NO932673L - Fremgangsmaate for detektering av fremmed materiale i stroemmende f luid. - Google Patents

Fremgangsmaate for detektering av fremmed materiale i stroemmende f luid.

Info

Publication number
NO932673L
NO932673L NO932673A NO932673A NO932673L NO 932673 L NO932673 L NO 932673L NO 932673 A NO932673 A NO 932673A NO 932673 A NO932673 A NO 932673A NO 932673 L NO932673 L NO 932673L
Authority
NO
Norway
Prior art keywords
procedure
foreign matter
flowing fluid
detecting foreign
detecting
Prior art date
Application number
NO932673A
Other languages
English (en)
Other versions
NO315586B1 (no
NO932673D0 (no
Inventor
Konda Akio
Hiroyuki Konaka
Makoto Yamashita
Norio Yasuoka
Shigeru Kato
Toshido Kometani
Original Assignee
Sumitomo Electric Industries
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries filed Critical Sumitomo Electric Industries
Publication of NO932673D0 publication Critical patent/NO932673D0/no
Publication of NO932673L publication Critical patent/NO932673L/no
Publication of NO315586B1 publication Critical patent/NO315586B1/no

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Electro-optical investigation, e.g. flow cytometers
    • G01N15/1456—Electro-optical investigation, e.g. flow cytometers without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals
    • G01N15/1459—Electro-optical investigation, e.g. flow cytometers without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals the analysis being performed on a sample stream
    • G01N15/1433—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/94—Investigating contamination, e.g. dust
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Electro-optical investigation, e.g. flow cytometers
    • G01N15/1434—Electro-optical investigation, e.g. flow cytometers using an analyser being characterised by its optical arrangement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G01N2021/889—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a bare video image, i.e. without visual measurement aids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
NO19932673A 1992-07-24 1993-07-23 Fremgangsmåte for detektering av fremmedmaterialer i fluid NO315586B1 (no)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP21823092 1992-07-24
JP5195459A JPH0688786A (ja) 1992-07-24 1993-07-12 流体中の微小異物検査方法

Publications (3)

Publication Number Publication Date
NO932673D0 NO932673D0 (no) 1993-07-23
NO932673L true NO932673L (no) 1994-01-25
NO315586B1 NO315586B1 (no) 2003-09-22

Family

ID=26509122

Family Applications (1)

Application Number Title Priority Date Filing Date
NO19932673A NO315586B1 (no) 1992-07-24 1993-07-23 Fremgangsmåte for detektering av fremmedmaterialer i fluid

Country Status (7)

Country Link
EP (1) EP0582865B1 (no)
JP (1) JPH0688786A (no)
CA (1) CA2101209C (no)
DE (1) DE69314569T2 (no)
DK (1) DK0582865T3 (no)
FI (1) FI109836B (no)
NO (1) NO315586B1 (no)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2806289B2 (ja) * 1994-04-04 1998-09-30 住友電気工業株式会社 押出機ヘッドにおける樹脂中異物検出装置
JP4594810B2 (ja) * 2005-06-27 2010-12-08 三井造船株式会社 試料液中粒子の位置制御方法および粒子測定装置
JP2007071794A (ja) * 2005-09-09 2007-03-22 Rion Co Ltd 粒子検出器
DE102009030688A1 (de) * 2009-06-26 2010-12-30 Carl Zeiss Ag Mikroskopische Detektion von Objekten in einem Fluidstrom

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62168033A (ja) * 1986-01-18 1987-07-24 Canon Inc 粒子解析装置
US5041733A (en) * 1987-03-20 1991-08-20 Agency Of Industrial Science & Technology Method and apparatus for identifying chromosomes or cells
DE3832901A1 (de) * 1987-10-02 1989-04-20 Hitachi Ltd Teilchenmessvorrichtung
US4858085A (en) * 1988-04-21 1989-08-15 Kohorn H Von Illuminating system
GB8927742D0 (en) * 1989-12-07 1990-02-07 Diatec A S Process and apparatus
EP0446692A1 (de) * 1990-03-15 1991-09-18 Eta Ingenieurgesellschaft Für Energietechnik Und Energieanwendung Mbh Beleuchtungsvorrichtung mit Lichtleitern, insbesondere für Kühlräume und explosionsgeschützte Räume
WO1993007471A1 (en) * 1991-10-08 1993-04-15 Beckman Instruments, Inc. Detecting a radiation signal

Also Published As

Publication number Publication date
NO315586B1 (no) 2003-09-22
CA2101209A1 (en) 1994-01-25
NO932673D0 (no) 1993-07-23
JPH0688786A (ja) 1994-03-29
EP0582865B1 (en) 1997-10-15
FI933333A (fi) 1994-01-25
DE69314569T2 (de) 1998-05-28
DK0582865T3 (da) 1998-04-20
EP0582865A1 (en) 1994-02-16
FI933333A0 (fi) 1993-07-23
DE69314569D1 (de) 1997-11-20
CA2101209C (en) 1998-05-19
FI109836B (fi) 2002-10-15

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