CH552197A - Einrichtung zum messen der rauhigkeit einer oberflaeche. - Google Patents

Einrichtung zum messen der rauhigkeit einer oberflaeche.

Info

Publication number
CH552197A
CH552197A CH1707372A CH1707372A CH552197A CH 552197 A CH552197 A CH 552197A CH 1707372 A CH1707372 A CH 1707372A CH 1707372 A CH1707372 A CH 1707372A CH 552197 A CH552197 A CH 552197A
Authority
CH
Switzerland
Prior art keywords
roughness
measuring
Prior art date
Application number
CH1707372A
Other languages
English (en)
Original Assignee
Bbc Brown Boveri & Cie
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bbc Brown Boveri & Cie filed Critical Bbc Brown Boveri & Cie
Priority to CH1707372A priority Critical patent/CH552197A/de
Priority to DE2260090A priority patent/DE2260090C3/de
Priority to CA186,045A priority patent/CA999136A/en
Priority to US416649A priority patent/US3922093A/en
Priority to SE7315695A priority patent/SE391238B/xx
Priority to FI3578/73A priority patent/FI56453C/fi
Priority to FR7341604A priority patent/FR2208107B1/fr
Priority to CS738041A priority patent/CS258452B2/cs
Priority to JP48131621A priority patent/JPS4984462A/ja
Priority to IT7331631A priority patent/IT999470B/it
Priority to GB5424173A priority patent/GB1444780A/en
Publication of CH552197A publication Critical patent/CH552197A/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
CH1707372A 1972-11-24 1972-11-24 Einrichtung zum messen der rauhigkeit einer oberflaeche. CH552197A (de)

Priority Applications (11)

Application Number Priority Date Filing Date Title
CH1707372A CH552197A (de) 1972-11-24 1972-11-24 Einrichtung zum messen der rauhigkeit einer oberflaeche.
DE2260090A DE2260090C3 (de) 1972-11-24 1972-12-08 Photoelektrische Einrichtung zur Bestimmung der Rauhigkeit bzw. Glätte diffusstreuender Oberflächen
CA186,045A CA999136A (en) 1972-11-24 1973-11-16 Device for measuring the roughness of a surface
US416649A US3922093A (en) 1972-11-24 1973-11-16 Device for measuring the roughness of a surface
SE7315695A SE391238B (sv) 1972-11-24 1973-11-20 Sett och anordning for metning av en ytas skrovlighet
FI3578/73A FI56453C (fi) 1972-11-24 1973-11-20 Anordning foer maetning av ytstraevhet
FR7341604A FR2208107B1 (de) 1972-11-24 1973-11-22
CS738041A CS258452B2 (en) 1972-11-24 1973-11-22 Method of diffusion reflective surface's roughness determination and device for its realization
JP48131621A JPS4984462A (de) 1972-11-24 1973-11-22
IT7331631A IT999470B (it) 1972-11-24 1973-11-22 Dispositivo per misurare il grado di ruvidita di una superficie
GB5424173A GB1444780A (en) 1972-11-24 1973-11-22 Method and apparatus for measuring the roughness of a surface

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH1707372A CH552197A (de) 1972-11-24 1972-11-24 Einrichtung zum messen der rauhigkeit einer oberflaeche.

Publications (1)

Publication Number Publication Date
CH552197A true CH552197A (de) 1974-07-31

Family

ID=4422545

Family Applications (1)

Application Number Title Priority Date Filing Date
CH1707372A CH552197A (de) 1972-11-24 1972-11-24 Einrichtung zum messen der rauhigkeit einer oberflaeche.

