FI113805B - Menetelmä ja laite kaasuseosten analysoimiseksi - Google Patents

Menetelmä ja laite kaasuseosten analysoimiseksi Download PDF

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Publication number
FI113805B
FI113805B FI980781A FI980781A FI113805B FI 113805 B FI113805 B FI 113805B FI 980781 A FI980781 A FI 980781A FI 980781 A FI980781 A FI 980781A FI 113805 B FI113805 B FI 113805B
Authority
FI
Finland
Prior art keywords
light
gas
discharge
electrode
determining
Prior art date
Application number
FI980781A
Other languages
English (en)
Finnish (fi)
Swedish (sv)
Other versions
FI980781A (fi
FI980781A0 (fi
Inventor
Markku Raesaenen
Leonid Khriachtchev
Mika Petterson
Original Assignee
Licentia Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Licentia Oy filed Critical Licentia Oy
Publication of FI980781A0 publication Critical patent/FI980781A0/fi
Priority to FI980781A priority Critical patent/FI113805B/fi
Priority to DE69940999T priority patent/DE69940999D1/de
Priority to AT99913350T priority patent/ATE434176T1/de
Priority to CA002326626A priority patent/CA2326626C/en
Priority to PCT/FI1999/000288 priority patent/WO1999051968A1/en
Priority to AU31510/99A priority patent/AU3151099A/en
Priority to EP99913350A priority patent/EP1068515B1/de
Publication of FI980781A publication Critical patent/FI980781A/fi
Priority to US09/647,458 priority patent/US6795178B1/en
Application granted granted Critical
Publication of FI113805B publication Critical patent/FI113805B/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/69—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence specially adapted for fluids, e.g. molten metal

Landscapes

  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
FI980781A 1998-04-03 1998-04-03 Menetelmä ja laite kaasuseosten analysoimiseksi FI113805B (fi)

Priority Applications (8)

Application Number Priority Date Filing Date Title
FI980781A FI113805B (fi) 1998-04-03 1998-04-03 Menetelmä ja laite kaasuseosten analysoimiseksi
PCT/FI1999/000288 WO1999051968A1 (en) 1998-04-03 1999-04-06 Method and apparatus for analysis of gas compositions
AT99913350T ATE434176T1 (de) 1998-04-03 1999-04-06 Verfahren und vorrichtung zur analyse von gaszusammenstellungen
CA002326626A CA2326626C (en) 1998-04-03 1999-04-06 Method and apparatus for analysis of gas compositions
DE69940999T DE69940999D1 (de) 1998-04-03 1999-04-06 Verfahren und vorrichtung zur analyse von gaszusammenstellungen
AU31510/99A AU3151099A (en) 1998-04-03 1999-04-06 Method and apparatus for analysis of gas compositions
EP99913350A EP1068515B1 (de) 1998-04-03 1999-04-06 Verfahren und vorrichtung zur analyse von gaszusammenstellungen
US09/647,458 US6795178B1 (en) 1998-04-03 2000-09-29 Method and apparatus for analysis of gas compositions

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI980781 1998-04-03
FI980781A FI113805B (fi) 1998-04-03 1998-04-03 Menetelmä ja laite kaasuseosten analysoimiseksi

Publications (3)

Publication Number Publication Date
FI980781A0 FI980781A0 (fi) 1998-04-03
FI980781A FI980781A (fi) 1999-10-04
FI113805B true FI113805B (fi) 2004-06-15

Family

ID=8551470

Family Applications (1)

Application Number Title Priority Date Filing Date
FI980781A FI113805B (fi) 1998-04-03 1998-04-03 Menetelmä ja laite kaasuseosten analysoimiseksi

Country Status (8)

Country Link
US (1) US6795178B1 (de)
EP (1) EP1068515B1 (de)
AT (1) ATE434176T1 (de)
AU (1) AU3151099A (de)
CA (1) CA2326626C (de)
DE (1) DE69940999D1 (de)
FI (1) FI113805B (de)
WO (1) WO1999051968A1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7184146B2 (en) * 2003-06-24 2007-02-27 Cardinal Ig Company Methods and apparatus for evaluating insulating glass units
US20040266013A1 (en) * 2003-06-30 2004-12-30 Erickson Gene P. Standard insulating glass units having known concentrations of a gas and methods for calibrating a measuring device using the standard insulating glass units
US20070103686A1 (en) * 2005-11-08 2007-05-10 Niklas Tornkvist Apparatus for non-invasive analysis of gas compositions in insulated glass panes
EP2019963A1 (de) * 2006-05-10 2009-02-04 VKR Holding A/S Vorrichtung und verfahren zum testen versiegelter glaseinheiten
US8235076B2 (en) 2009-02-02 2012-08-07 American Air Liquide, Inc. Method and system for optimized filling of an enclosure
FI20095794A0 (fi) * 2009-07-16 2009-07-16 Sparklike Ab Oy Menetelmä ja järjestelmä heijastavan läpinäkyvän kohteen ominaisuuksien tarkastelemiseksi
US9322738B2 (en) 2009-11-09 2016-04-26 Mks Instruments, Inc. Vacuum quality measurement system
KR101417944B1 (ko) * 2013-03-13 2014-07-10 지투산업 주식회사 복층유리의 가스농도 측정 장치
JP6320748B2 (ja) * 2013-12-27 2018-05-09 株式会社堀場製作所 ガス分析装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2717436A1 (de) * 1976-04-26 1977-11-10 Varian Associates Verfahren und vorrichtung zur bestimmung des partialdruckes eines gases zur vakuummessung, leckanzeige, messung der niederschlagsrate o.dgl.
DE3118060A1 (de) 1981-05-07 1982-11-25 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt "verfahren und anordnung zur ueberwachung eines nominell gasdichten hohlkoerpers"
CH675773A5 (de) * 1988-03-31 1990-10-31 Sulzer Ag
US4848138A (en) 1988-07-15 1989-07-18 Marshall John M Window gas monitor
US4939926A (en) 1989-06-05 1990-07-10 The United States Of America As Represented By The Secretary Of The Navy Apparatus and method for monitoring pressure leaks from a sealed system
US5115668A (en) 1990-11-30 1992-05-26 The United States Of America As Represented By The Secretary Of The Navy Non-invasive pressure measuring device and method
CA2032912C (en) * 1990-12-21 1994-06-28 Bryan M. Latta Nonintrusive gas-level measurement apparatus
FI98410C (fi) * 1993-12-16 1997-06-10 Instrumentarium Oy Kaasuseosten analysointiin käytettävä mittausanturi ja mittausjärjestely
DE19505104A1 (de) * 1995-02-15 1996-08-22 Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh Verfahren und Anordnung zur Bestimmung der Reinheit und/oder des Drucks von Gasen für elektrische Lampen

Also Published As

Publication number Publication date
DE69940999D1 (de) 2009-07-30
US6795178B1 (en) 2004-09-21
CA2326626C (en) 2009-11-17
ATE434176T1 (de) 2009-07-15
CA2326626A1 (en) 1999-10-14
FI980781A (fi) 1999-10-04
AU3151099A (en) 1999-10-25
EP1068515A1 (de) 2001-01-17
FI980781A0 (fi) 1998-04-03
WO1999051968A1 (en) 1999-10-14
EP1068515B1 (de) 2009-06-17

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