DE69816115D1 - Oberflächenmessapparat - Google Patents

Oberflächenmessapparat

Info

Publication number
DE69816115D1
DE69816115D1 DE69816115T DE69816115T DE69816115D1 DE 69816115 D1 DE69816115 D1 DE 69816115D1 DE 69816115 T DE69816115 T DE 69816115T DE 69816115 T DE69816115 T DE 69816115T DE 69816115 D1 DE69816115 D1 DE 69816115D1
Authority
DE
Germany
Prior art keywords
measuring apparatus
surface measuring
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69816115T
Other languages
English (en)
Other versions
DE69816115T2 (de
Inventor
Ian Hopkins
Keith Hall
Anthony Smith
Dipak Daudia
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Taylor Hobson Ltd
Original Assignee
Taylor Hobson Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taylor Hobson Ltd filed Critical Taylor Hobson Ltd
Application granted granted Critical
Publication of DE69816115D1 publication Critical patent/DE69816115D1/de
Publication of DE69816115T2 publication Critical patent/DE69816115T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
DE69816115T 1997-12-04 1998-12-03 Oberflächenmessapparat Expired - Fee Related DE69816115T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB9725779 1997-12-04
GB9725779A GB2332056B (en) 1997-12-04 1997-12-04 Surface measuring apparatus
PCT/GB1998/003614 WO1999028703A1 (en) 1997-12-04 1998-12-03 Surface measuring apparatus

Publications (2)

Publication Number Publication Date
DE69816115D1 true DE69816115D1 (de) 2003-08-07
DE69816115T2 DE69816115T2 (de) 2004-06-03

Family

ID=10823171

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69816115T Expired - Fee Related DE69816115T2 (de) 1997-12-04 1998-12-03 Oberflächenmessapparat

Country Status (5)

