ES8402967A1 - Mejoras en disposiciones de diagnostico para tratamiento de datos. - Google Patents

Mejoras en disposiciones de diagnostico para tratamiento de datos.

Info

Publication number
ES8402967A1
ES8402967A1 ES519977A ES519977A ES8402967A1 ES 8402967 A1 ES8402967 A1 ES 8402967A1 ES 519977 A ES519977 A ES 519977A ES 519977 A ES519977 A ES 519977A ES 8402967 A1 ES8402967 A1 ES 8402967A1
Authority
ES
Spain
Prior art keywords
provisions
diagnostic
data treatment
scanned
internal memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES519977A
Other languages
English (en)
Spanish (es)
Other versions
ES519977A0 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Publication of ES519977A0 publication Critical patent/ES519977A0/es
Publication of ES8402967A1 publication Critical patent/ES8402967A1/es
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2268—Logging of test results

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
ES519977A 1982-02-24 1983-02-22 Mejoras en disposiciones de diagnostico para tratamiento de datos. Expired ES8402967A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57028642A JPS58144954A (ja) 1982-02-24 1982-02-24 診断方式

Publications (2)

Publication Number Publication Date
ES519977A0 ES519977A0 (es) 1984-03-01
ES8402967A1 true ES8402967A1 (es) 1984-03-01

Family

ID=12254170

Family Applications (1)

Application Number Title Priority Date Filing Date
ES519977A Expired ES8402967A1 (es) 1982-02-24 1983-02-22 Mejoras en disposiciones de diagnostico para tratamiento de datos.

Country Status (4)

Country Link
EP (1) EP0087314B1 (enExample)
JP (1) JPS58144954A (enExample)
DE (1) DE3379688D1 (enExample)
ES (1) ES8402967A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02181677A (ja) * 1989-01-06 1990-07-16 Sharp Corp Ｌｓｉのテストモード切替方式
JPH0394350A (ja) * 1989-09-07 1991-04-19 Nec Corp 半導体記憶装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5833576B2 (ja) * 1977-03-14 1983-07-20 株式会社東芝 計算機システムの故障診断装置
JPS5939052B2 (ja) * 1977-03-15 1984-09-20 株式会社東芝 情報処理装置及び方法
US4223382A (en) * 1978-11-30 1980-09-16 Sperry Corporation Closed loop error correct
JPS55150047A (en) * 1979-05-10 1980-11-21 Nec Corp Test unit for information processor

Also Published As

Publication number Publication date
EP0087314B1 (en) 1989-04-19
DE3379688D1 (en) 1989-05-24
JPS6246021B2 (enExample) 1987-09-30
ES519977A0 (es) 1984-03-01
EP0087314A3 (en) 1985-07-31
JPS58144954A (ja) 1983-08-29
EP0087314A2 (en) 1983-08-31

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Legal Events

Date Code Title Description
FD1A Patent lapsed

Effective date: 19970401