FI112285B - Menetelmä ja laitteisto ajasta riippuvan säteilykentän intensiteettijakauman määrittämiseksi - Google Patents

Menetelmä ja laitteisto ajasta riippuvan säteilykentän intensiteettijakauman määrittämiseksi Download PDF

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Publication number
FI112285B
FI112285B FI20015052A FI20015052A FI112285B FI 112285 B FI112285 B FI 112285B FI 20015052 A FI20015052 A FI 20015052A FI 20015052 A FI20015052 A FI 20015052A FI 112285 B FI112285 B FI 112285B
Authority
FI
Finland
Prior art keywords
tunnettu
ionization
radiation field
levels
delay
Prior art date
Application number
FI20015052A
Other languages
English (en)
Finnish (fi)
Swedish (sv)
Other versions
FI20015052A0 (fi
FI20015052A (fi
Inventor
Ari Virtanen
Original Assignee
Ari Virtanen
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ari Virtanen filed Critical Ari Virtanen
Publication of FI20015052A0 publication Critical patent/FI20015052A0/fi
Priority to FI20015052A priority Critical patent/FI112285B/fi
Priority to JP2003555238A priority patent/JP4663234B2/ja
Priority to PCT/FI2002/001039 priority patent/WO2003054582A1/en
Priority to CA002468140A priority patent/CA2468140A1/en
Priority to US10/495,991 priority patent/US7170066B2/en
Priority to AU2002352291A priority patent/AU2002352291A1/en
Priority to CN02825448.1A priority patent/CN1284007C/zh
Priority to EP02788001A priority patent/EP1456692A1/en
Publication of FI20015052A publication Critical patent/FI20015052A/fi
Application granted granted Critical
Publication of FI112285B publication Critical patent/FI112285B/fi

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/185—Measuring radiation intensity with ionisation chamber arrangements

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Radiation-Therapy Devices (AREA)
FI20015052A 2001-12-20 2001-12-20 Menetelmä ja laitteisto ajasta riippuvan säteilykentän intensiteettijakauman määrittämiseksi FI112285B (fi)

Priority Applications (8)

Application Number Priority Date Filing Date Title
FI20015052A FI112285B (fi) 2001-12-20 2001-12-20 Menetelmä ja laitteisto ajasta riippuvan säteilykentän intensiteettijakauman määrittämiseksi
US10/495,991 US7170066B2 (en) 2001-12-20 2002-12-18 Method and apparatus for determining the intensity distribution of a radiation field
PCT/FI2002/001039 WO2003054582A1 (en) 2001-12-20 2002-12-18 Method and apparatus for determining the intensity distribution of a radiation field
CA002468140A CA2468140A1 (en) 2001-12-20 2002-12-18 Method and apparatus for determining the intensity distribution of a radiation field
JP2003555238A JP4663234B2 (ja) 2001-12-20 2002-12-18 放射線場の強度分布を測定するための方法及び装置
AU2002352291A AU2002352291A1 (en) 2001-12-20 2002-12-18 Method and apparatus for determining the intensity distribution of a radiation field
CN02825448.1A CN1284007C (zh) 2001-12-20 2002-12-18 确定辐射场强度分布的方法和设备
EP02788001A EP1456692A1 (en) 2001-12-20 2002-12-18 Method and apparatus for determining the intensity distribution of a radiation field

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20015052A FI112285B (fi) 2001-12-20 2001-12-20 Menetelmä ja laitteisto ajasta riippuvan säteilykentän intensiteettijakauman määrittämiseksi
FI20015052 2001-12-20

Publications (3)

Publication Number Publication Date
FI20015052A0 FI20015052A0 (fi) 2001-12-20
FI20015052A FI20015052A (fi) 2003-06-21
FI112285B true FI112285B (fi) 2003-11-14

Family

ID=8562662

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20015052A FI112285B (fi) 2001-12-20 2001-12-20 Menetelmä ja laitteisto ajasta riippuvan säteilykentän intensiteettijakauman määrittämiseksi

