674A1 (fr)
FI (1) FI991071A0 (fr)
WO (1) WO2000068638A1 (fr)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6900824B2 (en) * 2001-10-29 2005-05-31 Neopost Industrie Sa Print technology based on high energy beams
PT102849B (pt) * 2002-10-08 2005-02-28 Soporcel Sociedade Portuguesa Metodo e instalacao automatica de avaliacao optica do aspecto da superficie do papel
US7465948B2 (en) 2003-09-16 2008-12-16 Paper Australia Pty Ltd. Sheet-surface analyser and method of analysing a sheet-surface
US7205561B2 (en) * 2004-03-29 2007-04-17 Lexmark International, Inc. Media sensor apparatus using a two component media sensor for media absence detection
FI117834B (fi) * 2004-04-28 2007-03-15 Abb Research Ltd Paperipinnan laadun testaus
JP4520795B2 (ja) * 2004-08-23 2010-08-11 株式会社ミツトヨ 測定器
JP4331097B2 (ja) * 2004-12-10 2009-09-16 株式会社東芝 表面粗さの計測方法および装置およびタービンの劣化診断方法
WO2008140321A1 (fr) * 2007-05-11 2008-11-20 Argos Solutions As Appareil pour caractériser une structure de surface
FI20075975L (fi) * 2007-12-31 2009-07-01 Metso Automation Oy Rainan mittaus
DE112010004153B4 (de) * 2009-10-27 2017-04-27 Keylex Corp. Vorrichtung zur inspektion von elektroden zum punktschweissen
DE102012205181B4 (de) * 2012-03-30 2015-09-24 Carl Zeiss Smt Gmbh Messvorrichtung zum Vermessen einer Beleuchtungseigenschaft
WO2014118935A1 (fr) * 2013-01-31 2014-08-07 株式会社ニレコ Dispositif de mesure de la rugosité de surface et procédé de mesure de la rugosité de surface
EP3007421B1 (fr) * 2014-10-08 2020-06-03 Canon Production Printing Netherlands B.V. Procédé de détection de défaut dans un système d'impression et système d'impression
CN106154721B (zh) * 2015-04-27 2021-01-01 中兴通讯股份有限公司 一种测距方法、自动调焦方法及装置
JP6657794B2 (ja) * 2015-10-30 2020-03-04 大日本印刷株式会社 光拡散度測定装置及び光拡散度測定方法
CN106123804A (zh) * 2016-06-18 2016-11-16 上海大学 便携式全自动连续变焦显微图像测量装置
ES2738204A1 (es) * 2018-07-18 2020-01-20 Gonzalez Asier Miguel Elejoste Rugosimetro sin contacto y metodo para la medicion de rugosidad

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3020044A1 (de) * 1980-05-24 1981-12-10 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Geraet und verfahren zur beruehrungslosen pruefung der oberflaechenguete und zur messung der oberflaechenrauheit
DE3614646A1 (de) * 1986-04-30 1987-11-05 Grude Elektronik Gmbh Verfahren zur vermessung von vertiefungen in oberflaechen, insbesondere des volumens von gravurnaepfchen in druckflaechen
US4770536A (en) 1986-12-04 1988-09-13 Moshe Golberstein Reflective photometry instrument
US4878114A (en) 1988-05-10 1989-10-31 University Of Windsor Method and apparatus for assessing surface roughness
US4945253A (en) 1988-12-09 1990-07-31 Measurex Corporation Means of enhancing the sensitivity of a gloss sensor
US5293216A (en) 1990-12-31 1994-03-08 Texas Instruments Incorporated Sensor for semiconductor device manufacturing process control
US5204734A (en) * 1991-06-12 1993-04-20 Wyko Corporation Rough surface profiler and method
US5162660A (en) 1991-06-27 1992-11-10 Macmillan Bloedel Limited Paper roughness or glass sensor using polarized light reflection
US5477332A (en) * 1992-12-17 1995-12-19 Mcdonnell Douglas Corporation Digital image system and method for determining surface reflective and refractive characteristics of objects
JP3517903B2 (ja) * 1993-06-21 2004-04-12 株式会社ニコン 干渉計
DE19528513A1 (de) * 1995-08-03 1997-02-06 Haeusler Gerd Verfahren zur berührungslosen, schnellen und genauen Erfassung der Oberflächengestalt von Objekten
GB9705105D0 (en) * 1997-03-12 1997-04-30 Brown & Sharpe Limited Optical surface measurement apparatus and methods
JPH10267636A (ja) * 1997-03-28 1998-10-09 New Kurieishiyon:Kk 表面検査方法および表面検査装置
JP4105256B2 (ja) * 1997-07-29 2008-06-25 株式会社ナノシステムソリューションズ 光照射装置及び表面検査装置
DE19733775A1 (de) * 1997-08-05 1999-02-18 Honeywell Ag Verfahren zur Messung von Eigenschaften einer Materialoberfläche

Also Published As

Publication number Publication date
US6549286B2 (en) 2003-04-15
WO2000068638A1 (fr) 2000-11-16
CA2373674A1 (fr) 2000-11-16
US20020113975A1 (en) 2002-08-22
JP2002544497A (ja) 2002-12-24
EP1194735A1 (fr) 2002-04-10
AU4408800A (en) 2000-11-21

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Legal Events

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