Country Status (11)

Country Link
US (1) US3922093A (de)
JP (1) JPS4984462A (de)
CA (1) CA999136A (de)
CH (1) CH552197A (de)
CS (1) CS258452B2 (de)
DE (1) DE2260090C3 (de)
FI (1) FI56453C (de)
FR (1) FR2208107B1 (de)
GB (1) GB1444780A (de)
IT (1) IT999470B (de)
SE (1) SE391238B (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0329986A1 (de) * 1988-02-24 1989-08-30 Erwin Sick GmbH Optik-Elektronik Verfahren und Vorrichtung zur optischen Erfassung des Rauheitsprofils einer Materialoberfläche

Families Citing this family (104)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4184082A (en) * 1975-12-08 1980-01-15 Howell Laboratories, Incorporated Linear flaw detector
GB1580196A (en) * 1976-05-27 1980-11-26 Ferranti Ltd Gloss measuring surface inspection systems
GB1576639A (en) * 1976-07-06 1980-10-08 Fairfax & Sons Ltd John Printing plate inspection apparatus
US4072425A (en) * 1976-08-09 1978-02-07 The United States Of America As Represented By The Secretary Of The Army Method of indicating the relative roughness of a surface
GB1592449A (en) * 1976-12-01 1981-07-08 Ferranti Ltd Optical inspection apparatus
US4142107A (en) * 1977-06-30 1979-02-27 International Business Machines Corporation Resist development control system
JPS5483854A (en) * 1977-12-16 1979-07-04 Canon Inc Measuring device
US4373817A (en) * 1978-05-22 1983-02-15 Nanometrics Incorporated Computerized micromeasuring system and method therefor
FR2428238A1 (fr) * 1978-06-07 1980-01-04 Cilas Dispositif pour determiner la qualite du poli des surfaces optiques
US4286293A (en) * 1979-05-30 1981-08-25 Western Electric Company, Inc. Laser scanning and multiple detection for video image processing
SE428250B (sv) * 1979-05-31 1983-06-13 Bert Jonsson Fotoelektrisk anordning for avkenning av foremal
US4334780A (en) * 1979-06-29 1982-06-15 Grumman Aerospace Corporation Optical surface roughness detection method and apparatus
US4465371A (en) * 1979-08-06 1984-08-14 Grumman Aerospace Corporation Optical flaw detection method and apparatus
LU81728A1 (fr) * 1979-09-26 1981-04-17 Centre Rech Metallurgique Procede pour controler la qualite des surfaces revetues ou non
US4329049A (en) * 1980-03-06 1982-05-11 Rodenstock Instruments Corporation Median point detecting apparatus for a lensmeter
US4277803A (en) * 1980-05-12 1981-07-07 Fuji Electric Co., Ltd. Automatic product checking system
US4390277A (en) * 1980-07-31 1983-06-28 Mcdonnell Douglas Corporation Flat sheet scatterometer
DE3037622A1 (de) * 1980-10-04 1982-04-22 Theodor Prof. Dr.-Ing. 1000 Berlin Gast Optoelektronisches messverfahren und einrichtungen zum bestimmen der oberflaechenguete streuend reflektierender oberflaechen
US4376583A (en) * 1981-05-12 1983-03-15 Aeronca Electronics, Inc. Surface inspection scanning system
US4583861A (en) * 1981-08-12 1986-04-22 Tokyo Shibaura Denki Kabushiki Kaisha Surface condition judging apparatus
DD208670A1 (de) * 1982-06-29 1984-04-04 Pentacon Dresden Veb Vorrichtung zur schnellen messung des glanzes beliebiger oberflaechen
FR2531776A1 (fr) * 1982-08-13 1984-02-17 Commissariat Energie Atomique Procede et dispositif de determination sans contact de la rugosite d'une surface
DE8303856U1 (de) * 1983-02-11 1985-11-14 Optische Werke G. Rodenstock, 8000 Muenchen Vorrichtung zur Ermittlung einer Oberflächenstruktur, insbesondere der Rauheit
JPS6052021A (ja) * 1983-08-31 1985-03-23 Canon Inc 位置検出方法
DE3337468A1 (de) * 1983-10-14 1985-04-25 Optische Werke G. Rodenstock, 8000 München Verfahren und vorrichtung zur pruefung der oberflaeche von bauteilen
DE3426332A1 (de) * 1984-07-17 1986-01-30 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optische rauheitssonde mit abtastung der indikatrix
DE3427838C2 (de) * 1984-07-27 1988-09-29 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Rauheitssonde
DE3428435A1 (de) * 1984-08-01 1986-02-06 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Rauheitssonde
US4721389A (en) * 1985-04-18 1988-01-26 Potters Industries, Inc. Method and apparatus for measuring retroreflectivity of a reflective layer on a surface
US4710642A (en) * 1985-08-20 1987-12-01 Mcneil John R Optical scatterometer having improved sensitivity and bandwidth
US4746805A (en) * 1986-11-18 1988-05-24 General Motors Corporation Combined distinctness of image and gloss meter
FR2620823B1 (fr) * 1987-09-17 1990-08-17 Centre Tech Ind Papier Dispositif pour determiner en continu un indice d'etat de surface d'un materiau en feuille en mouvement
