FI933333A - Metod foer paovisning av fraemmande substanser i ett flytande aemne - Google Patents

Metod foer paovisning av fraemmande substanser i ett flytande aemne Download PDF

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Publication number
FI933333A
FI933333A FI933333A FI933333A FI933333A FI 933333 A FI933333 A FI 933333A FI 933333 A FI933333 A FI 933333A FI 933333 A FI933333 A FI 933333A FI 933333 A FI933333 A FI 933333A
Authority
FI
Finland
Prior art keywords
aemne
flytande
framework
substances
aemne flytande
Prior art date
Application number
FI933333A
Other languages
English (en)
Other versions
FI109836B (fi
FI933333A0 (fi
Inventor
Akio Konda
Hiroyuki Konaka
Makoto Yamashita
Norio Yasuoka
Shigeru Kato
Toshio Kometani
Original Assignee
Sumitomo Electric Industries
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries filed Critical Sumitomo Electric Industries
Publication of FI933333A0 publication Critical patent/FI933333A0/fi
Publication of FI933333A publication Critical patent/FI933333A/fi
Application granted granted Critical
Publication of FI109836B publication Critical patent/FI109836B/fi

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10Investigating individual particles
    • G01N15/14Optical investigation techniques, e.g. flow cytometry
    • G01N15/1456Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals
    • G01N15/1459Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals the analysis being performed on a sample stream
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10Investigating individual particles
    • G01N15/14Optical investigation techniques, e.g. flow cytometry
    • G01N15/1429Signal processing
    • G01N15/1433Signal processing using image recognition
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/94Investigating contamination, e.g. dust
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10Investigating individual particles
    • G01N15/14Optical investigation techniques, e.g. flow cytometry
    • G01N15/1434Optical arrangements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G01N2021/889Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a bare video image, i.e. without visual measurement aids
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features

Landscapes

  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Dispersion Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Extrusion Moulding Of Plastics Or The Like (AREA)
FI933333A 1992-07-24 1993-07-23 Menetelmä vieraiden aineiden toteamiseksi virtaavasta aineesta FI109836B (fi)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP21823092 1992-07-24
JP21823092 1992-07-24
JP19545993 1993-07-12
JP5195459A JPH0688786A (ja) 1992-07-24 1993-07-12 流体中の微小異物検査方法

Publications (3)

Publication Number Publication Date
FI933333A0 FI933333A0 (fi) 1993-07-23
FI933333A true FI933333A (fi) 1994-01-25
FI109836B FI109836B (fi) 2002-10-15

Family

ID=26509122

Family Applications (1)

Application Number Title Priority Date Filing Date
FI933333A FI109836B (fi) 1992-07-24 1993-07-23 Menetelmä vieraiden aineiden toteamiseksi virtaavasta aineesta

Country Status (7)

Country Link
EP (1) EP0582865B1 (fi)
JP (1) JPH0688786A (fi)
CA (1) CA2101209C (fi)
DE (1) DE69314569T2 (fi)
DK (1) DK0582865T3 (fi)
FI (1) FI109836B (fi)
NO (1) NO315586B1 (fi)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2806289B2 (ja) * 1994-04-04 1998-09-30 住友電気工業株式会社 押出機ヘッドにおける樹脂中異物検出装置
JP4594810B2 (ja) * 2005-06-27 2010-12-08 三井造船株式会社 試料液中粒子の位置制御方法および粒子測定装置
JP2007071794A (ja) * 2005-09-09 2007-03-22 Rion Co Ltd 粒子検出器
DE102009030688A1 (de) * 2009-06-26 2010-12-30 Carl Zeiss Ag Mikroskopische Detektion von Objekten in einem Fluidstrom

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62168033A (ja) * 1986-01-18 1987-07-24 Canon Inc 粒子解析装置
US5041733A (en) * 1987-03-20 1991-08-20 Agency Of Industrial Science & Technology Method and apparatus for identifying chromosomes or cells
DE3832901A1 (de) * 1987-10-02 1989-04-20 Hitachi Ltd Teilchenmessvorrichtung
US4858085A (en) * 1988-04-21 1989-08-15 Kohorn H Von Illuminating system
GB8927742D0 (en) * 1989-12-07 1990-02-07 Diatec A S Process and apparatus
EP0446692A1 (de) * 1990-03-15 1991-09-18 Eta Ingenieurgesellschaft Für Energietechnik Und Energieanwendung Mbh Beleuchtungsvorrichtung mit Lichtleitern, insbesondere für Kühlräume und explosionsgeschützte Räume
AU2761392A (en) * 1991-10-08 1993-05-03 Beckman Instruments, Inc. Detecting a radiation signal

Also Published As

Publication number Publication date
CA2101209A1 (en) 1994-01-25
NO932673D0 (no) 1993-07-23
NO932673L (no) 1994-01-25
FI109836B (fi) 2002-10-15
DE69314569D1 (de) 1997-11-20
CA2101209C (en) 1998-05-19
JPH0688786A (ja) 1994-03-29
DE69314569T2 (de) 1998-05-28
FI933333A0 (fi) 1993-07-23
EP0582865B1 (en) 1997-10-15
NO315586B1 (no) 2003-09-22
DK0582865T3 (da) 1998-04-20
EP0582865A1 (en) 1994-02-16

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Legal Events

Date Code Title Description
MA Patent expired