FI20075975A0 - Mätning av en bana - Google Patents

Mätning av en bana

Info

Publication number
FI20075975A0
FI20075975A0 FI20075975A FI20075975A FI20075975A0 FI 20075975 A0 FI20075975 A0 FI 20075975A0 FI 20075975 A FI20075975 A FI 20075975A FI 20075975 A FI20075975 A FI 20075975A FI 20075975 A0 FI20075975 A0 FI 20075975A0
Authority
FI
Finland
Prior art keywords
web
measurement
Prior art date
Application number
FI20075975A
Other languages
English (en)
Finnish (fi)
Other versions
FI20075975L (sv
Inventor
Marko Avikainen
Petri Niemi
Heikki Kettunen
Markku Maentylae
Heimo Keraenen
Original Assignee
Metso Automation Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Metso Automation Oy filed Critical Metso Automation Oy
Priority to FI20075975A priority Critical patent/FI20075975L/sv
Publication of FI20075975A0 publication Critical patent/FI20075975A0/sv
Priority to US12/810,365 priority patent/US8444821B2/en
Priority to PCT/FI2008/050793 priority patent/WO2009083655A1/en
Priority to EP08868623.3A priority patent/EP2232247A4/en
Publication of FI20075975L publication Critical patent/FI20075975L/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2522—Projection by scanning of the object the position of the object changing and being recorded
    • D—TEXTILES; PAPER
    • D21—PAPER-MAKING; PRODUCTION OF CELLULOSE
    • D21F—PAPER-MAKING MACHINES; METHODS OF PRODUCING PAPER THEREON
    • D21F7/00—Other details of machines for making continuous webs of paper
    • D21F7/06—Indicating or regulating the thickness of the layer; Signal devices
    • D—TEXTILES; PAPER
    • D21—PAPER-MAKING; PRODUCTION OF CELLULOSE
    • D21G—CALENDERS; ACCESSORIES FOR PAPER-MAKING MACHINES
    • D21G9/00—Other accessories for paper-making machines
    • D21G9/0009—Paper-making control systems
    • D21G9/0027—Paper-making control systems controlling the forming section
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2509—Color coding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G01N2021/8663—Paper, e.g. gloss, moisture content
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30124—Fabrics; Textile; Paper

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Textile Engineering (AREA)
  • Paper (AREA)
FI20075975A 2007-12-31 2007-12-31 Mätning av en bana FI20075975L (sv)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FI20075975A FI20075975L (sv) 2007-12-31 2007-12-31 Mätning av en bana
US12/810,365 US8444821B2 (en) 2007-12-31 2008-12-30 Measuring of web
PCT/FI2008/050793 WO2009083655A1 (en) 2007-12-31 2008-12-30 Measuring of web
EP08868623.3A EP2232247A4 (en) 2007-12-31 2008-12-30 BAND MEASUREMENT CONTINUES

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20075975A FI20075975L (sv) 2007-12-31 2007-12-31 Mätning av en bana

Publications (2)

Publication Number Publication Date
FI20075975A0 true FI20075975A0 (sv) 2007-12-31
FI20075975L FI20075975L (sv) 2009-07-01

Family

ID=38951670

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20075975A FI20075975L (sv) 2007-12-31 2007-12-31 Mätning av en bana

Country Status (4)

Country Link
US (1) US8444821B2 (sv)
EP (1) EP2232247A4 (sv)
FI (1) FI20075975L (sv)
WO (1) WO2009083655A1 (sv)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI20075975L (sv) * 2007-12-31 2009-07-01 Metso Automation Oy Mätning av en bana
EP2384423B1 (en) * 2009-01-30 2015-02-25 Siemens Aktiengesellschaft Measurement of vibration characteristics of an object
DE102009038965A1 (de) * 2009-08-20 2011-03-03 Carl Zeiss Oim Gmbh Vorrichtung und Verfahren zum optischen Inspizieren einer Oberfläche an einem Gegenstand
EP2375227A1 (en) * 2010-04-09 2011-10-12 Siemens Aktiengesellschaft Measurement of three-dimensional motion characteristics
WO2012098287A1 (en) * 2011-01-19 2012-07-26 Teknologian Tutkimuskeskus Vtt Method and system for determining particle size information
EP2500687A3 (en) * 2011-03-14 2013-02-20 Heliotis SA Structured light projector
DE102013111761B4 (de) * 2013-10-25 2018-02-15 Gerhard Schubert Gmbh Verfahren und Scanner zum berührungslosen Ermitteln der Position und dreidimensionalen Form von Produkten auf einer laufenden Fläche
ES2942266T3 (es) 2013-12-27 2023-05-31 Jfe Steel Corp Método de detección de defectos de superficie y dispositivo de detección de defectos de superficie
CN107735673A (zh) * 2015-06-25 2018-02-23 杰富意钢铁株式会社 表面缺陷检测方法、表面缺陷检测装置及钢材的制造方法
EP3315950A4 (en) * 2015-06-25 2018-12-19 JFE Steel Corporation Surface flaw detection device, surface flaw detection method, and manufacturing method for steel material
DE102016220759A1 (de) * 2016-10-21 2018-04-26 Texmag Gmbh Vertriebsgesellschaft Verfahren und Vorrichtung zur Kompensation eines Materialbahnversatzes bei der Materialbahninspektion
KR102046229B1 (ko) * 2016-12-22 2019-11-18 주식회사 포스코 이송되는 원료의 입도 및 건습 측정 장치 및 혼합 원료의 입도 측정 장치
CN106998420B (zh) * 2017-05-23 2019-07-30 橄享成都科技有限责任公司 农业种植用环境监测装置
US20200371040A1 (en) * 2019-05-21 2020-11-26 Industrial Maintenance Engineering, Inc. d/b/a AIS Gauging Static full width measurement system
SE543802C2 (en) * 2019-12-20 2021-07-27 Stora Enso Oyj Method for determining film thickness, method for producing a film and device for producing a film

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CH552197A (de) * 1972-11-24 1974-07-31 Bbc Brown Boveri & Cie Einrichtung zum messen der rauhigkeit einer oberflaeche.
US4092068A (en) * 1976-05-05 1978-05-30 Domtar Inc. Surface sensor
JPS54151067A (en) * 1978-05-19 1979-11-27 Oki Electric Ind Co Ltd Ultrasonic sounding and measuring system of water bottom and topography
US4349277A (en) * 1980-06-11 1982-09-14 General Electric Company Non-contact measurement of surface profile
EP0076866B1 (de) * 1981-10-09 1985-05-02 Ibm Deutschland Gmbh Interpolierendes Lichtschnitt-Verfahren
US4490618A (en) * 1982-04-12 1984-12-25 Canadian Patents & Development Limited Optical system for analyzing the surface of a fibrous web
US5365084A (en) * 1991-02-20 1994-11-15 Pressco Technology, Inc. Video inspection system employing multiple spectrum LED illumination
CA2112792A1 (en) * 1993-01-29 1994-07-30 Donald F. Rogowski Paper surface roughness analyzer
US5684707A (en) * 1994-10-03 1997-11-04 Westvaco Corporation Apparatus and method for analyzing paper surface topography
US5608527A (en) * 1995-03-08 1997-03-04 Optical Dimensions, Llc Apparatus and method for dynamic measurement of surface roughness
US5654799A (en) * 1995-05-05 1997-08-05 Measurex Corporation Method and apparatus for measuring and controlling the surface characteristics of sheet materials such as paper
FI112975B (sv) * 1997-09-15 2004-02-13 Metso Automation Oy Förfarande och anordning för mätning av kvalitetsegenskaper hos papper från en rörlig pappersbana vid en pappersmaskin
US20030132387A1 (en) * 1998-02-12 2003-07-17 Metso Paper Automation Oy Method and device for measuring the amount of coating on a moving substrate
US6252623B1 (en) 1998-05-15 2001-06-26 3Dmetrics, Incorporated Three dimensional imaging system
FI991071A0 (sv) * 1999-05-10 1999-05-10 Valmet Automation Inc Förfarande och mätningsarrangemang för att mäta pappersyta
FI20000032A0 (sv) 2000-01-07 2000-01-07 Spectra Physics Visiontech Oy Arrangemang och förfarande för att undersöka ytan
FI115856B (sv) * 2000-02-10 2005-07-29 Metso Automation Oy Förfarande och anordning för mätning av beläggning
FI20001568A (sv) 2000-06-30 2001-12-31 Thermo Radiometrie Oy Bestämning av en ytas former
US6477892B1 (en) * 2000-08-15 2002-11-12 Hewlett-Packard Company Methods and systems for ascertaining the roughness of a print media surface
DE10063293A1 (de) * 2000-12-19 2002-07-04 Fraunhofer Ges Forschung Verfahren und Vorrichtung zur mehrkanaligen Inspektion von Oberflächen im Durchlauf
FI121240B (sv) * 2001-03-23 2010-08-31 Metso Paper Automation Oy Arrangemang vid en pappersmaskin samt en blãslãda
US6701637B2 (en) 2001-04-20 2004-03-09 Kimberly-Clark Worldwide, Inc. Systems for tissue dried with metal bands
DE10122313A1 (de) * 2001-05-08 2002-11-21 Wolfgang P Weinhold Verfahren und Vorrichtung zur berührungsfreien Untersuchung eines Gegenstandes, insbesondere hinsichtlich dessen Oberflächengestalt
JP3884321B2 (ja) * 2001-06-26 2007-02-21 オリンパス株式会社 ３次元情報取得装置、３次元情報取得における投影パターン、及び、３次元情報取得方法
DE10151332B4 (de) * 2001-10-22 2007-12-06 Jenoptik Surface Inspection Gmbh Vorrichtung zur optischen Messung von Oberflächeneigenschaften
FI20021973A (sv) * 2002-11-05 2004-05-06 Sr Instr Oy Synkront optiskt mät- och kontrollförfarande och därtill avsedd anordning
CA2537846C (en) * 2003-09-16 2012-05-01 Paper Australia Pty Ltd. Sheet-surface analyser and method of analysing a sheet-surface
CN101287960A (zh) * 2004-10-13 2008-10-15 阿克罗米特里克斯有限责任公司 测量连续移动样品的样品表面平整度的系统与方法
US20060232790A1 (en) * 2005-04-18 2006-10-19 Lee Chase Confocal measurement method and apparatus in a paper machine
FI119260B (sv) * 2006-03-10 2008-09-15 Metso Automation Oy Förfarande för kalibrering av en mätanläggning och mätanläggning
FI119259B (sv) * 2006-10-18 2008-09-15 Valtion Teknillinen Bestämning av yta och tjocklek
FI122156B (sv) * 2007-03-13 2011-09-15 Metso Automation Oy Mätning av bana
CA2884632C (en) * 2007-08-31 2016-10-25 Abb Ltd. Web thickness measurement device
FI121151B (sv) * 2007-11-22 2010-07-30 Valtion Teknillinen Förfarande och anordning för bestämning av topografin och optiska egenskaper hos en rörlig yta
US7690248B2 (en) * 2007-12-18 2010-04-06 Xerox Corporation Measurement of paper stack topography
FI20075975L (sv) * 2007-12-31 2009-07-01 Metso Automation Oy Mätning av en bana

Also Published As

Publication number Publication date
WO2009083655A1 (en) 2009-07-09
EP2232247A1 (en) 2010-09-29
US8444821B2 (en) 2013-05-21
EP2232247A4 (en) 2016-08-10
FI20075975L (sv) 2009-07-01
US20100319866A1 (en) 2010-12-23

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Legal Events

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