DE3814606A1 (de) * 1988-04-29 1989-11-09 Interpane Entw & Beratungsges Verfahren und vorrichtung zur erfassung von strukturen einer oberflaeche eines flaechigen guts
US4925298A (en) * 1988-08-05 1990-05-15 Paolo Dobrilla Etch pit density measuring method
JPH02138805A (ja) * 1988-08-31 1990-05-28 Canon Inc 平滑度測定装置およびこれを備えた記録装置
US4929846A (en) * 1988-10-05 1990-05-29 Ford Motor Company Surface quality analyzer apparatus and method
US5122672A (en) * 1990-09-07 1992-06-16 Ford Motor Company Surface quality analyzer apparatus and method
US5252836A (en) * 1991-03-07 1993-10-12 U.S. Natural Resources, Inc. Reflective grain defect scanning
DE4114671A1 (de) * 1991-05-06 1992-11-12 Hoechst Ag Verfahren und messanordnung zur beruehrungslosen on-line messung
DE4127215C2 (de) * 1991-08-16 2003-07-17 Byk Gardner Gmbh Verfahren und Vorrichtung zur quantifizierten Bewertung des physiologischen Eindruckes von reflektionsfähigen Oberflächen
US5225890A (en) * 1991-10-28 1993-07-06 Gencorp Inc. Surface inspection apparatus and method
WO1993012615A1 (en) * 1991-12-19 1993-06-24 The United States Of America, Represented By The Secretary, United States Department Of Commerce Method and apparatus for assessment of surface smoothness using reflected energy
US5444265A (en) * 1993-02-23 1995-08-22 Lsi Logic Corporation Method and apparatus for detecting defective semiconductor wafers during fabrication thereof
US5474381A (en) * 1993-11-30 1995-12-12 Texas Instruments Incorporated Method for real-time semiconductor wafer temperature measurement based on a surface roughness characteristic of the wafer
WO1995018952A1 (de) * 1994-01-07 1995-07-13 Honeywell Ag Verfahren zur messung der rauhigkeit einer materialoberfläche
DE4408226C2 (de) * 1994-03-11 1997-08-28 Peter Dr Ing Lehmann Meßeinrichtung zur prozeßgekoppelten Bestimmung der Rauheit technischer Oberflächen durch Auswertung di- oder polychromatischer Specklemuster
NZ270892A (en) * 1994-08-24 1997-01-29 Us Natural Resources Detecting lumber defects utilizing optical pattern recognition algorithm
US5608527A (en) * 1995-03-08 1997-03-04 Optical Dimensions, Llc Apparatus and method for dynamic measurement of surface roughness
US5838445A (en) * 1995-06-07 1998-11-17 Micron Technology, Inc. Method and apparatus for determining surface roughness
US5644392A (en) * 1995-09-12 1997-07-01 U.S. Natural Resources, Inc. Scanning system for lumber
DE19725337C1 (de) * 1997-06-16 1998-10-01 Abb Research Ltd Verfahren zur Bestimmung der Oberflächenstruktur einer Körperoberfläche
DE19733775A1 (de) * 1997-08-05 1999-02-18 Honeywell Ag Verfahren zur Messung von Eigenschaften einer Materialoberfläche
DE19817664A1 (de) * 1998-04-21 1999-11-04 Peter Lehmann Verfahren und Vorrichtung zur Rauheitsmessung an technischen Oberflächen bei Beleuchtung mit einem Specklemuster
JP2000090233A (ja) * 1998-09-08 2000-03-31 Olympus Optical Co Ltd 画像処理装置
FI111757B (fi) 1999-05-10 2003-09-15 Metso Automation Oy Menetelmä ja mittausjärjestely mitata paperin pintaa
EP1303866B1 (de) * 2000-07-10 2009-12-09 TEL Epion Inc. Vorrichtung und verfahren zur verbesserung von dünnschichten mittels gas-cluster-ionenstrahlbearbeitung
NZ519475A (en) * 2002-06-11 2004-10-29 Ind Res Ltd Measuring wood properties by optical investigation of tracheid orientations
WO2004097383A1 (en) * 2003-04-29 2004-11-11 Surfoptic Limited Measuring a surface characteristic
US20050012939A1 (en) * 2003-07-15 2005-01-20 Snyder Donald M. Method and apparatus for quantifying the degree of fusion of a layer
DE602004030697D1 (de) * 2003-09-16 2011-02-03 Paper Australia Pty Ltd Blattoberflächen-analysator und verfahren zum analysieren einer blattoberfläche
US7038779B2 (en) * 2003-10-10 2006-05-02 Ethicon Inc. System and method for sensing variations in a strand
US7042575B2 (en) * 2004-05-21 2006-05-09 Silicon Light Machines Corporation Speckle sizing and sensor dimensions in optical positioning device
US7773070B2 (en) 2004-05-21 2010-08-10 Cypress Semiconductor Corporation Optical positioning device using telecentric imaging
US7285766B2 (en) * 2004-05-21 2007-10-23 Silicon Light Machines Corporation Optical positioning device having shaped illumination
US20050258346A1 (en) * 2004-05-21 2005-11-24 Silicon Light Machines Corporation Optical positioning device resistant to speckle fading
US20050259078A1 (en) * 2004-05-21 2005-11-24 Silicon Light Machines Corporation Optical positioning device with multi-row detector array
US20050259097A1 (en) * 2004-05-21 2005-11-24 Silicon Light Machines Corporation Optical positioning device using different combinations of interlaced photosensitive elements
US7268341B2 (en) * 2004-05-21 2007-09-11 Silicon Light Machines Corporation Optical position sensing device including interlaced groups of photosensitive elements
US7138620B2 (en) * 2004-10-29 2006-11-21 Silicon Light Machines Corporation Two-dimensional motion sensor
US7248345B2 (en) * 2004-11-12 2007-07-24 Silicon Light Machines Corporation Signal processing method for use with an optical navigation system
WO2006068746A2 (en) 2004-11-19 2006-06-29 Silicon Light Machines Corporation Dense multi-axis array for motion sensing
WO2006060798A2 (en) * 2004-12-02 2006-06-08 Silicon Light Machines Corporation Signal processing method for optical sensors
CA2594010C (en) * 2004-12-27 2017-01-17 Bc Cancer Agency Surface roughness measurement methods and apparatus
JP3938184B2 (ja) * 2005-03-22 2007-06-27 キヤノン株式会社 情報処理方法及びその装置
CA2628090C (en) * 2005-11-07 2014-10-21 Cardinal Cg Company Method and apparatus for identifying photocatalytic coatings
US7567235B2 (en) 2005-12-12 2009-07-28 Cypress Semiconductor Corporation Self-aligning optical sensor package
US7765251B2 (en) * 2005-12-16 2010-07-27 Cypress Semiconductor Corporation Signal averaging circuit and method for sample averaging
US8471191B2 (en) 2005-12-16 2013-06-25 Cypress Semiconductor Corporation Optical navigation system having a filter-window to seal an enclosure thereof
US7737948B2 (en) * 2005-12-20 2010-06-15 Cypress Semiconductor Corporation Speckle navigation system
US7298460B2 (en) * 2006-01-03 2007-11-20 Silicon Light Machines Corporation Method for determining motion using a velocity predictor
US7884801B1 (en) 2006-02-16 2011-02-08 Cypress Semiconductor Corporation Circuit and method for determining motion with redundant comb-arrays
US7297912B1 (en) 2006-03-27 2007-11-20 Silicon Light Machines Corporation Circuit and method for reducing power consumption in an optical navigation system having redundant arrays
US7721609B2 (en) 2006-03-31 2010-05-25 Cypress Semiconductor Corporation Method and apparatus for sensing the force with which a button is pressed
US7809035B2 (en) * 2006-03-31 2010-10-05 Cypress Semiconductor Corporation Eye-safe laser navigation sensor
US7492445B1 (en) 2006-06-05 2009-02-17 Cypress Semiconductor Corporation Method and apparatus for robust velocity prediction
US7755604B2 (en) 2006-06-19 2010-07-13 Cypress Semiconductor Corporation Optical navigation sensor with tracking and lift detection for optically transparent contact surfaces
US7728816B2 (en) * 2006-07-10 2010-06-01 Cypress Semiconductor Corporation Optical navigation sensor with variable tracking resolution
US7742514B1 (en) 2006-10-31 2010-06-22 Cypress Semiconductor Corporation Laser navigation sensor
US8072429B2 (en) * 2006-12-22 2011-12-06 Cypress Semiconductor Corporation Multi-axial touch-sensor device with multi-touch resolution
US8314774B1 (en) 2007-07-09 2012-11-20 Cypress Semiconductor Corporation Method and apparatus for quasi-3D tracking using 2D optical motion sensors
US8263921B2 (en) 2007-08-06 2012-09-11 Cypress Semiconductor Corporation Processing methods for speckle-based motion sensing
FI20075975L (fi) * 2007-12-31 2009-07-01 Metso Automation Oy Rainan mittaus
US8259069B1 (en) 2008-01-11 2012-09-04 Cypress Semiconductor Corporation Speckle-based optical navigation on curved tracking surface
US8031176B1 (en) 2008-01-22 2011-10-04 Cypress Semiconductor Corporation Optical navigation system using a single-package motion sensor
FI123335B (fi) * 2008-05-20 2013-02-28 Metso Automation Oy Pulssitusvälinein varustettu LED- valaisinmatriisi
US8541727B1 (en) 2008-09-30 2013-09-24 Cypress Semiconductor Corporation Signal monitoring and control system for an optical navigation sensor
US7723659B1 (en) 2008-10-10 2010-05-25 Cypress Semiconductor Corporation System and method for screening semiconductor lasers
US8217334B1 (en) 2008-12-24 2012-07-10 Cypress Semiconductor Corporation Optical navigation sensor including a spatial frequency filter
US8711096B1 (en) 2009-03-27 2014-04-29 Cypress Semiconductor Corporation Dual protocol input device
WO2012173640A1 (en) 2011-06-16 2012-12-20 Cypress Semiconductor Corporaton An optical navigation module with capacitive sensor
US8896553B1 (en) 2011-11-30 2014-11-25 Cypress Semiconductor Corporation Hybrid sensor module
JP6324114B2 (ja) * 2014-02-28 2018-05-16 キヤノン株式会社 光学系および光沢計
JP6324113B2 (ja) 2014-02-28 2018-05-16 キヤノン株式会社 光学系および光沢計
FR3037177B1 (fr) * 2015-06-08 2018-06-01 Commissariat A L'energie Atomique Et Aux Energies Alternatives Procede de traitement d'images avec specularites

