FI20095794A0 - Menetelmä ja järjestelmä heijastavan läpinäkyvän kohteen ominaisuuksien tarkastelemiseksi - Google Patents

Menetelmä ja järjestelmä heijastavan läpinäkyvän kohteen ominaisuuksien tarkastelemiseksi

Info

Publication number
FI20095794A0
FI20095794A0 FI20095794A FI20095794A FI20095794A0 FI 20095794 A0 FI20095794 A0 FI 20095794A0 FI 20095794 A FI20095794 A FI 20095794A FI 20095794 A FI20095794 A FI 20095794A FI 20095794 A0 FI20095794 A0 FI 20095794A0
Authority
FI
Finland
Prior art keywords
examining
properties
transparent object
reflective transparent
reflective
Prior art date
Application number
FI20095794A
Other languages
English (en)
Swedish (sv)
Inventor
Mikko Syrjaelahti
Original Assignee
Sparklike Ab Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sparklike Ab Oy filed Critical Sparklike Ab Oy
Priority to FI20095794A priority Critical patent/FI20095794A0/fi
Publication of FI20095794A0 publication Critical patent/FI20095794A0/fi
Priority to PCT/FI2010/050583 priority patent/WO2011007047A1/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0641Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of polarization
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/67Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/8422Investigating thin films, e.g. matrix isolation method
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Mathematical Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
FI20095794A 2009-07-16 2009-07-16 Menetelmä ja järjestelmä heijastavan läpinäkyvän kohteen ominaisuuksien tarkastelemiseksi FI20095794A0 (fi)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FI20095794A FI20095794A0 (fi) 2009-07-16 2009-07-16 Menetelmä ja järjestelmä heijastavan läpinäkyvän kohteen ominaisuuksien tarkastelemiseksi
PCT/FI2010/050583 WO2011007047A1 (en) 2009-07-16 2010-07-06 Method, apparatus and arrangement for detecting properties of a reflective transparent object

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20095794A FI20095794A0 (fi) 2009-07-16 2009-07-16 Menetelmä ja järjestelmä heijastavan läpinäkyvän kohteen ominaisuuksien tarkastelemiseksi

Publications (1)

Publication Number Publication Date
FI20095794A0 true FI20095794A0 (fi) 2009-07-16

Family

ID=40935874

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20095794A FI20095794A0 (fi) 2009-07-16 2009-07-16 Menetelmä ja järjestelmä heijastavan läpinäkyvän kohteen ominaisuuksien tarkastelemiseksi

Country Status (2)

Country Link
FI (1) FI20095794A0 (fi)
WO (1) WO2011007047A1 (fi)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI20115482A (fi) * 2011-05-18 2012-11-19 Sparklike Ab Oy Menetelmä ja laite kaasukomponentin konsentraation määrittämiseksi lasielementin sisällä
FI20145030L (fi) 2014-01-15 2015-07-16 Sparklike Ab Oy Menetelmä ja laite kaasukomponentin havainnoimiseksi läpinäkyvän tilavuuden sisällä
CN104316190A (zh) * 2014-11-03 2015-01-28 苏州精创光学仪器有限公司 测量玻璃不同角度颜色、亮度和反射率光谱的方法
JP7075853B2 (ja) * 2017-09-13 2022-05-26 住友化学株式会社 欠陥検査装置、欠陥検査方法、円偏光板又は楕円偏光板の製造方法及び位相差板の製造方法
CN110823807B (zh) * 2019-10-29 2022-11-04 广东鑫瑞新材料科技有限公司 一种磁控基膜的色相在线检测装置及其检测方法
CN111239164B (zh) * 2020-04-02 2023-04-07 上海御微半导体技术有限公司 一种缺陷检测装置及其方法
TWI804401B (zh) 2022-07-28 2023-06-01 國立成功大學 光學量測系統

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2119577A (en) * 1937-04-23 1938-06-07 Electrical Testing Lab Strain gauge for and method of measuring strains in glass
US3062087A (en) * 1956-04-09 1962-11-06 Budd Co Apparatus for investigating polarized light phenomena
CN1087424A (zh) * 1992-09-29 1994-06-01 昆士兰大学 检测的玻璃中缺陷
GB2310925B (en) * 1996-03-06 2000-08-09 Anthony Michael Glazer Method and apparatus for indicating optical anisotropy
FI113805B (fi) * 1998-04-03 2004-06-15 Licentia Oy Menetelmä ja laite kaasuseosten analysoimiseksi
GB2338309B (en) * 1998-06-13 2002-05-08 Neil Colin Hamilton Recognition apparatus for toughened glass
AT410257B (de) * 2000-10-23 2003-03-25 Mte Innovative Measurement Sol Vorrichtung zur überprüfung und kontrolle einer einzel-glasscheibe oder eines isolierglas-elements
US7583368B1 (en) * 2006-04-05 2009-09-01 Electronic Design To Market, Inc. Method of enhancing measurement of stress in glass
US7369240B1 (en) * 2006-07-20 2008-05-06 Litesentry Corporation Apparatus and methods for real-time adaptive inspection for glass production

Also Published As

Publication number Publication date
WO2011007047A1 (en) 2011-01-20

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Legal Events

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