FI112115B - Pintapainon mittauslaite - Google Patents

Pintapainon mittauslaite Download PDF

Info

Publication number
FI112115B
FI112115B FI955844A FI955844A FI112115B FI 112115 B FI112115 B FI 112115B FI 955844 A FI955844 A FI 955844A FI 955844 A FI955844 A FI 955844A FI 112115 B FI112115 B FI 112115B
Authority
FI
Finland
Prior art keywords
measured
product
linear
photodiode group
measuring
Prior art date
Application number
FI955844A
Other languages
English (en)
Finnish (fi)
Swedish (sv)
Other versions
FI955844A (fi
FI955844A0 (fi
Inventor
Karlheinz Schaust
Reiner Henn
Original Assignee
Honeywell Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell Ag filed Critical Honeywell Ag
Publication of FI955844A publication Critical patent/FI955844A/fi
Publication of FI955844A0 publication Critical patent/FI955844A0/fi
Application granted granted Critical
Publication of FI112115B publication Critical patent/FI112115B/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film

Landscapes

  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FI955844A 1993-06-07 1995-12-05 Pintapainon mittauslaite FI112115B (fi)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
EP93109108 1993-06-07
EP93109108A EP0628808B1 (de) 1993-06-07 1993-06-07 Vorrichtung zur Flächengewichtsmessung
PCT/EP1994/001797 WO1994029700A1 (de) 1993-06-07 1994-06-03 Vorrichtung zur flächengewichtsmessung
EP9401797 1994-06-03

Publications (3)

Publication Number Publication Date
FI955844A FI955844A (fi) 1995-12-05
FI955844A0 FI955844A0 (fi) 1995-12-05
FI112115B true FI112115B (fi) 2003-10-31

Family

ID=8212969

Family Applications (1)

Application Number Title Priority Date Filing Date
FI955844A FI112115B (fi) 1993-06-07 1995-12-05 Pintapainon mittauslaite

Country Status (7)

Country Link
EP (1) EP0628808B1 (zh)
JP (1) JPH09502014A (zh)
KR (1) KR100307030B1 (zh)
CN (1) CN1089901C (zh)
DE (1) DE59308548D1 (zh)
FI (1) FI112115B (zh)
WO (1) WO1994029700A1 (zh)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0732569B1 (de) * 1995-03-17 2000-04-26 Honeywell Ag Vorrichtung zur Flächengewichtsmessung
DE19913929A1 (de) * 1999-03-26 2000-09-28 Voith Sulzer Papiertech Patent Vorrichtung und Verfahren zum Bestimmen von Eigenschaften einer Materialbahn
WO2002090939A1 (en) * 2001-05-09 2002-11-14 Vinod Unnikrishna Kurup Equipment for determining weight per unit area
US6995372B2 (en) * 2003-02-12 2006-02-07 Voith Paper Patent Gmbh Nuclear gauge for measuring a characteristic of a sheet material with sheet position and alignment compensation
SE525320C2 (sv) * 2003-06-06 2005-02-01 More Res Oernskoeldsvik Ab Förfarande och apparatur för bedömning/mätning av ytviktsvariation hos arkmaterial
US7005639B2 (en) * 2003-07-28 2006-02-28 Abb Inc. System and method of composition correction for beta gauges
DE102004057743B4 (de) * 2004-09-08 2007-08-09 Mahlo Gmbh & Co Kg Verfahren und Vorrichtung zum Bestimmen des Flächengewichtes einer geförderten Materialprobe
JP4919115B2 (ja) * 2009-09-24 2012-04-18 横河電機株式会社 放射線検査装置
US8660682B2 (en) * 2010-11-22 2014-02-25 Honeywell Asca Inc. Air wipe and sheet guide temperature control on paper and continuous web scanners

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1812893A1 (de) * 1968-12-05 1970-06-18 Knapsack Ag, 5033 Knapsack Anordnung zur Dickenmessung von Walzgut, insbesondere von Folien
US4047029A (en) * 1976-07-02 1977-09-06 Allport John J Self-compensating X-ray or γ-ray thickness gauge
EP0233389A1 (en) * 1986-02-12 1987-08-26 Josef W. Repsch A method of measuring the weight per unit area, density and thickness of a moving sheet
CA1307056C (en) * 1987-03-31 1992-09-01 Adaptive Technologies, Inc. Thickness/density measuring apparatus

Also Published As

Publication number Publication date
CN1089901C (zh) 2002-08-28
FI955844A (fi) 1995-12-05
KR100307030B1 (ko) 2001-12-17
EP0628808B1 (de) 1998-05-13
FI955844A0 (fi) 1995-12-05
JPH09502014A (ja) 1997-02-25
KR960702106A (ko) 1996-03-28
CN1125002A (zh) 1996-06-19
DE59308548D1 (de) 1998-06-18
WO1994029700A1 (de) 1994-12-22
EP0628808A1 (de) 1994-12-14

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