Country Link
US (1) US6344656B1 (de)
EP (1) EP1036300B1 (de)
DE (1) DE69816115T2 (de)
GB (1) GB2332056B (de)
WO (1) WO1999028703A1 (de)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ATE284017T1 (de) * 1999-06-10 2004-12-15 Mpt Praez Steile Gmbh Mittweid Vorrichtung zur berührungslosen dreidimensionalen vermessung von körpern und verfahren zur bestimmung eines koordinatensystems für messpunktkoordinaten
US7030365B2 (en) * 2004-04-15 2006-04-18 Eaton Corporation Emitter-detector assembly for a reflex photoelectric object detection system
US7077258B2 (en) * 2004-04-23 2006-07-18 Graham Packaging Company, Lp Modular low friction spindle assembly
JP4423168B2 (ja) * 2004-11-02 2010-03-03 株式会社ミツトヨ 表面性状測定装置
GB2422015B (en) * 2005-02-01 2007-02-28 Taylor Hobson Ltd A metrological instrument
GB0508388D0 (en) 2005-04-26 2005-06-01 Renishaw Plc Surface sensing device with optical sensor
CN1924519B (zh) * 2005-09-02 2011-11-30 鸿富锦精密工业（深圳）有限公司 多点量测系统及方法
TWM300585U (en) * 2005-12-12 2006-11-11 Kuo-Shen Wu Stylus for key duplicating machine with replaceable segmented stylus
US7578178B2 (en) * 2007-09-28 2009-08-25 United Technologies Corporation Method of inspecting turbine internal cooling features using non-contact scanners
US8536471B2 (en) 2008-08-25 2013-09-17 N-Trig Ltd. Pressure sensitive stylus for a digitizer
GB0821015D0 (en) * 2008-11-18 2008-12-24 Univ Cranfield Apparatus and method
JP5528038B2 (ja) 2009-09-15 2014-06-25 株式会社ミツトヨ 形状測定装置
GB2474893A (en) * 2009-10-30 2011-05-04 Taylor Hobson Ltd Surface measurement instrument and method
EP2627969A1 (de) * 2010-10-12 2013-08-21 Stephen James Crampton Schwebender koordinatenmessmaschine
WO2012123951A2 (en) 2011-03-17 2012-09-20 N-Trig Ltd. Interacting tips for a digitizer stylus
CN103292732B (zh) * 2013-05-20 2016-05-25 华中科技大学 一种可伸缩式的大型自由曲面在机测量装置
US20140373648A1 (en) * 2013-06-19 2014-12-25 Natasa Stambuk Cvitanovic System and method for automatic recording of a plurality of measurements and verification of specimens in rock mechanics
US9513721B2 (en) 2013-09-12 2016-12-06 Microsoft Technology Licensing, Llc Pressure sensitive stylus for a digitizer
US9746447B2 (en) * 2014-10-30 2017-08-29 The Boeing Company Apparatuses, systems, and methods for inspecting a component
US9664652B2 (en) 2014-10-30 2017-05-30 The Boeing Company Non-destructive ultrasonic inspection apparatus, systems, and methods
US9874951B2 (en) 2014-11-03 2018-01-23 Microsoft Technology Licensing, Llc Stylus for operating a digitizer system
CN104374320A (zh) * 2014-11-21 2015-02-25 苏州赛腾精密电子有限公司 圆周量测仪
CN104482910A (zh) * 2014-12-15 2015-04-01 苏州赛硕软件有限公司 一种x2b量测设备
CN105091751A (zh) * 2015-08-10 2015-11-25 苏州优谱德精密仪器科技有限公司 一种光电检测装置
US9740312B2 (en) 2015-09-09 2017-08-22 Microsoft Technology Licensing, Llc Pressure sensitive stylus
US9841828B2 (en) 2016-04-20 2017-12-12 Microsoft Technology Licensing, Llc Pressure sensitive stylus
US10318022B2 (en) 2017-01-30 2019-06-11 Microsoft Technology Licensing, Llc Pressure sensitive stylus
CN107796321B (zh) * 2017-12-04 2024-04-19 岭南师范学院 一种气缸内径检测设备
GB2582375B (en) * 2019-03-22 2022-07-06 Taylor Hobson Ltd Metrological apparatus and method of manufacture
CN110715943B (zh) * 2019-10-21 2023-10-24 怀化建南机器厂有限公司 一种电表电源板加工的自动化流转加工装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH609149A5 (de) * 1975-10-23 1979-02-15 Heidenhain Gmbh Dr Johannes
JPS5558401A (en) 1978-10-26 1980-05-01 Mitsutoyo Mfg Co Ltd Shape measuring instrument
EP0084144B1 (de) * 1982-01-15 1988-09-21 Firma Carl Zeiss Dreidimensionale interferometrische Längenmesseinrichtung
FR2531205A1 (fr) * 1982-07-29 1984-02-03 Commissariat Energie Atomique Dispositif de palpage a laser pour controle dimensionnel
DE3419546C2 (de) * 1984-05-25 1986-07-10 Daimler-Benz Ag, 7000 Stuttgart Einrichtung zur Ermittlung der Schwerpunktlage eines Prüfkörpers
GB8605324D0 (en) * 1986-03-04 1986-04-09 Rank Taylor Hobson Ltd Metrological apparatus
JPS63229251A (ja) * 1987-03-13 1988-09-26 Kitamura Mach Co Ltd 加工ずみワ−クの形状測定方法
JPH01132076U (de) 1988-03-04 1989-09-07
JPH07104146B2 (ja) * 1989-08-29 1995-11-13 株式会社ミツトヨ 座標測定用プローブの回転テーブル倣い制御方法
US5121550A (en) * 1990-12-03 1992-06-16 Gerber Optial, Inc. Automatic surface tracer
US5291662A (en) 1991-09-30 1994-03-08 Mitutoyo Corporation Simple three-dimensional measuring machine
US5304773A (en) * 1992-02-19 1994-04-19 Trumpf Inc. Laser work station with optical sensor for calibration of guidance system
JPH07181022A (ja) 1993-12-22 1995-07-18 Nikon Corp ３次元形状測定装置
GB2306654A (en) * 1995-10-31 1997-05-07 Rank Taylor Hobson Ltd Surface measuring apparatus

Also Published As

Publication number Publication date
GB2332056A9 (en)
DE69816115T2 (de) 2004-06-03
GB9725779D0 (en) 1998-02-04
GB2332056B (en) 2000-08-09
WO1999028703A1 (en) 1999-06-10
GB2332056A (en) 1999-06-09
US6344656B1 (en) 2002-02-05
EP1036300A1 (de) 2000-09-20
EP1036300B1 (de) 2003-07-02

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee