FI98247B - Menetelmä ja laite massan tiheysjakauman määrittämiseksi - Google Patents

Menetelmä ja laite massan tiheysjakauman määrittämiseksi

Info

Publication number
FI98247B
FI98247B FI901651A FI901651A FI98247B FI 98247 B FI98247 B FI 98247B FI 901651 A FI901651 A FI 901651A FI 901651 A FI901651 A FI 901651A FI 98247 B FI98247 B FI 98247B
Authority
FI
Finland
Prior art keywords
pulp density
determining pulp
determining
density
pulp
Prior art date
Application number
FI901651A
Other languages
English (en)
Swedish (sv)
Other versions
FI901651A0 (fi
FI98247C (fi
Inventor
Philip Luner
Hiroshi Tomimasu
Original Assignee
Univ New York State Res Found
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ New York State Res Found filed Critical Univ New York State Res Found
Publication of FI901651A0 publication Critical patent/FI901651A0/fi
Publication of FI98247B publication Critical patent/FI98247B/fi
Application granted granted Critical
Publication of FI98247C publication Critical patent/FI98247C/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FI901651A 1989-04-17 1990-04-02 Menetelmä ja laite massan tiheysjakauman määrittämiseksi FI98247C (fi)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/339,211 US4975578A (en) 1989-04-17 1989-04-17 Method and apparatus for determining distribution of mass density
US33921189 1989-04-17

Publications (3)

Publication Number Publication Date
FI901651A0 FI901651A0 (fi) 1990-04-02
FI98247B true FI98247B (fi) 1997-01-31
FI98247C FI98247C (fi) 1997-05-12

Family

ID=23327991

Family Applications (1)

Application Number Title Priority Date Filing Date
FI901651A FI98247C (fi) 1989-04-17 1990-04-02 Menetelmä ja laite massan tiheysjakauman määrittämiseksi

Country Status (5)

Country Link
US (1) US4975578A (fi)
EP (1) EP0393305A3 (fi)
JP (1) JPH0663959B2 (fi)
CA (1) CA2005407C (fi)
FI (1) FI98247C (fi)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5552602A (en) * 1991-05-15 1996-09-03 Hitachi, Ltd. Electron microscope
US5866905A (en) * 1991-05-15 1999-02-02 Hitachi, Ltd. Electron microscope
NL9500131A (nl) * 1995-01-25 1996-09-02 Pulsarr Ind Research B V Werkwijze en inrichting voor het bepalen van de massaverdeling van een produkt.
US5714697A (en) * 1996-06-19 1998-02-03 Xerox Corporation Sheet materials mass measuring system
US6365897B1 (en) 1997-12-18 2002-04-02 Nikon Corporation Electron beam type inspection device and method of making same
SE525320C2 (sv) * 2003-06-06 2005-02-01 More Res Oernskoeldsvik Ab Förfarande och apparatur för bedömning/mätning av ytviktsvariation hos arkmaterial
DE102004011387B4 (de) 2004-03-05 2010-04-29 L.U.M. Gmbh Verfahren und Vorrichtung zur Charakterisierung von multiplen Proben einer Dispersion
FR2868538B1 (fr) * 2004-04-06 2006-05-26 Commissariat Energie Atomique Procede et systeme de determination de la masse volumique et des caracteristiques dimensionnelles d'un objet, et application au controle des pastilles de combustible nucleaire en cours de fabrication
CN104098699A (zh) * 2006-08-18 2014-10-15 诺华有限公司 Prlr特异性抗体及其用途
JP4919115B2 (ja) * 2009-09-24 2012-04-18 横河電機株式会社 放射線検査装置
JP5936484B2 (ja) * 2012-08-20 2016-06-22 株式会社日立ハイテクノロジーズ 荷電粒子線装置及び試料観察方法
JP6118898B2 (ja) * 2013-05-30 2017-04-19 株式会社日立ハイテクノロジーズ 荷電粒子線装置、試料観察方法
AT518486B1 (de) * 2016-03-24 2018-04-15 Koenig Maschinen Gmbh Verfahren zur Messung der Massenverteilung
CN106501287B (zh) * 2016-10-31 2019-08-27 重庆大学 可模拟不同环境的岩盐损伤自愈合区域测试分析方法

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1991599A (en) * 1933-12-01 1935-02-19 Paper Patents Co Paper inspection process and apparatus
US2582981A (en) * 1949-06-16 1952-01-22 Fua Frederic Albert Method and apparatus for the employment of radiation from radioactive material in gauging
US3413192A (en) * 1965-06-14 1968-11-26 St Regis Paper Co Automatic measuring and control apparatus for forming sheet material
US3489901A (en) * 1965-12-27 1970-01-13 Industrial Nucleonics Corp Method and apparatus for radiation measuring the mass of material having a spatially non-uniform mass distribution
GB1271438A (en) 1969-01-17 1972-04-19 Measurex Corp Basis weight gauging method
JPS521869B2 (fi) * 1972-07-11 1977-01-18
US3860820A (en) * 1973-05-29 1975-01-14 Fmc Corp Film thickness measuring method and apparatus
US4024394A (en) * 1973-06-22 1977-05-17 Hauni-Werke Korber & Co., Kg Method and apparatus for measuring and regulating the density of rod-like fillers consisting of tobacco or the like
US4038543A (en) * 1975-07-08 1977-07-26 Siemens Aktiengesellschaft Scanning transmission electron microscope including an improved image detector
JPS5330865A (en) * 1976-09-03 1978-03-23 Hitachi Ltd Electron microscope provided with sample irradiating electron beam quantity measuring unit
GB1593173A (en) * 1976-12-10 1981-07-15 Hoechst Ag Apparatus for indicating the moisture content of sheetlike samples
DE3008404C2 (de) * 1980-03-05 1984-07-19 Helmut 8046 Garching Formanek Verfahren und Einrichtung zum Erzeugen von Elektronenstrahl-Beugungsbildern
JPS56165255A (en) * 1980-05-26 1981-12-18 Hitachi Ltd Image indicating method for transmission scan electron microscope
FR2568012B1 (fr) * 1984-07-17 1986-10-31 Centre Tech Ind Papier Appareil pour mesurer l'etat de formation d'une feuille de papier
US4634868A (en) * 1984-12-17 1987-01-06 Ford Aerospace & Communications Corporation Non-destructive testing by stimulated electron emission capture
CA1222319A (en) * 1985-05-16 1987-05-26 Cip Inc. Apparatus for analysing the formation of a paper web
JPH0658331B2 (ja) * 1985-11-26 1994-08-03 株式会社ダイポ−ル 平面状材料の物性量測定装置
JPS62245941A (ja) 1986-04-19 1987-10-27 Fuji Photo Film Co Ltd 密度測定法
US4831255A (en) * 1988-02-24 1989-05-16 Gatan, Inc. Variable-attenuation parallel detector

Also Published As

Publication number Publication date
EP0393305A3 (en) 1991-10-02
FI901651A0 (fi) 1990-04-02
US4975578A (en) 1990-12-04
FI98247C (fi) 1997-05-12
EP0393305A2 (en) 1990-10-24
CA2005407C (en) 1994-07-26
JPH02293645A (ja) 1990-12-04
CA2005407A1 (en) 1990-10-17
JPH0663959B2 (ja) 1994-08-22

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Legal Events

Date Code Title Description
BB Publication of examined application
MM Patent lapsed
MM Patent lapsed

Owner name: THE RESEARCH FOUNDATION OF STATE