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2246501A (en) * 1939-03-01 1941-06-24 Champion Paper & Fibre Co Glossmeter
US2446628A (en) * 1947-03-06 1948-08-10 Eastman Kodak Co Flatness testing apparatus
US2947212A (en) * 1956-04-30 1960-08-02 American Brass Co Method of detecting surface conditions of sheet metal
NL282725A (de) * 1961-09-05
GB1072551A (en) * 1963-05-21 1967-06-21 Pilkington Brothers Ltd Improvements in or relating to the manufacture of flat material
SE347105B (de) * 1968-02-12 1972-07-24 Skf Svenska Kullagerfab Ab
US3591291A (en) * 1969-05-26 1971-07-06 Conductron Corp Method and apparatus for sensing reflected light and diffused light from a surface to indicate the roughness of said surface
US3782827A (en) * 1971-08-04 1974-01-01 Itek Corp Optical device for characterizing the surface or other properties of a sample
US3771880A (en) * 1971-09-29 1973-11-13 Us Navy Roughness analyzer
US3804521A (en) * 1972-02-22 1974-04-16 Itek Corp Optical device for measuring surface roughness
US3790287A (en) * 1972-03-31 1974-02-05 Western Electric Co Surface inspection with scanned focused light beams

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0329986A1 (de) * 1988-02-24 1989-08-30 Erwin Sick GmbH Optik-Elektronik Verfahren und Vorrichtung zur optischen Erfassung des Rauheitsprofils einer Materialoberfläche