Country Status (8)

Country Link
US (1) US7170066B2 (zh)
EP (1) EP1456692A1 (zh)
JP (1) JP4663234B2 (zh)
CN (1) CN1284007C (zh)
AU (1) AU2002352291A1 (zh)
CA (1) CA2468140A1 (zh)
FI (1) FI112285B (zh)
WO (1) WO2003054582A1 (zh)

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DE102004028035A1 (de) * 2004-06-09 2005-12-29 Gesellschaft für Schwerionenforschung mbH Vorrichtung und Verfahren zur Kompensation von Bewegungen eines Zielvolumens während einer Ionenstrahl-Bestrahlung
US7564039B1 (en) * 2004-06-17 2009-07-21 Integrated Sensors, Llc Dual substrate plasma panel based ionizing radiation detector
US7332726B2 (en) * 2004-06-19 2008-02-19 Integrated Sensors, Llc Plasma panel based ionizing radiation detector
US7683340B2 (en) 2006-10-28 2010-03-23 Integrated Sensors, Llc Plasma panel based radiation detector
US9817822B2 (en) * 2008-02-07 2017-11-14 International Business Machines Corporation Managing white space in a portal web page
FR2939906B1 (fr) * 2008-12-16 2011-11-25 Commissariat Energie Atomique Procede de determination de distribution spectrale et spatiale de photons de freinage et dispositif associe
CN103201647B (zh) * 2010-10-15 2016-08-03 加拿大原子能有限公司 使用逆准直的定向辐射探测装置和定向辐射探测方法
GB2492999A (en) * 2011-07-20 2013-01-23 Univ Central Lancashire Neutron detector
US9645255B2 (en) * 2011-09-21 2017-05-09 Varian Medical Systems Particle Therapy Gmbh Method for efficient daily constancy check or calibration of proton therapy system
CN102608558B (zh) * 2012-03-31 2014-06-25 上海市计量测试技术研究院 辐射场均匀性校验定位装置
US9529099B2 (en) 2012-11-14 2016-12-27 Integrated Sensors, Llc Microcavity plasma panel radiation detector
US9964651B2 (en) 2013-03-15 2018-05-08 Integrated Sensors, Llc Ultra-thin plasma panel radiation detector
US9551795B2 (en) 2013-03-15 2017-01-24 Integrated Sensors, Llc Ultra-thin plasma radiation detector
US9851452B2 (en) * 2013-09-04 2017-12-26 C-Rad Imaging Ab Converter unit
EP3358373B1 (en) * 2015-09-30 2024-06-05 Dai Nippon Printing Co., Ltd. Nuclear medicine examination apparatus and nuclear medicine examination method
WO2017199496A1 (ja) * 2016-05-18 2017-11-23 三菱電機株式会社 線量分布モニタおよび放射線照射システム
CN106783502B (zh) * 2016-11-30 2018-08-24 中国科学院上海应用物理研究所 一种同步辐射软x射线无损实时位置分辨电离室
WO2022071549A1 (ja) * 2020-10-01 2022-04-07 大日本印刷株式会社 検出装置
CN113566970B (zh) * 2021-06-22 2023-06-16 中国辐射防护研究院 一种Pu-238同位素热源的搜寻方法和装置
CN114464520A (zh) * 2022-01-10 2022-05-10 中检普泰检验检测有限公司 一种用水箱校准电离室的方法

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Also Published As

Publication number Publication date
CN1606701A (zh) 2005-04-13
JP4663234B2 (ja) 2011-04-06
US20050006591A1 (en) 2005-01-13
CN1284007C (zh) 2006-11-08
FI20015052A0 (fi) 2001-12-20
EP1456692A1 (en) 2004-09-15
JP2005513486A (ja) 2005-05-12
CA2468140A1 (en) 2003-07-03
US7170066B2 (en) 2007-01-30
AU2002352291A1 (en) 2003-07-09
WO2003054582A1 (en) 2003-07-03
FI20015052A (fi) 2003-06-21

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