Also Published As

Publication number Publication date
US3922093A (en) 1975-11-25
GB1444780A (en) 1976-08-04
JPS4984462A (de) 1974-08-14
SE391238B (sv) 1977-02-07
CS258452B2 (en) 1988-08-16
FR2208107A1 (de) 1974-06-21
DE2260090A1 (de) 1974-05-30
CS804173A2 (en) 1988-01-15
DE2260090C3 (de) 1985-04-04
CA999136A (en) 1976-11-02
FI56453C (fi) 1980-01-10
FI56453B (fi) 1979-09-28
DE2260090B2 (de) 1978-12-21
IT999470B (it) 1976-02-20
FR2208107B1 (de) 1977-03-11

Similar Documents

Publication Publication Date Title
CH552197A (de) Einrichtung zum messen der rauhigkeit einer oberflaeche.
SE403321B (sv) Sett och anordning for att bestemma en ytas geometriska utformning
GB1444566A (en) Measuring of surface roughness
IT1019629B (it) Dispositivo di misura della posi zione e della velocita di un utensile di trivellazione
CH542434A (de) Piezoelektrische Messvorrichtung
SE405089B (sv) Anordning for utovning av ytpressning
SE7405346L (sv) Anordning for bestemning av optimalt uttagbara ytan av en breda.
AT277607B (de) Vorrichtung zum Messen der Spiegelhöhe der freien Oberfläche einer Flüssigkeit
AT360767B (de) Vorrichtung zum messen der dimension kleiner objekte
CH534053A (de) Einrichtung zur Reinigung einer Drehzylinderfläche
DD128436A5 (de) Einrichtung zum messen der fliessgeschwindigkeit einer fluessigkeit
CH550376A (de) Messgeraet zum messen von vertikalen dimensionen.
BE777575A (fr) Consistometre a mesure continue
CH548610A (de) Einrichtung zum messen der verstimmung einer vorwiegend ohmschen brueckenschaltung.
CH539836A (de) Messkopf an einer Koordinatenmessmaschine
SE391456B (sv) Ytbeleggning
CH552790A (de) Messausruestung zum messen einer nichtelektrischen physikalischen groesse.
CH529991A (de) Vorrichtung zum Messen der Verschiebung eines Gegenstandes
CH548013A (de) Einrichtung zum messen von verschiebungen.
CH532242A (de) Fotoelektrische Vorrichtung zum Messen der Abweichung der Winkellage einer spiegelnden Fläche von einer Bezugslage
AT349774B (de) Geraet zum messen oder anreissen von werkstuecken
SU423038A2 (ru) Прибор для определения удельной поверхности песка
DE1800059B2 (de) Messwertgeber zum polarographischen bestimmen des partial druckes eines gasfoermigen bestandteils
SU459705A1 (ru) Устройство дл измерени деформации грунта
SU472246A1 (ru) Устройство дл измерени погрешности расположени двух цилиндрических поверхностей деталей

Legal Events

Date Code Title Description
PL Patent ceased